Metrology characterization of ultraprecise bendable mirrors for the European XFEL: from offsite calibration to installation and commissioning.
Identifieur interne : 000475 ( Main/Corpus ); précédent : 000474; suivant : 000476Metrology characterization of ultraprecise bendable mirrors for the European XFEL: from offsite calibration to installation and commissioning.
Auteurs : Maurizio Vannoni ; Idoia Freijo Martín ; Silja Smidtchen ; Thomas M. Baumann ; Michael Meyer ; Valerija MusicSource :
- Journal of synchrotron radiation [ 1600-5775 ] ; 2019.
Abstract
The European XFEL requires long and ultraflat X-ray mirrors of high precision for the beam offset and distribution system [Altarelli et al. (2006), XFEL Technical Design Report, DESY 2006-097. DESY, Hamburg, Germany]. A general specification of the beam transport mirrors is a length of up to 950 mm and an optical surface with a deviation from a perfectly flat surface of <30 nm peak-to-valley and a figure error of <2 nm peak-to-valley. From a production point of view, such a mirror cannot be easily fabricated so, in each beamline, it is foreseen to have at least one mirror with bending capabilities. In this way, it is possible to correct the residual divergence of the beam in order to focus it in the correct position with high accuracy and repeatability. This is practically implemented using a mechanical bender in which the mirror is mounted and bent through a motorized actuator. One such system was characterized in the metrology lab using a large-aperture Fizeau interferometer and a capacitive sensor. It was then installed in the beamline and calibrated again using the X-ray beam. Here, the procedure is described and the two different methods are compared, stressing the differences and the possible explanations and improvements.
DOI: 10.1107/S1600577519005381
PubMed: 31274434
PubMed Central: PMC6613111
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pubmed:31274434Le document en format XML
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Baumann</name><affiliation><nlm:affiliation>European XFEL GmbH, Schenefeld, Germany.</nlm:affiliation></affiliation></author><author><name sortKey="Meyer, Michael" sort="Meyer, Michael" uniqKey="Meyer M" first="Michael" last="Meyer">Michael Meyer</name><affiliation><nlm:affiliation>European XFEL GmbH, Schenefeld, Germany.</nlm:affiliation></affiliation></author><author><name sortKey="Music, Valerija" sort="Music, Valerija" uniqKey="Music V" first="Valerija" last="Music">Valerija Music</name><affiliation><nlm:affiliation>European XFEL GmbH, Schenefeld, Germany.</nlm:affiliation></affiliation></author></titleStmt><publicationStmt><idno type="wicri:source">PubMed</idno><date when="2019">2019</date><idno type="RBID">pubmed:31274434</idno><idno type="pmid">31274434</idno><idno type="doi">10.1107/S1600577519005381</idno><idno type="pmc">PMC6613111</idno><idno type="wicri:Area/Main/Corpus">000475</idno><idno type="wicri:explorRef" wicri:stream="Main" wicri:step="Corpus" wicri:corpus="PubMed">000475</idno></publicationStmt><sourceDesc><biblStruct><analytic><title xml:lang="en">Metrology characterization of ultraprecise bendable mirrors for the European XFEL: from offsite calibration to installation and commissioning.</title><author><name sortKey="Vannoni, Maurizio" sort="Vannoni, Maurizio" uniqKey="Vannoni M" first="Maurizio" last="Vannoni">Maurizio Vannoni</name><affiliation><nlm:affiliation>European XFEL GmbH, Schenefeld, Germany.</nlm:affiliation></affiliation></author><author><name sortKey="Freijo Martin, Idoia" sort="Freijo Martin, Idoia" uniqKey="Freijo Martin I" first="Idoia" last="Freijo Martín">Idoia Freijo Martín</name><affiliation><nlm:affiliation>European XFEL GmbH, Schenefeld, Germany.</nlm:affiliation></affiliation></author><author><name sortKey="Smidtchen, Silja" sort="Smidtchen, Silja" uniqKey="Smidtchen S" first="Silja" last="Smidtchen">Silja Smidtchen</name><affiliation><nlm:affiliation>European XFEL GmbH, Schenefeld, Germany.</nlm:affiliation></affiliation></author><author><name sortKey="Baumann, Thomas M" sort="Baumann, Thomas M" uniqKey="Baumann T" first="Thomas M" last="Baumann">Thomas M. Baumann</name><affiliation><nlm:affiliation>European XFEL GmbH, Schenefeld, Germany.</nlm:affiliation></affiliation></author><author><name sortKey="Meyer, Michael" sort="Meyer, Michael" uniqKey="Meyer M" first="Michael" last="Meyer">Michael Meyer</name><affiliation><nlm:affiliation>European XFEL GmbH, Schenefeld, Germany.</nlm:affiliation></affiliation></author><author><name sortKey="Music, Valerija" sort="Music, Valerija" uniqKey="Music V" first="Valerija" last="Music">Valerija Music</name><affiliation><nlm:affiliation>European XFEL GmbH, Schenefeld, Germany.</nlm:affiliation></affiliation></author></analytic><series><title level="j">Journal of synchrotron radiation</title><idno type="eISSN">1600-5775</idno><imprint><date when="2019" type="published">2019</date></imprint></series></biblStruct></sourceDesc></fileDesc><profileDesc><textClass></textClass></profileDesc></teiHeader><front><div type="abstract" xml:lang="en">The European XFEL requires long and ultraflat X-ray mirrors of high precision for the beam offset and distribution system [Altarelli et al. (2006), XFEL Technical Design Report, DESY 2006-097. DESY, Hamburg, Germany]. A general specification of the beam transport mirrors is a length of up to 950 mm and an optical surface with a deviation from a perfectly flat surface of <30 nm peak-to-valley and a figure error of <2 nm peak-to-valley. From a production point of view, such a mirror cannot be easily fabricated so, in each beamline, it is foreseen to have at least one mirror with bending capabilities. In this way, it is possible to correct the residual divergence of the beam in order to focus it in the correct position with high accuracy and repeatability. This is practically implemented using a mechanical bender in which the mirror is mounted and bent through a motorized actuator. One such system was characterized in the metrology lab using a large-aperture Fizeau interferometer and a capacitive sensor. It was then installed in the beamline and calibrated again using the X-ray beam. Here, the procedure is described and the two different methods are compared, stressing the differences and the possible explanations and improvements.</div></front></TEI><pubmed><MedlineCitation Status="PubMed-not-MEDLINE" Owner="NLM"><PMID Version="1">31274434</PMID><DateRevised><Year>2020</Year><Month>02</Month><Day>25</Day></DateRevised><Article PubModel="Print-Electronic"><Journal><ISSN IssnType="Electronic">1600-5775</ISSN><JournalIssue CitedMedium="Internet"><Volume>26</Volume><Issue>Pt 4</Issue><PubDate><Year>2019</Year><Month>Jul</Month><Day>01</Day></PubDate></JournalIssue><Title>Journal of synchrotron radiation</Title><ISOAbbreviation>J Synchrotron Radiat</ISOAbbreviation></Journal><ArticleTitle>Metrology characterization of ultraprecise bendable mirrors for the European XFEL: from offsite calibration to installation and commissioning.</ArticleTitle><Pagination><MedlinePgn>1110-1114</MedlinePgn></Pagination><ELocationID EIdType="doi" ValidYN="Y">10.1107/S1600577519005381</ELocationID><Abstract><AbstractText>The European XFEL requires long and ultraflat X-ray mirrors of high precision for the beam offset and distribution system [Altarelli et al. (2006), XFEL Technical Design Report, DESY 2006-097. DESY, Hamburg, Germany]. A general specification of the beam transport mirrors is a length of up to 950 mm and an optical surface with a deviation from a perfectly flat surface of <30 nm peak-to-valley and a figure error of <2 nm peak-to-valley. From a production point of view, such a mirror cannot be easily fabricated so, in each beamline, it is foreseen to have at least one mirror with bending capabilities. In this way, it is possible to correct the residual divergence of the beam in order to focus it in the correct position with high accuracy and repeatability. This is practically implemented using a mechanical bender in which the mirror is mounted and bent through a motorized actuator. One such system was characterized in the metrology lab using a large-aperture Fizeau interferometer and a capacitive sensor. It was then installed in the beamline and calibrated again using the X-ray beam. Here, the procedure is described and the two different methods are compared, stressing the differences and the possible explanations and improvements.</AbstractText><CopyrightInformation>open access.</CopyrightInformation></Abstract><AuthorList CompleteYN="Y"><Author ValidYN="Y"><LastName>Vannoni</LastName><ForeName>Maurizio</ForeName><Initials>M</Initials><Identifier Source="ORCID">0000-0002-2768-4559</Identifier><AffiliationInfo><Affiliation>European XFEL GmbH, Schenefeld, Germany.</Affiliation></AffiliationInfo></Author><Author ValidYN="Y"><LastName>Freijo Martín</LastName><ForeName>Idoia</ForeName><Initials>I</Initials><AffiliationInfo><Affiliation>European XFEL GmbH, Schenefeld, Germany.</Affiliation></AffiliationInfo></Author><Author ValidYN="Y"><LastName>Smidtchen</LastName><ForeName>Silja</ForeName><Initials>S</Initials><AffiliationInfo><Affiliation>European XFEL GmbH, Schenefeld, Germany.</Affiliation></AffiliationInfo></Author><Author ValidYN="Y"><LastName>Baumann</LastName><ForeName>Thomas M</ForeName><Initials>TM</Initials><AffiliationInfo><Affiliation>European XFEL GmbH, Schenefeld, Germany.</Affiliation></AffiliationInfo></Author><Author ValidYN="Y"><LastName>Meyer</LastName><ForeName>Michael</ForeName><Initials>M</Initials><AffiliationInfo><Affiliation>European XFEL GmbH, Schenefeld, Germany.</Affiliation></AffiliationInfo></Author><Author ValidYN="Y"><LastName>Music</LastName><ForeName>Valerija</ForeName><Initials>V</Initials><AffiliationInfo><Affiliation>European XFEL GmbH, Schenefeld, Germany.</Affiliation></AffiliationInfo></Author></AuthorList><Language>eng</Language><PublicationTypeList><PublicationType UI="D016428">Journal Article</PublicationType></PublicationTypeList><ArticleDate DateType="Electronic"><Year>2019</Year><Month>06</Month><Day>18</Day></ArticleDate></Article><MedlineJournalInfo><Country>United States</Country><MedlineTA>J Synchrotron Radiat</MedlineTA><NlmUniqueID>9888878</NlmUniqueID><ISSNLinking>0909-0495</ISSNLinking></MedlineJournalInfo><KeywordList Owner="NOTNLM"><Keyword MajorTopicYN="N">X-ray optics</Keyword><Keyword MajorTopicYN="N">bender</Keyword><Keyword MajorTopicYN="N">metrology</Keyword><Keyword MajorTopicYN="N">mirror</Keyword></KeywordList></MedlineCitation><PubmedData><History><PubMedPubDate PubStatus="received"><Year>2019</Year><Month>02</Month><Day>04</Day></PubMedPubDate><PubMedPubDate PubStatus="accepted"><Year>2019</Year><Month>04</Month><Day>19</Day></PubMedPubDate><PubMedPubDate PubStatus="entrez"><Year>2019</Year><Month>7</Month><Day>6</Day><Hour>6</Hour><Minute>0</Minute></PubMedPubDate><PubMedPubDate PubStatus="pubmed"><Year>2019</Year><Month>7</Month><Day>6</Day><Hour>6</Hour><Minute>0</Minute></PubMedPubDate><PubMedPubDate PubStatus="medline"><Year>2019</Year><Month>7</Month><Day>6</Day><Hour>6</Hour><Minute>1</Minute></PubMedPubDate></History><PublicationStatus>ppublish</PublicationStatus><ArticleIdList><ArticleId IdType="pubmed">31274434</ArticleId><ArticleId IdType="pii">S1600577519005381</ArticleId><ArticleId IdType="doi">10.1107/S1600577519005381</ArticleId><ArticleId IdType="pmc">PMC6613111</ArticleId></ArticleIdList><ReferenceList><Reference><Citation>J Synchrotron Radiat. 2016 Jul;23(Pt 4):855-60</Citation><ArticleIdList><ArticleId IdType="pubmed">27359132</ArticleId></ArticleIdList></Reference></ReferenceList></PubmedData></pubmed></record>Pour manipuler ce document sous Unix (Dilib)
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