List of bibliographic references
Number of relevant bibliographic references: 18.
Ident. | Authors (with country if any) | Title |
---|
000067 (1968) |
B. Mutaftschiev [France] ; J. Zell [France] | Énergie d'interface et croissance du cadmium en bain fondu |
000247 (1995) |
E.L. Christiansen [États-Unis] ; J.L. Crews [États-Unis] ; J.H. Kerr [États-Unis] ; B.G. Cour-Palais [États-Unis] ; E. Cykowski [États-Unis] | Testing the validity of cadmium scaling |
000391 (1997) |
A. Burian [Pologne] ; P. Lecante [France] ; A. Mosset [France] ; J. Galy [France] ; J.M. Tonnerre [France] ; D. Raoux [France] | Differential anomalous X-ray scattering studies of amorphous Cd59As41 and Cd26As74 |
000451 (2003) |
Florian Meneau [Royaume-Uni] ; Sylvain Cristol [Royaume-Uni] ; Gopinathan Sankar [Royaume-Uni] ; Igor P. Dolbnya [Royaume-Uni] ; Wim Bras [Royaume-Uni] ; C Richard A. Catlow [Royaume-Uni] ; John M. Thomas [Royaume-Uni] ; G Neville Greaves [Royaume-Uni] | In situ study of the formation of CdS nanoparticles by small‐angle X‐ray scattering |
000594 (1975) |
P.V.R. Murthy ; C.A. Ayre ; H.R. Gustafson ; L.W. Jones ; M.J. Longo | Neutron total cross sections on nuclei at Fermilab energies |
000878 (1992) |
M. Nlcolet [Belgique] | Multiple molecular scattering and albedo action on the solar spectral irradiance in the region of the UVB ( ⩽ 320 nm) : a preliminary inventory |
000956 (1998) |
M.J Furlong [France] ; M. Froment [France] ; M.C Bernard [France] ; R. Cortès [France] ; A.N Tiwari [Suisse] ; M. Krejci [Suisse] ; H. Zogg [Suisse] ; D. Lincot [France] | Aqueous solution epitaxy of CdS layers on CuInSe2 |
000967 (1997) |
Th Hanke [Allemagne] ; O. Korth [Allemagne] ; I. Rückmann [Allemagne] ; B. Röder [Allemagne] | Properties of 132-hydroxy bacteriopheophorbide a methylester/behenic acid mixed mono- and multilayers |
000970 (2001) |
Marie-Pierre Pomiès [France] ; Nicolas Lequeux [France] ; Philippe Boch [France] | Speciation of cadmium in cement |
000B93 (2001) |
A. Grzechnik [Allemagne] ; V.V. Ursaki ; K. Syassen [Allemagne] ; I. Loa [Allemagne] ; I.M. Tiginyanu ; M. Hanfland [France] | Pressure-Induced Phase Transitions in Cadmium Thiogallate CdGa2Se4 |
000C49 (2003) |
Mario Villa [Autriche, France, Allemagne, Suisse] ; Matthias Baron [Autriche, France, Allemagne, Suisse] ; Martin Hainbuchner [Autriche, France, Allemagne, Suisse] ; Erwin Jericha [Autriche, France, Allemagne, Suisse] ; Vincent Leiner [Autriche, France, Allemagne, Suisse] ; Dieter Schwahn [Autriche, France, Allemagne, Suisse] ; Erwin Seidl [Autriche, France, Allemagne, Suisse] ; Jochen Stahn [Autriche, France, Allemagne, Suisse] ; Helmut Rauch [Autriche, France, Allemagne, Suisse] | Optimisation of a crystal design for a Bonse–Hart camera |
000D73 (1987) |
Y. Demay [France] ; J.P. Gailliard [France] ; P. Medina [France] | In situ spectroscopic ellipsometry of mercury cadmium telluride MBE layers |
000E11 (1993) |
M. Gauch [France] ; G. Quentel [France] | Experimental roughness excitation of surface electromagnetic waves and their detection by ellipsometry |
000E14 (2001) |
A. Pawlis [Allemagne] ; O. Husberg [Allemagne] ; A. Khartchenko [Allemagne] ; K. Lischka [Allemagne] ; D. Schikora [Allemagne] | Structural and Optical Investigations of ZnSe Based Semiconductor Microcavities |
000E29 (1983) |
M.M. Agamalyan [Russie] ; G.A. Panev [Russie] ; A.A. Zavedia [Russie] | A multichannel detector system for small-angle neutron scattering investigations |
000E52 (1991) |
A. Bennouna [Maroc] ; A. Haouni [Maroc] ; N. Ghermani [Maroc] ; E.L. Ameziane [Maroc] ; M. Brunel [France] | Grazing-incidence X-ray diffraction study of all-sputtered Al/CdS and CdS/Al interfaces |
000F77 (1994) |
D. Lemoine [France] ; K.H. Khelladi [France] ; O. Castaing [France] ; J. Benhlal [France] ; A. Quémerais [France] ; I. Pollini [France, Italie] ; R. Triboulet [France] ; R. Granger [France] | Effect of chemical treatments on the composition of HgZnTe surfaces |
001022 (1992) |
Adrian R. Rennie [Royaume-Uni] ; Vittorio Degiorgio [Italie] ; Gian Piero Banfi [Italie] | Small angle neutron scattering study of semiconductor microcrystallites in optical glasses |
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