InforLorV4, Hal, Corpus, bibRecord, 001F80

Enhancing with deconvolution the metrological performance of the grid method for in-plane strain measurement

Identifieur interne : 001F80 ( Hal/Corpus ); précédent : 001F79; suivant : 001F81

Enhancing with deconvolution the metrological performance of the grid method for in-plane strain measurement

Auteurs : Frédéric Sur ; Michel Grediac

Source :

RBID : Hal:hal-00804719

English descriptors

mix :
- Experimental mechanics, correlated noise, deconvolution, grid method, windowed Fourier analysis.

Abstract

This article is motivated by a problem from experimental solid mechanics. The grid method permits to estimate in-plane displacement and strain components in a deformed material. A regular grid is deposited on the surface of the material, and images are taken before and after deformation. Windowed Fourier analysis then gives an estimate of the surface displacement and strain components. We show that the estimates obtained by this technique are approximately the convolution of the actual values with the analysis window. We also characterize how the noise in the grid image impairs the displacement and strain maps. Finally, the metrological performance of the grid method is enhanced with deconvolution algorithms. This work is potentially of interest in optical interferometry, since grids are particular fringe patterns.

Url:

https://hal.inria.fr/hal-00804719

DOI: 10.1109/ICASSP.2013.6637914

Links to Exploration step

Hal:hal-00804719

Le document en format XML

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<front><div type="abstract" xml:lang="en">This article is motivated by a problem from experimental solid mechanics. The grid method permits to estimate in-plane displacement and strain components in a deformed material. A regular grid is deposited on the surface of the material, and images are taken before and after deformation. Windowed Fourier analysis then gives an estimate of the surface displacement and strain components. We show that the estimates obtained by this technique are approximately the convolution of the actual values with the analysis window. We also characterize how the noise in the grid image impairs the displacement and strain maps. Finally, the metrological performance of the grid method is enhanced with deconvolution algorithms. This work is potentially of interest in optical interferometry, since grids are particular fringe patterns.</div>
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<classCode scheme="halDomain" n="phys.meca.mema">Physics [physics]/Mechanics [physics]/Mechanics of materials [physics.class-ph]</classCode>
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<abstract xml:lang="en">This article is motivated by a problem from experimental solid mechanics. The grid method permits to estimate in-plane displacement and strain components in a deformed material. A regular grid is deposited on the surface of the material, and images are taken before and after deformation. Windowed Fourier analysis then gives an estimate of the surface displacement and strain components. We show that the estimates obtained by this technique are approximately the convolution of the actual values with the analysis window. We also characterize how the noise in the grid image impairs the displacement and strain maps. Finally, the metrological performance of the grid method is enhanced with deconvolution algorithms. This work is potentially of interest in optical interferometry, since grids are particular fringe patterns.</abstract>
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Enhancing with deconvolution the metrological performance of the grid method for in-plane strain measurement

Enhancing with deconvolution the metrological performance of the grid method for in-plane strain measurement

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