| R. Struillou < R. Stuck < R. Sundaresan | Facettes : |
List of bibliographic references
Number of relevant bibliographic references: 4.| Ident. | Authors (with country if any) | Title |
|---|---|---|
| 000406 (1979) | M. Hage-Ali [France] ; R. Stuck [France] ; AN Saxena [France] ; P. Siffert [France] | Studies of CdTe surfaces with secondary ion mass spectrometry, rutherford backscattering and ellipsometry |
| 000817 (1976) | R. Stuck [France] ; A. Cornet [France] ; C. Scharager [France] ; P. Siffert [France] | Defects in pure and halogen compensated cadmium telluride grown by the THM method |
| 000D81 (1978) | P. Siffert [France] ; B. Rabin [France] ; H.Y. Tabatabai [France] ; R. Stuck [France] | Extension of the depletion layer in cadmium telluride nuclear radiation detectors |
| 000F26 (1980) | C. Scharager [France] ; R. Stuck [France] ; P. Siffert [France] ; J. Cailleret [France] ; Ch. Heitz [France] ; G. Lagarde [France] ; D. Tenorio [France] | Trace analysis in cadmium telluride by heavy ion induced x-ray emission and by SIMS |
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