P. Sharrock < P. Siffert < P. Sigwalt

Facettes : Author.f AffPays.f AffOrg.f AffRegion.f AffVille.f

List of bibliographic references

Number of relevant bibliographic references: 22.
[0-20] [0 - 20][0 - 22][20-21][20-40]

Ident.	Authors (with country if any)	Title
000406 (1979)	M. Hage-Ali [France] ; R. Stuck [France] ; AN Saxena [France] ; P. Siffert [France]	Studies of CdTe surfaces with secondary ion mass spectrometry, rutherford backscattering and ellipsometry
000575 (1969)	P.G. Hansen [Danemark] ; P. Hornshøj [Danemark] ; H.L. Nielsen [Danemark] ; K. Wilsky [Danemark] ; H. Kugler [Allemagne] ; G. Astner [Suisse] ; E. Hagebø [Suisse] ; J. Hudis [Suisse] ; A. Kjelberg [Suisse] ; F. Münnich [Suisse] ; P. Patzelt [Suisse] ; M. Alpsten [Suède] ; G. Andersson [Suède] ; Aa. Appelqvist [Suède] ; B. Bengtsson [Suède] ; R.A. Naumann [Danemark] ; O.B. Nielsen [Danemark] ; E. Beck [Allemagne] ; R. Foucher [France] ; J.P. Husson [France] ; J. Jastrzȩbski [France] ; A. Johnson [France] ; J. Alstad [Norvège] ; T. Jahnsen [Norvège] ; A.C. Pappas [Norvège] ; T. Tunaal [Norvège] ; R. Henck [France] ; P. Siffert [France] ; G. Rudstam [Suède]	Decay characteristics of short-lived radio-nuclides studied by on-line isotope separator techniques
000630 (1979)	R.O. Bell [États-Unis] ; M. Toulemonde [France] ; P. Siffert [France]	Calculated temperature distribution during laser annealing in silicon and cadmium telluride
000813 (1978)	P. Siffert [France]	Current possibilities and limitations of cadmium telluride detectors
000817 (1976)	R. Stuck [France] ; A. Cornet [France] ; C. Scharager [France] ; P. Siffert [France]	Defects in pure and halogen compensated cadmium telluride grown by the THM method
000882 (1973)	M. Hage-ali [France] ; I.V. Mitchell [France] ; J.J. Grob [France] ; P. Siffert [France]	Heavy element diffusion in cadmium telluride
000B03 (2001)	A. Zumbiehl [France] ; M. Hage-Ali [France] ; P. Fougeres [France] ; J.M. Koebel [France] ; R. Regal [France] ; C. Rit [France] ; M. Ayoub [France] ; P. Siffert [France]	Modelling and 3D optimisation of CdTe pixels detector array geometry – Extension to small pixels
000B22 (1999)	Ch. Scheiber [France] ; B. Eclancher [France] ; J. Chambron [France] ; V. Prat [France] ; A. Kazandjan [France] ; A. Jahnke [Allemagne] ; R. Matz [Allemagne] ; S. Thomas [Royaume-Uni] ; S. Warren [Royaume-Uni] ; M. Hage-Hali [France] ; R. Regal [France] ; P. Siffert [France] ; M. Karman [Hongrie]	Heart imaging by cadmium telluride gamma camera
000B65 (1970)	A. Cornet [France] ; P. Siffert [France] ; A. Coche [France]	Improvements in the purification of cadmium telluride by zone refining
000B74 (1989)	M. Samimi [France] ; B. Biglari [France] ; M. Hage-Ali [France] ; J.M. Koebel [France] ; P. Siffert [France]	Structural defects in high resistivity cadmium telluride
000C30 (1989)	B. Biglari [France] ; M. Samimi [France] ; M. Hage-Ali [France] ; J.M. Koebel [France] ; P. Siffert [France]	The interaction of copper with structural defects in THM grown cadmium telluride
000C80 (1974)	P. Siffert [France] ; J.P. Gonidec [France] ; A. Cornet [France] ; R.O. Bell [États-Unis] ; F.V. Wald [États-Unis]	Full-energy peak efficiency of cadmium-telluride gamma-ray spectrometers
000D45 (1988)	B. Biglari [France] ; M. Samimi [France] ; M. Hage-Ali [France] ; J.M. Koebel [France] ; P. Siffert [France]	Effects of copper in high resistivity cadmium telluride
000D81 (1978)	P. Siffert [France] ; B. Rabin [France] ; H.Y. Tabatabai [France] ; R. Stuck [France]	Extension of the depletion layer in cadmium telluride nuclear radiation detectors
000E93 (1995)	J.Y. Moisan [France] ; P. Gravey [France] ; G. Martel [France] ; N. Wolffer [France] ; A. Aoudia [France] ; Y. Marfaing [France] ; R. Triboulet [France] ; M.C. Busch [France] ; M. Hadj-Ali [France] ; J.M. Koebel [France] ; P. Siffert [France]	Behaviour of hole and electron dominated photorefractive CdTe: V crystals under external continuous or periodic electric field
000F03 (1987)	B. Biglari [France] ; M. Samimi [France] ; M. Hage-Ali [France] ; P. Siffert [France]	Passivation of high-resistivity cadmium telluride by hydrogen implantation
000F26 (1980)	C. Scharager [France] ; R. Stuck [France] ; P. Siffert [France] ; J. Cailleret [France] ; Ch. Heitz [France] ; G. Lagarde [France] ; D. Tenorio [France]	Trace analysis in cadmium telluride by heavy ion induced x-ray emission and by SIMS
000F64 (1994)	P. Wurm [France] ; M. Hage-Ali [France] ; J.M. Koebel [France] ; P. Siffert [France]	Study of the photodecay in CdTe X-ray detectors
000F82 (1996)	M. Hage-Ali [France] ; J.M. Koebel [France] ; P. Siffert [France] ; V. Prat [France] ; H. Simon [France]	Cadmium telluride (CdTe) miniature probes for nuclear fuel gamma-ray spectrometry
000F88 (1996)	M. Hage-Ali [France] ; J.M Koebel [France] ; R. Régal [France] ; P. Siffert [France] ; V. Prat [France] ; H. Simon [France]	Cadmium telluride small probes for gamma-ray spectrometry
001000 (1991)	M. Hage-Ali [France] ; B. Yaacoub [France] ; S. Mergui [France] ; M. Samimi [France] ; B. Biglari [France] ; P. Siffert [France]	Microscopic defect level characterization of semi-insulating compound semiconductors by TSC and PICTS

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