Development of nanomanipulator using a high-speed atomic force microscope coupled with a haptic device.
Identifieur interne : 000938 ( PubMed/Checkpoint ); précédent : 000937; suivant : 000939Development of nanomanipulator using a high-speed atomic force microscope coupled with a haptic device.
Auteurs : F. Iwata [Japon] ; Y. Ohashi ; I. Ishisaki ; L M Picco ; T. UshikiSource :
- Ultramicroscopy [ 1879-2723 ] ; 2013.
English descriptors
- KwdEn :
- MESH :
- instrumentation : Microscopy, Atomic Force, Nanotechnology.
- methods : Microscopy, Atomic Force, Nanotechnology.
- Feedback, Humans.
Abstract
The atomic force microscope (AFM) has been widely used for surface fabrication and manipulation. However, nanomanipulation using a conventional AFM is inefficient because of the sequential nature of the scan-manipulation scan cycle, which makes it difficult for the operator to observe the region of interest and perform the manipulation simultaneously. In this paper, a nanomanipulation technique using a high-speed atomic force microscope (HS-AFM) is described. During manipulation using the AFM probe, the operation is periodically interrupted for a fraction of a second for high-speed imaging that allows the topographical image of the manipulated surface to be periodically updated. With the use of high-speed imaging, the interrupting time for imaging can be greatly reduced, and as a result, the operator almost does not notice the blink time of the interruption for imaging during the manipulation. This creates a more intuitive interface with greater feedback and finesse to the operator. Nanofabrication under real-time monitoring was performed to demonstrate the utility of this arrangement for real-time nanomanipulation of sample surfaces under ambient conditions. Furthermore, the HS-AFM is coupled with a haptic device for the human interface, enabling the operator to move the HS-AFM probe to any position on the surface while feeling the response from the surface during the manipulation.
DOI: 10.1016/j.ultramic.2013.06.014
PubMed: 23933597
Affiliations:
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Electronic address: tmfiwat@ipc.shizuoka.ac.jp.</nlm:affiliation><country xml:lang="fr">Japon</country><wicri:regionArea>Faculty of Engineering, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8561, Japan; Research Institute of Electronics, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8011</wicri:regionArea><wicri:noRegion>Hamamatsu 432-8011</wicri:noRegion></affiliation></author><author><name sortKey="Ohashi, Y" sort="Ohashi, Y" uniqKey="Ohashi Y" first="Y" last="Ohashi">Y. Ohashi</name></author><author><name sortKey="Ishisaki, I" sort="Ishisaki, I" uniqKey="Ishisaki I" first="I" last="Ishisaki">I. Ishisaki</name></author><author><name sortKey="Picco, L M" sort="Picco, L M" uniqKey="Picco L" first="L M" last="Picco">L M Picco</name></author><author><name sortKey="Ushiki, T" sort="Ushiki, T" uniqKey="Ushiki T" first="T" last="Ushiki">T. 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Ushiki</name></author></analytic><series><title level="j">Ultramicroscopy</title><idno type="eISSN">1879-2723</idno><imprint><date when="2013" type="published">2013</date></imprint></series></biblStruct></sourceDesc></fileDesc><profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Feedback</term><term>Humans</term><term>Microscopy, Atomic Force (instrumentation)</term><term>Microscopy, Atomic Force (methods)</term><term>Nanotechnology (instrumentation)</term><term>Nanotechnology (methods)</term></keywords><keywords scheme="MESH" qualifier="instrumentation" xml:lang="en"><term>Microscopy, Atomic Force</term><term>Nanotechnology</term></keywords><keywords scheme="MESH" qualifier="methods" xml:lang="en"><term>Microscopy, Atomic Force</term><term>Nanotechnology</term></keywords><keywords scheme="MESH" xml:lang="en"><term>Feedback</term><term>Humans</term></keywords></textClass></profileDesc></teiHeader><front><div type="abstract" xml:lang="en">The atomic force microscope (AFM) has been widely used for surface fabrication and manipulation. However, nanomanipulation using a conventional AFM is inefficient because of the sequential nature of the scan-manipulation scan cycle, which makes it difficult for the operator to observe the region of interest and perform the manipulation simultaneously. In this paper, a nanomanipulation technique using a high-speed atomic force microscope (HS-AFM) is described. During manipulation using the AFM probe, the operation is periodically interrupted for a fraction of a second for high-speed imaging that allows the topographical image of the manipulated surface to be periodically updated. With the use of high-speed imaging, the interrupting time for imaging can be greatly reduced, and as a result, the operator almost does not notice the blink time of the interruption for imaging during the manipulation. This creates a more intuitive interface with greater feedback and finesse to the operator. Nanofabrication under real-time monitoring was performed to demonstrate the utility of this arrangement for real-time nanomanipulation of sample surfaces under ambient conditions. Furthermore, the HS-AFM is coupled with a haptic device for the human interface, enabling the operator to move the HS-AFM probe to any position on the surface while feeling the response from the surface during the manipulation.</div></front></TEI><pubmed><MedlineCitation Owner="NLM" Status="MEDLINE"><PMID Version="1">23933597</PMID><DateCreated><Year>2013</Year><Month>09</Month><Day>10</Day></DateCreated><DateCompleted><Year>2014</Year><Month>04</Month><Day>17</Day></DateCompleted><Article PubModel="Print-Electronic"><Journal><ISSN IssnType="Electronic">1879-2723</ISSN><JournalIssue CitedMedium="Internet"><Volume>133</Volume><PubDate><Year>2013</Year><Month>Oct</Month></PubDate></JournalIssue><Title>Ultramicroscopy</Title><ISOAbbreviation>Ultramicroscopy</ISOAbbreviation></Journal><ArticleTitle>Development of nanomanipulator using a high-speed atomic force microscope coupled with a haptic device.</ArticleTitle><Pagination><MedlinePgn>88-94</MedlinePgn></Pagination><ELocationID EIdType="doi" ValidYN="Y">10.1016/j.ultramic.2013.06.014</ELocationID><ELocationID EIdType="pii" ValidYN="Y">S0304-3991(13)00157-5</ELocationID><Abstract><AbstractText>The atomic force microscope (AFM) has been widely used for surface fabrication and manipulation. However, nanomanipulation using a conventional AFM is inefficient because of the sequential nature of the scan-manipulation scan cycle, which makes it difficult for the operator to observe the region of interest and perform the manipulation simultaneously. In this paper, a nanomanipulation technique using a high-speed atomic force microscope (HS-AFM) is described. During manipulation using the AFM probe, the operation is periodically interrupted for a fraction of a second for high-speed imaging that allows the topographical image of the manipulated surface to be periodically updated. With the use of high-speed imaging, the interrupting time for imaging can be greatly reduced, and as a result, the operator almost does not notice the blink time of the interruption for imaging during the manipulation. This creates a more intuitive interface with greater feedback and finesse to the operator. Nanofabrication under real-time monitoring was performed to demonstrate the utility of this arrangement for real-time nanomanipulation of sample surfaces under ambient conditions. Furthermore, the HS-AFM is coupled with a haptic device for the human interface, enabling the operator to move the HS-AFM probe to any position on the surface while feeling the response from the surface during the manipulation.</AbstractText><CopyrightInformation>Copyright © 2013 Elsevier B.V. All rights reserved.</CopyrightInformation></Abstract><AuthorList CompleteYN="Y"><Author ValidYN="Y"><LastName>Iwata</LastName><ForeName>F</ForeName><Initials>F</Initials><AffiliationInfo><Affiliation>Faculty of Engineering, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8561, Japan; Research Institute of Electronics, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8011, Japan. Electronic address: tmfiwat@ipc.shizuoka.ac.jp.</Affiliation></AffiliationInfo></Author><Author ValidYN="Y"><LastName>Ohashi</LastName><ForeName>Y</ForeName><Initials>Y</Initials></Author><Author ValidYN="Y"><LastName>Ishisaki</LastName><ForeName>I</ForeName><Initials>I</Initials></Author><Author ValidYN="Y"><LastName>Picco</LastName><ForeName>L M</ForeName><Initials>LM</Initials></Author><Author ValidYN="Y"><LastName>Ushiki</LastName><ForeName>T</ForeName><Initials>T</Initials></Author></AuthorList><Language>eng</Language><PublicationTypeList><PublicationType UI="D016428">Journal Article</PublicationType><PublicationType UI="D013485">Research Support, Non-U.S. Gov't</PublicationType></PublicationTypeList><ArticleDate DateType="Electronic"><Year>2013</Year><Month>07</Month><Day>12</Day></ArticleDate></Article><MedlineJournalInfo><Country>Netherlands</Country><MedlineTA>Ultramicroscopy</MedlineTA><NlmUniqueID>7513702</NlmUniqueID><ISSNLinking>0304-3991</ISSNLinking></MedlineJournalInfo><CitationSubset>IM</CitationSubset><MeshHeadingList><MeshHeading><DescriptorName MajorTopicYN="N" UI="D005246">Feedback</DescriptorName></MeshHeading><MeshHeading><DescriptorName MajorTopicYN="N" UI="D006801">Humans</DescriptorName></MeshHeading><MeshHeading><DescriptorName MajorTopicYN="N" UI="D018625">Microscopy, Atomic Force</DescriptorName><QualifierName MajorTopicYN="Y" UI="Q000295">instrumentation</QualifierName><QualifierName MajorTopicYN="Y" UI="Q000379">methods</QualifierName></MeshHeading><MeshHeading><DescriptorName MajorTopicYN="N" UI="D036103">Nanotechnology</DescriptorName><QualifierName MajorTopicYN="Y" UI="Q000295">instrumentation</QualifierName><QualifierName MajorTopicYN="Y" UI="Q000379">methods</QualifierName></MeshHeading></MeshHeadingList><KeywordList Owner="NOTNLM"><Keyword MajorTopicYN="N">Atomic force microscope</Keyword><Keyword MajorTopicYN="N">Nanofabrication</Keyword><Keyword MajorTopicYN="N">Nanomanipulation</Keyword></KeywordList></MedlineCitation><PubmedData><History><PubMedPubDate PubStatus="received"><Year>2012</Year><Month>12</Month><Day>15</Day></PubMedPubDate><PubMedPubDate PubStatus="revised"><Year>2013</Year><Month>5</Month><Day>29</Day></PubMedPubDate><PubMedPubDate PubStatus="accepted"><Year>2013</Year><Month>6</Month><Day>20</Day></PubMedPubDate><PubMedPubDate PubStatus="aheadofprint"><Year>2013</Year><Month>7</Month><Day>12</Day></PubMedPubDate><PubMedPubDate PubStatus="entrez"><Year>2013</Year><Month>8</Month><Day>13</Day><Hour>6</Hour><Minute>0</Minute></PubMedPubDate><PubMedPubDate PubStatus="pubmed"><Year>2013</Year><Month>8</Month><Day>13</Day><Hour>6</Hour><Minute>0</Minute></PubMedPubDate><PubMedPubDate PubStatus="medline"><Year>2014</Year><Month>4</Month><Day>18</Day><Hour>6</Hour><Minute>0</Minute></PubMedPubDate></History><PublicationStatus>ppublish</PublicationStatus><ArticleIdList><ArticleId IdType="pubmed">23933597</ArticleId><ArticleId IdType="pii">S0304-3991(13)00157-5</ArticleId><ArticleId IdType="doi">10.1016/j.ultramic.2013.06.014</ArticleId></ArticleIdList></PubmedData></pubmed><affiliations><list><country><li>Japon</li></country></list><tree><noCountry><name sortKey="Ishisaki, I" sort="Ishisaki, I" uniqKey="Ishisaki I" first="I" last="Ishisaki">I. Ishisaki</name><name sortKey="Ohashi, Y" sort="Ohashi, Y" uniqKey="Ohashi Y" first="Y" last="Ohashi">Y. Ohashi</name><name sortKey="Picco, L M" sort="Picco, L M" uniqKey="Picco L" first="L M" last="Picco">L M Picco</name><name sortKey="Ushiki, T" sort="Ushiki, T" uniqKey="Ushiki T" first="T" last="Ushiki">T. Ushiki</name></noCountry><country name="Japon"><noRegion><name sortKey="Iwata, F" sort="Iwata, F" uniqKey="Iwata F" first="F" last="Iwata">F. Iwata</name></noRegion></country></tree></affiliations></record>Pour manipuler ce document sous Unix (Dilib)
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