Electron Scattering Theory
Identifieur interne : 001857 ( Istex/Corpus ); précédent : 001856; suivant : 001858Electron Scattering Theory
Auteurs : Ray F. EgertonSource :
Abstract
Abstract: It is convenient to divide the scattering of fast electrons into elastic and inelastic components. An experimentalist can distinguish between the two on an empirical basis, the term “elastic” being taken to mean that the energy loss to the sample is less than some experimental resolution limit Such a criterion results in electron scattering by phonon excitation being classified as elastic (or quasielastic) if measurements have been made using an electron microscope, where the energy resolution is usually not better than 1 eV.
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DOI: 10.1007/978-1-4615-6887-2_3
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An experimentalist can distinguish between the two on an empirical basis, the term “elastic” being taken to mean that the energy loss to the sample is less than some experimental resolution limit Such a criterion results in electron scattering by phonon excitation being classified as elastic (or quasielastic) if measurements have been made using an electron microscope, where the energy resolution is usually not better than 1 eV.</abstract><qualityIndicators><refBibsNative>false</refBibsNative><abstractWordCount>84</abstractWordCount><abstractCharCount>541</abstractCharCount><keywordCount>0</keywordCount><score>8.008</score><pdfWordCount>26600</pdfWordCount><pdfCharCount>155307</pdfCharCount><pdfVersion>1.4</pdfVersion><pdfPageCount>100</pdfPageCount><pdfPageSize>430.866 x 649.134 pts</pdfPageSize></qualityIndicators><title>Electron Scattering Theory</title><chapterId><json:string>3</json:string><json:string>Chap3</json:string></chapterId><genre><json:string>chapter</json:string></genre><host><title>Electron Energy-Loss Spectroscopy in the Electron Microscope</title><language><json:string>unknown</json:string></language><copyrightDate>1995</copyrightDate><doi><json:string>10.1007/978-1-4615-6887-2</json:string></doi><eisbn><json:string>978-1-4615-6887-2</json:string></eisbn><bookId><json:string>978-1-4615-6887-2</json:string></bookId><isbn><json:string>978-1-4615-6889-6</json:string></isbn><pages><first>129</first><last>228</last></pages><genre><json:string>book</json:string></genre><author><json:item><name>Ray F. 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An experimentalist can distinguish between the two on an empirical basis, the term “elastic” being taken to mean that the energy loss to the sample is less than some experimental resolution limit Such a criterion results in electron scattering by phonon excitation being classified as elastic (or quasielastic) if measurements have been made using an electron microscope, where the energy resolution is usually not better than 1 eV.</p></abstract><textClass ana="subject"><keywords scheme="book-subject-collection"><list><label>SUCO11644</label><item><term>Chemistry and Materials Science</term></item></list></keywords></textClass><textClass ana="subject"><keywords scheme="book-subject"><list><label>SCC</label><item><term type="Primary">Chemistry</term></item><label>C11020</label><item><term type="Secondary" subtype="priority-1">Spectroscopy/Spectrometry</term></item><label>P31090</label><item><term type="Secondary" subtype="priority-2">Spectroscopy and 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US</PublisherName><PublisherLocation>Boston, MA</PublisherLocation></PublisherInfo><Book Language="En"><BookInfo Language="En" TocLevels="0" NumberingStyle="ChapterOnly" OutputMedium="All" ContainsESM="No" BookProductType="Contributed volume" MediaType="eBook"><BookID>978-1-4615-6887-2</BookID><BookTitle>Electron Energy-Loss Spectroscopy in the Electron Microscope</BookTitle><BookDOI>10.1007/978-1-4615-6887-2</BookDOI><BookTitleID>120031</BookTitleID><BookPrintISBN>978-1-4615-6889-6</BookPrintISBN><BookElectronicISBN>978-1-4615-6887-2</BookElectronicISBN><BookChapterCount>5</BookChapterCount><BookCopyright><CopyrightHolderName>Springer-Verlag US</CopyrightHolderName><CopyrightYear>1995</CopyrightYear></BookCopyright><BookSubjectGroup><BookSubject Code="SCC" Type="Primary">Chemistry</BookSubject><BookSubject Code="C11020" Type="Secondary" Priority="1">Spectroscopy/Spectrometry</BookSubject><BookSubject Code="P31090" Type="Secondary" Priority="2">Spectroscopy and Microscopy</BookSubject><BookSubject Code="P24009" Type="Secondary" Priority="3">Atomic, Molecular, Optical and Plasma Physics</BookSubject><BookSubject Code="C11006" Type="Secondary" Priority="4">Analytical Chemistry</BookSubject><SubjectCollection Code="SUCO11644">Chemistry and Materials Science</SubjectCollection></BookSubjectGroup></BookInfo><BookHeader><AuthorGroup><Author AffiliationIDS="Aff1"><AuthorName DisplayOrder="Western"><GivenName>Ray</GivenName><GivenName>F.</GivenName><FamilyName>Egerton</FamilyName></AuthorName></Author><Affiliation ID="Aff1"><OrgName>University of Alberta</OrgName><OrgAddress><City>Edmonton</City><State>Alberta</State><Country>Canada</Country></OrgAddress></Affiliation></AuthorGroup></BookHeader><Chapter Language="En" ID="Chap3"><ChapterInfo Language="En" ChapterType="OriginalPaper" NumberingStyle="ChapterOnly" TocLevels="0" OutputMedium="All" ContainsESM="No"><ChapterID>3</ChapterID><ChapterNumber>3</ChapterNumber><ChapterDOI>10.1007/978-1-4615-6887-2_3</ChapterDOI><ChapterSequenceNumber>3</ChapterSequenceNumber><ChapterTitle Language="En">Electron Scattering Theory</ChapterTitle><ChapterFirstPage>129</ChapterFirstPage><ChapterLastPage>228</ChapterLastPage><ChapterCopyright><CopyrightHolderName>Plenum Press, New York</CopyrightHolderName><CopyrightYear>1986</CopyrightYear></ChapterCopyright><ChapterHistory><RegistrationDate><Year>2012</Year><Month>4</Month><Day>21</Day></RegistrationDate></ChapterHistory><ChapterGrants Type="Regular"><MetadataGrant Grant="OpenAccess"></MetadataGrant><AbstractGrant Grant="OpenAccess"></AbstractGrant><BodyPDFGrant Grant="Restricted"></BodyPDFGrant><BodyHTMLGrant Grant="Restricted"></BodyHTMLGrant><BibliographyGrant Grant="Restricted"></BibliographyGrant><ESMGrant Grant="Restricted"></ESMGrant></ChapterGrants><ChapterContext><BookID>978-1-4615-6887-2</BookID><BookTitle>Electron Energy-Loss Spectroscopy in the Electron Microscope</BookTitle></ChapterContext></ChapterInfo><ChapterHeader><AuthorGroup><Author AffiliationIDS="Aff2"><AuthorName DisplayOrder="Western"><GivenName>Ray</GivenName><GivenName>F.</GivenName><FamilyName>Egerton</FamilyName></AuthorName></Author><Affiliation ID="Aff2"><OrgName>University of Alberta</OrgName><OrgAddress><City>Edmonton</City><State>Alberta</State><Country>Canada</Country></OrgAddress></Affiliation></AuthorGroup><Abstract Language="En" ID="Abs1" OutputMedium="Online"><Heading>Abstract</Heading><Para>It is convenient to divide the scattering of fast electrons into elastic and inelastic components. An experimentalist can distinguish between the two on an empirical basis, the term “elastic” being taken to mean that the energy loss to the sample is less than some experimental resolution limit Such a criterion results in electron scattering by phonon excitation being classified as elastic (or quasielastic) if measurements have been made using an electron microscope, where the energy resolution is usually not better than 1 eV.</Para></Abstract></ChapterHeader><NoBody></NoBody></Chapter></Book></Publisher></istex:document></istex:metadataXml><mods version="3.6"><titleInfo lang="en"><title>Electron Scattering Theory</title></titleInfo><titleInfo type="alternative" contentType="CDATA"><title>Electron Scattering Theory</title></titleInfo><name type="personal"><namePart type="given">Ray</namePart><namePart type="given">F.</namePart><namePart type="family">Egerton</namePart><affiliation>University of Alberta, Edmonton, Alberta, Canada</affiliation><role><roleTerm type="text">author</roleTerm></role></name><typeOfResource>text</typeOfResource><genre type="chapter" displayLabel="chapter" authority="ISTEX" authorityURI="https://content-type.data.istex.fr" valueURI="https://content-type.data.istex.fr/ark:/67375/XTP-CGT4WMJM-6"></genre><originInfo><publisher>Springer US</publisher><place><placeTerm type="text">Boston, MA</placeTerm></place><dateIssued encoding="w3cdtf">1986</dateIssued><copyrightDate encoding="w3cdtf">1986</copyrightDate></originInfo><language><languageTerm type="code" authority="rfc3066">en</languageTerm><languageTerm type="code" authority="iso639-2b">eng</languageTerm></language><abstract lang="en">Abstract: It is convenient to divide the scattering of fast electrons into elastic and inelastic components. An experimentalist can distinguish between the two on an empirical basis, the term “elastic” being taken to mean that the energy loss to the sample is less than some experimental resolution limit Such a criterion results in electron scattering by phonon excitation being classified as elastic (or quasielastic) if measurements have been made using an electron microscope, where the energy resolution is usually not better than 1 eV.</abstract><relatedItem type="host"><titleInfo><title>Electron Energy-Loss Spectroscopy in the Electron Microscope</title></titleInfo><name type="personal"><namePart type="given">Ray</namePart><namePart type="given">F.</namePart><namePart type="family">Egerton</namePart><affiliation>University of Alberta, Edmonton, Alberta, Canada</affiliation></name><genre type="book" authority="ISTEX" authorityURI="https://publication-type.data.istex.fr" valueURI="https://publication-type.data.istex.fr/ark:/67375/JMC-5WTPMB5N-F">book</genre><originInfo><publisher>Springer</publisher><copyrightDate encoding="w3cdtf">1995</copyrightDate><issuance>monographic</issuance></originInfo><subject><genre>Book-Subject-Collection</genre><topic authority="SpringerSubjectCodes" authorityURI="SUCO11644">Chemistry and Materials Science</topic></subject><subject><genre>Book-Subject-Group</genre><topic authority="SpringerSubjectCodes" authorityURI="SCC">Chemistry</topic><topic authority="SpringerSubjectCodes" authorityURI="C11020">Spectroscopy/Spectrometry</topic><topic authority="SpringerSubjectCodes" authorityURI="P31090">Spectroscopy and Microscopy</topic><topic authority="SpringerSubjectCodes" authorityURI="P24009">Atomic, Molecular, Optical and Plasma Physics</topic><topic authority="SpringerSubjectCodes" authorityURI="C11006">Analytical Chemistry</topic></subject><identifier type="DOI">10.1007/978-1-4615-6887-2</identifier><identifier type="ISBN">978-1-4615-6889-6</identifier><identifier type="eISBN">978-1-4615-6887-2</identifier><identifier type="BookTitleID">120031</identifier><identifier type="BookID">978-1-4615-6887-2</identifier><identifier type="BookChapterCount">5</identifier><part><date>1995</date><detail type="chapter"><number>3</number><caption>chapter</caption></detail><extent unit="pages"><start>129</start><end>228</end></extent></part><recordInfo><recordOrigin>Springer-Verlag US, 1995</recordOrigin></recordInfo></relatedItem><identifier type="istex">BC1254598CB170C086CB71C1C6B594212ECF341D</identifier><identifier type="ark">ark:/67375/HCB-V13SH8PR-S</identifier><identifier type="DOI">10.1007/978-1-4615-6887-2_3</identifier><identifier type="ChapterID">3</identifier><identifier type="ChapterID">Chap3</identifier><accessCondition type="use and reproduction" contentType="copyright">Springer-Verlag US, 1986</accessCondition><recordInfo><recordContentSource authority="ISTEX" authorityURI="https://loaded-corpus.data.istex.fr" valueURI="https://loaded-corpus.data.istex.fr/ark:/67375/XBH-RLRX46XW-4">springer</recordContentSource><recordOrigin>Plenum Press, New York, 1986</recordOrigin></recordInfo></mods><json:item><extension>json</extension><original>false</original><mimetype>application/json</mimetype><uri>https://api.istex.fr/ark:/67375/HCB-V13SH8PR-S/record.json</uri></json:item></metadata><annexes><json:item><extension>xml</extension><original>true</original><mimetype>application/xml</mimetype><uri>https://api.istex.fr/ark:/67375/HCB-V13SH8PR-S/annexes.xml</uri></json:item></annexes><serie></serie></istex></record>Pour manipuler ce document sous Unix (Dilib)
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