A new method to detect arcs and segments from curvature profiles
Identifieur interne : 000786 ( Hal/Corpus ); précédent : 000785; suivant : 000787A new method to detect arcs and segments from curvature profiles
Auteurs : Jean-Pierre Salmon ; Isabelle Debled-Rennesson ; Laurent WendlingSource :
English descriptors
Abstract
A new method of arc detection based on arithmetic discrete lines is presented. Key points are extracted from such a profile and used for the reconstruction. The used method is fast and easy to implement. Experimental studies on several series of test images show the stability and the robustness of the proposed method.
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DOI: 10.1109/ICPR.2006.123
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Hal:inria-00104414Le document en format XML
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Key points are extracted from such a profile and used for the reconstruction. The used method is fast and easy to implement. Experimental studies on several series of test images show the stability and the robustness of the proposed method.</div></front></TEI><hal api="V3"><titleStmt><title xml:lang="en">A new method to detect arcs and segments from curvature profiles</title><author role="aut"><persName><forename type="first">Jean-Pierre</forename><surname>Salmon</surname></persName><email></email><idno type="halauthor">66080</idno><affiliation ref="#struct-2361"></affiliation></author><author role="aut"><persName><forename type="first">Isabelle</forename><surname>Debled-Rennesson</surname></persName><email>debled@loria.fr</email><idno type="halauthor">52894</idno><affiliation ref="#struct-22019"></affiliation></author><author role="aut"><persName><forename type="first">Laurent</forename><surname>Wendling</surname></persName><email></email><idno type="halauthor">59044</idno><affiliation ref="#struct-2361"></affiliation></author><editor role="depositor"><persName><forename>Isabelle</forename><surname>Debled-Rennesson</surname></persName><email>debled@loria.fr</email></editor></titleStmt><editionStmt><edition n="v1" type="current"><date type="whenSubmitted">2006-10-06 15:04:28</date><date type="whenWritten">2006</date><date type="whenModified">2016-05-19 01:09:10</date><date type="whenReleased">2006-10-06 15:04:28</date><date type="whenProduced">2006-08-20</date></edition><respStmt><resp>contributor</resp><name key="102573"><persName><forename>Isabelle</forename><surname>Debled-Rennesson</surname></persName><email>debled@loria.fr</email></name></respStmt></editionStmt><publicationStmt><distributor>CCSD</distributor><idno type="halId">inria-00104414</idno><idno type="halUri">https://hal.inria.fr/inria-00104414</idno><idno type="halBibtex">salmon:inria-00104414</idno><idno type="halRefHtml">Y.Y. Tang and S.P. Wang and G. Lorette and D.S. Yeung and H. Yan. 18th International Conference on Pattern Recognition - ICPR 2006, Aug 2006, Hong-Kong, Hong Kong SAR China. IEEE Computer Society, 4, pp.387 - 390, 2006, The 18th International Conference on Pattern Recognition - ICPR 2006. <http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1699546>. <10.1109/ICPR.2006.123></idno><idno type="halRef">Y.Y. Tang and S.P. Wang and G. Lorette and D.S. Yeung and H. Yan. 18th International Conference on Pattern Recognition - ICPR 2006, Aug 2006, Hong-Kong, Hong Kong SAR China. IEEE Computer Society, 4, pp.387 - 390, 2006, The 18th International Conference on Pattern Recognition - ICPR 2006. <http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1699546>. <10.1109/ICPR.2006.123></idno></publicationStmt><seriesStmt><idno type="stamp" n="INRIA">INRIA - Institut National de Recherche en Informatique et en Automatique</idno><idno type="stamp" n="CNRS">CNRS - Centre national de la recherche scientifique</idno><idno type="stamp" n="INPL">Institut National Polytechnique de Lorraine</idno><idno type="stamp" n="LORIA2">Publications du LORIA</idno><idno type="stamp" n="LABO-LORIA-SET" p="LORIA">LABO-LORIA-SET</idno><idno type="stamp" n="INRIA-NANCY-GRAND-EST">INRIA Nancy - Grand Est</idno><idno type="stamp" n="LORIA-ACGI" p="LORIA">Algorithmique, calcul, image et géométrie</idno><idno type="stamp" n="LORIA">LORIA - Laboratoire Lorrain de Recherche en Informatique et ses Applications</idno><idno type="stamp" n="LORIA-TALC" p="LORIA">Traitement automatique des langues et des connaissances</idno><idno type="stamp" n="UNIV-LORRAINE">Université de Lorraine</idno><idno type="stamp" n="INRIA-LORRAINE">INRIA Nancy - Grand Est</idno></seriesStmt><notesStmt><note type="commentary">ISSN: 1051-4651
Print ISBN: 0-7695-2521-0</note><note type="audience" n="2">International</note><note type="invited" n="0">No</note><note type="popular" n="0">No</note><note type="peer" n="1">Yes</note><note type="proceedings" n="1">Yes</note></notesStmt><sourceDesc><biblStruct><analytic><title xml:lang="en">A new method to detect arcs and segments from curvature profiles</title><author role="aut"><persName><forename type="first">Jean-Pierre</forename><surname>Salmon</surname></persName><idno type="halAuthorId">66080</idno><affiliation ref="#struct-2361"></affiliation></author><author role="aut"><persName><forename type="first">Isabelle</forename><surname>Debled-Rennesson</surname></persName><email>debled@loria.fr</email><idno type="halAuthorId">52894</idno><affiliation ref="#struct-22019"></affiliation></author><author role="aut"><persName><forename type="first">Laurent</forename><surname>Wendling</surname></persName><idno type="halAuthorId">59044</idno><affiliation ref="#struct-2361"></affiliation></author></analytic><monogr><meeting><title>18th International Conference on Pattern Recognition - ICPR 2006</title><date type="start">2006-08-20</date><date type="end">2006-08-24</date><settlement>Hong-Kong</settlement><country key="HK">Hong Kong SAR China</country></meeting><editor>Y.Y. Tang and S.P. Wang and G. Lorette and D.S. Yeung and H. Yan</editor><imprint><publisher>IEEE Computer Society</publisher><biblScope unit="serie">The 18th International Conference on Pattern Recognition - ICPR 2006</biblScope><biblScope unit="volume">4</biblScope><biblScope unit="pp">387 - 390</biblScope><date type="datePub">2006-08-21</date></imprint></monogr><idno type="doi">10.1109/ICPR.2006.123</idno><ref type="publisher">http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1699546</ref></biblStruct></sourceDesc><profileDesc><langUsage><language ident="en">English</language></langUsage><textClass><keywords scheme="author"><term xml:lang="en">computational geometry</term><term xml:lang="en">image reconstruction</term><term xml:lang="en">image segmentation</term><term xml:lang="en">object detection</term></keywords><classCode scheme="halDomain" n="info.info-cg">Computer Science [cs]/Computational Geometry [cs.CG]</classCode><classCode scheme="halDomain" n="info.info-ti">Computer Science [cs]/Image Processing</classCode><classCode scheme="halTypology" n="COMM">Conference papers</classCode></textClass><abstract xml:lang="en">A new method of arc detection based on arithmetic discrete lines is presented. Key points are extracted from such a profile and used for the reconstruction. The used method is fast and easy to implement. Experimental studies on several series of test images show the stability and the robustness of the proposed method.</abstract></profileDesc></hal></record>Pour manipuler ce document sous Unix (Dilib)
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