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Serveur d'exploration sur le cadmium en France - Curation (Accueil)

Index « AbsEn.i » - entrée « semiconductors »
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semiconductor < semiconductors < semicontinuous  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 12.
Ident.Authors (with country if any)Title
000335 (1982) A. Lopez-Otero [Autriche]Growth of some important narrow gap semiconductors
000539 (1987) Kurt Nassau [États-Unis]The fifteen causes of color: The physics and chemistry of color
000678 (1995) N. Serpone [Canada] ; P. Maruthamuthu [Canada] ; P. Pichat [France] ; E. Pelizzetti [Italie] ; H. Hidaka [Japon]Exploiting the interparticle electron transfer process in the photocatalysed oxidation of phenol, 2-chlorophenol and pentachlorophenol: chemical evidence for electron and hole transfer between coupled semiconductors
000B74 (1989) M. Samimi [France] ; B. Biglari [France] ; M. Hage-Ali [France] ; J.M. Koebel [France] ; P. Siffert [France]Structural defects in high resistivity cadmium telluride
000C76 (1992) W. Witthuhn [Allemagne]Dynamics and electronic transitions at impurity complexes in semiconductors
000F10 (1982) C. Ve`rie [France] ; F. Raymond [France] ; J. Besson [France] ; T. Nguyen Duy [France]Bandgap spin-orbit splitting resonance effects in Hg1- x Cd x Te alloys
000F69 (1996) T. Cloitre [France] ; L. Aigouy [France] ; B. Gil [France] ; O. Briot [France] ; N. Briot [France] ; J.P. Alexis [France] ; R.L. Aulombard [France]Optimization and optical studies of ZnCdSeZnSe heterostructures grown by MOVPE
000F86 (1996) M. Wienecke [Allemagne] ; J. Bollmann [Allemagne] ; J. Röhrich [Allemagne] ; K. Maass [Allemagne] ; B. Reinhold [Allemagne] ; D. Forkel-Wirth [Suisse]Transmutation doping of wide-bandgap II–VI compounds
000F97 (1996) Keiichi Hori [Japon] ; Tetsuro Fujimoto [Japon] ; Kohei Kawanishi [Japon]Application of cadmium telluride detector to high speed X-ray CT scanner
001000 (1991) M. Hage-Ali [France] ; B. Yaacoub [France] ; S. Mergui [France] ; M. Samimi [France] ; B. Biglari [France] ; P. Siffert [France]Microscopic defect level characterization of semi-insulating compound semiconductors by TSC and PICTS
001018 (1996) M. Rossi [Italie] ; G. Baldazzi [Italie] ; E. Querzola [Italie] ; G. Guidi [Italie] ; M.G Scannavini [Italie] ; P. Chirco [Italie] ; M. Zanarini [Italie] ; F. Casali [Italie] ; S. Azevedo [États-Unis]High energy tomography using cadmium zinc telluride detectors
001084 (1995) L. Aigouy [France] ; J.P. Alexis [France] ; O. Briot [France] ; T. Cloitre [France] ; B. Gil [France] ; R.L. Aulombard [France] ; M. Averous [France]Optical properties and recombination processes in (Zn,Cd)Se Graded Index Separate Confinement Heterostructures

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