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Local Surface Potential of π‐Conjugated Nanostructures by Kelvin Probe Force Microscopy: Effect of the Sampling Depth

Identifieur interne : 001507 ( Istex/Corpus ); précédent : 001506; suivant : 001508

Local Surface Potential of π‐Conjugated Nanostructures by Kelvin Probe Force Microscopy: Effect of the Sampling Depth

Auteurs : Andrea Liscio ; Vincenzo Palermo ; Oliver Fenwick ; Slawomir Braun ; Klaus Müllen ; Mats Fahlman ; Franco Cacialli ; Paolo Samorí

Source :

RBID : ISTEX:247B010E9EA58A069FF3C8CDA973D2C3585DD365

English descriptors

Abstract

Kelvin probe force microscopy (KPFM) is usually applied to map the local surface potential of nanostructured materials at surfaces and interfaces. KPFM is commonly defined as a ‘surface technique’, even if this assumption is not fully justified. However, a quantification of the surface sensitivity of this technique is crucial to explore electrical properties at the nanoscale. Here a versatile 3D model is presented which provides a quantitative explanation of KPFM results, taking into account the vertical structure of the sample. The model is tested on nanostructured films obtained from two relevant semiconducting systems for field‐effect transistor and solar cell applications showing different interfacial properties, i.e., poly(3‐hexylthiophene) (P3HT) and perylene‐bis‐dicarboximide (PDI). These findings are especially important since they enable quantitative determination of the local surface potential of conjugated nanostructures, and thereby pave the way towards optimization of the electronic properties of nanoscale architectures for organic electronic applications.

Url:
DOI: 10.1002/smll.201001770

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ISTEX:247B010E9EA58A069FF3C8CDA973D2C3585DD365

Le document en format XML

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<div type="abstract" xml:lang="en">Kelvin probe force microscopy (KPFM) is usually applied to map the local surface potential of nanostructured materials at surfaces and interfaces. KPFM is commonly defined as a ‘surface technique’, even if this assumption is not fully justified. However, a quantification of the surface sensitivity of this technique is crucial to explore electrical properties at the nanoscale. Here a versatile 3D model is presented which provides a quantitative explanation of KPFM results, taking into account the vertical structure of the sample. The model is tested on nanostructured films obtained from two relevant semiconducting systems for field‐effect transistor and solar cell applications showing different interfacial properties, i.e., poly(3‐hexylthiophene) (P3HT) and perylene‐bis‐dicarboximide (PDI). These findings are especially important since they enable quantitative determination of the local surface potential of conjugated nanostructures, and thereby pave the way towards optimization of the electronic properties of nanoscale architectures for organic electronic applications.</div>
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<copyrightDate encoding="w3cdtf">2011</copyrightDate>
</originInfo>
<language>
<languageTerm type="code" authority="rfc3066">en</languageTerm>
<languageTerm type="code" authority="iso639-2b">eng</languageTerm>
</language>
<physicalDescription>
<internetMediaType>text/html</internetMediaType>
<extent unit="figures">3</extent>
<extent unit="references">24</extent>
</physicalDescription>
<abstract lang="en">Kelvin probe force microscopy (KPFM) is usually applied to map the local surface potential of nanostructured materials at surfaces and interfaces. KPFM is commonly defined as a ‘surface technique’, even if this assumption is not fully justified. However, a quantification of the surface sensitivity of this technique is crucial to explore electrical properties at the nanoscale. Here a versatile 3D model is presented which provides a quantitative explanation of KPFM results, taking into account the vertical structure of the sample. The model is tested on nanostructured films obtained from two relevant semiconducting systems for field‐effect transistor and solar cell applications showing different interfacial properties, i.e., poly(3‐hexylthiophene) (P3HT) and perylene‐bis‐dicarboximide (PDI). These findings are especially important since they enable quantitative determination of the local surface potential of conjugated nanostructures, and thereby pave the way towards optimization of the electronic properties of nanoscale architectures for organic electronic applications.</abstract>
<abstract>The structural and electronic properties of conjugated nanostructures, important for organic electronics, are quantitatively studied using Kelvin probe force microscopy with spatial and voltage resolutions of a few nanometers and millivolts, respectively. A comprehensive model is presented describing the precise 3D surface‐potential mapping in functional electroactive nano‐objects such as ultrathin layers of poly(3‐hexylthiophene) and needles of perylene‐bis‐dicarboximide.</abstract>
<subject lang="en">
<genre>keywords</genre>
<topic>organic electronics</topic>
<topic>charge injection</topic>
<topic>Kelvin Probe Force Microscopy</topic>
<topic>surface potential</topic>
<topic>interfaces</topic>
<topic>conjugated nanostructures</topic>
</subject>
<relatedItem type="host">
<titleInfo>
<title>Small</title>
</titleInfo>
<titleInfo type="abbreviated">
<title>Small</title>
</titleInfo>
<genre type="journal">journal</genre>
<note type="content"> Detailed facts of importance to specialist readers are published as ”Supporting Information”. Such documents are peer‐reviewed, but not copy‐edited or typeset. They are made available as submitted by the authors.Supporting Info Item: suppl - </note>
<subject>
<genre>article-category</genre>
<topic>Full Paper</topic>
</subject>
<identifier type="ISSN">1613-6810</identifier>
<identifier type="eISSN">1613-6829</identifier>
<identifier type="DOI">10.1002/(ISSN)1613-6829</identifier>
<identifier type="PublisherID">SMLL</identifier>
<part>
<date>2011</date>
<detail type="volume">
<caption>vol.</caption>
<number>7</number>
</detail>
<detail type="issue">
<caption>no.</caption>
<number>5</number>
</detail>
<extent unit="pages">
<start>634</start>
<end>639</end>
<total>6</total>
</extent>
</part>
</relatedItem>
<identifier type="istex">247B010E9EA58A069FF3C8CDA973D2C3585DD365</identifier>
<identifier type="DOI">10.1002/smll.201001770</identifier>
<identifier type="ArticleID">SMLL201001770</identifier>
<accessCondition type="use and reproduction" contentType="copyright">Copyright © 2011 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim</accessCondition>
<recordInfo>
<recordContentSource>WILEY</recordContentSource>
<recordOrigin>WILEY‐VCH Verlag</recordOrigin>
</recordInfo>
</mods>
</metadata>
<serie></serie>
</istex>
</record>

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