Distribution of the Scattering Intensity. General Aspects
Identifieur interne : 001847 ( Istex/Corpus ); précédent : 001846; suivant : 001848Distribution of the Scattering Intensity. General Aspects
Auteurs : Mikhail A. KrivoglazSource :
Abstract
Abstract: X-ray and neutron diffraction techniques occupy a prominent position among various methods for studying imperfections in crystals. Their main advantages are explained by the fact that the characteristic wavelengths of X-rays and thermal neutrons are comparable with the interatomic distances. For instance, the wavelength of the X-rays corresponding to the K α doublet of copper is 1.54 Å, in silver it is 0.56 Å and in tungsten 0.21 Å. The mean energy of thermal neutrons at 300 K is 0.026 eV corresponding to a wavelength of 1.8 Å. When radiation with such a short wavelength is scattered, the resulting interference pattern is related to the details of the arrangement of atoms in the crystal at distance of the interatomic spacing. Therefore analysis of the pattern allows us to study the violations of the crystal perfection on this scale and determine atomic displacements of the order of 0.1 Å. When necessary, we can study crystal inhomogeneities on a considerably larger scale (up to 102 – 103 Å) by using small-angle scattering in the vicinities of the reciprocal lattice points, or cold neutrons with large wavelengths.
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DOI: 10.1007/978-3-642-74291-0_1
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General Aspects</title><author><name sortKey="Krivoglaz, Mikhail A" sort="Krivoglaz, Mikhail A" uniqKey="Krivoglaz M" first="Mikhail A." last="Krivoglaz">Mikhail A. Krivoglaz</name></author></analytic><monogr></monogr></biblStruct></sourceDesc></fileDesc><profileDesc><textClass></textClass></profileDesc></teiHeader><front><div type="abstract" xml:lang="en">Abstract: X-ray and neutron diffraction techniques occupy a prominent position among various methods for studying imperfections in crystals. Their main advantages are explained by the fact that the characteristic wavelengths of X-rays and thermal neutrons are comparable with the interatomic distances. For instance, the wavelength of the X-rays corresponding to the K α doublet of copper is 1.54 Å, in silver it is 0.56 Å and in tungsten 0.21 Å. The mean energy of thermal neutrons at 300 K is 0.026 eV corresponding to a wavelength of 1.8 Å. When radiation with such a short wavelength is scattered, the resulting interference pattern is related to the details of the arrangement of atoms in the crystal at distance of the interatomic spacing. Therefore analysis of the pattern allows us to study the violations of the crystal perfection on this scale and determine atomic displacements of the order of 0.1 Å. When necessary, we can study crystal inhomogeneities on a considerably larger scale (up to 102 – 103 Å) by using small-angle scattering in the vicinities of the reciprocal lattice points, or cold neutrons with large wavelengths.</div></front></TEI><istex><corpusName>springer-ebooks</corpusName><editor><json:item><name>Prof. V. G. Baryakhtar</name><affiliations><json:string>Institute of Metal Physics, Ukrainian Academy of Sciences, pr. Vernadskogo 36, 252680, Kiev, Ukraine</json:string></affiliations></json:item><json:item><name>Prof. M. A. 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Their main advantages are explained by the fact that the characteristic wavelengths of X-rays and thermal neutrons are comparable with the interatomic distances. For instance, the wavelength of the X-rays corresponding to the <hi rend="italic">K</hi><hi rend="subscript">α</hi> doublet of copper is 1.54 Å, in silver it is 0.56 Å and in tungsten 0.21 Å. The mean energy of thermal neutrons at 300 K is 0.026 eV corresponding to a wavelength of 1.8 Å. When radiation with such a short wavelength is scattered, the resulting interference pattern is related to the details of the arrangement of atoms in the crystal at distance of the interatomic spacing. Therefore analysis of the pattern allows us to study the violations of the crystal perfection on this scale and determine atomic displacements of the order of 0.1 Å. When necessary, we can study crystal inhomogeneities on a considerably larger scale (up to 10<hi rend="superscript">2</hi> – 10<hi rend="superscript">3</hi> Å) by using small-angle scattering in the vicinities of the reciprocal lattice points, or cold neutrons with large wavelengths.</p></abstract><textClass ana="subject"><keywords scheme="book-subject-collection"><list><label>SUCO11651</label><item><term>Physics and Astronomy</term></item></list></keywords></textClass><textClass ana="subject"><keywords scheme="book-subject"><list><label>P</label><item><term type="Primary">Physics</term></item><label>P25056</label><item><term type="Secondary" subtype="priority-1">Crystallography</term></item><label>P31060</label><item><term type="Secondary" subtype="priority-2">Optics, Optoelectronics, Plasmonics and Optical Devices</term></item><label>T24027</label><item><term type="Secondary" subtype="priority-3">Electronics and Microelectronics, Instrumentation</term></item></list></keywords></textClass><langUsage><language ident="EN"></language></langUsage></profileDesc></teiHeader></istex:fulltextTEI><json:item><extension>txt</extension><original>false</original><mimetype>text/plain</mimetype><uri>https://api.istex.fr/ark:/67375/HCB-LB7PJ55Z-W/fulltext.txt</uri></json:item></fulltext><metadata><istex:metadataXml wicri:clean="corpus springer-ebooks not found" wicri:toSee="no header"><istex:xmlDeclaration>version="1.0" encoding="UTF-8"</istex:xmlDeclaration><istex:docType PUBLIC="-//Springer-Verlag//DTD A++ V2.4//EN" URI="http://devel.springer.de/A++/V2.4/DTD/A++V2.4.dtd" name="istex:docType"></istex:docType><istex:document><Publisher><PublisherInfo><PublisherName>Springer Berlin Heidelberg</PublisherName><PublisherLocation>Berlin, Heidelberg</PublisherLocation></PublisherInfo><Book Language="En"><BookInfo BookProductType="Monograph" ContainsESM="No" Language="En" MediaType="eBook" NumberingStyle="ChapterOnly" OutputMedium="All" TocLevels="0"><BookID>978-3-642-74291-0</BookID><BookTitle>X-Ray and Neutron Diffraction in Nonideal Crystals</BookTitle><BookDOI>10.1007/978-3-642-74291-0</BookDOI><BookTitleID>21765</BookTitleID><BookPrintISBN>978-3-642-74293-4</BookPrintISBN><BookElectronicISBN>978-3-642-74291-0</BookElectronicISBN><BookChapterCount>5</BookChapterCount><BookCopyright><CopyrightHolderName>Springer-Verlag Berlin Heidelberg</CopyrightHolderName><CopyrightYear>1996</CopyrightYear></BookCopyright><BookSubjectGroup><BookSubject Code="P" Type="Primary">Physics</BookSubject><BookSubject Code="P25056" Priority="1" Type="Secondary">Crystallography</BookSubject><BookSubject Code="P31060" Priority="2" Type="Secondary">Optics, Optoelectronics, Plasmonics and Optical Devices</BookSubject><BookSubject Code="T24027" Priority="3" Type="Secondary">Electronics and Microelectronics, Instrumentation</BookSubject><SubjectCollection Code="SUCO11651">Physics and Astronomy</SubjectCollection></BookSubjectGroup></BookInfo><BookHeader><AuthorGroup><Author><AuthorName DisplayOrder="Western"><Prefix>Professor Dr.</Prefix><GivenName>Mikhail</GivenName><GivenName>A.</GivenName><FamilyName>Krivoglaz</FamilyName></AuthorName></Author></AuthorGroup><EditorGroup><Editor AffiliationIDS="Aff1"><EditorName DisplayOrder="Western"><Prefix>Prof.</Prefix><GivenName>V.</GivenName><GivenName>G.</GivenName><FamilyName>Baryakhtar</FamilyName></EditorName></Editor><Editor AffiliationIDS="Aff1"><EditorName DisplayOrder="Western"><Prefix>Prof.</Prefix><GivenName>M.</GivenName><GivenName>A.</GivenName><FamilyName>Ivanov</FamilyName></EditorName></Editor><Editor AffiliationIDS="Aff2"><EditorName DisplayOrder="Western"><Prefix>Prof.</Prefix><GivenName>S.</GivenName><GivenName>C.</GivenName><FamilyName>Moss</FamilyName></EditorName></Editor><Editor AffiliationIDS="Aff3"><EditorName DisplayOrder="Western"><Prefix>Prof.</Prefix><GivenName>J.</GivenName><FamilyName>Peisl</FamilyName></EditorName></Editor><Affiliation ID="Aff1"><OrgDivision>Institute of Metal Physics</OrgDivision><OrgName>Ukrainian Academy of Sciences</OrgName><OrgAddress><Street>pr. Vernadskogo 36</Street><Postcode>252680</Postcode><City>Kiev</City><Country>Ukraine</Country></OrgAddress></Affiliation><Affiliation ID="Aff2"><OrgDivision>Department of Physics</OrgDivision><OrgName>University of Houston</OrgName><OrgAddress><Postcode>77204-5506</Postcode><City>Houston</City><State>Texas</State><Country>USA</Country></OrgAddress></Affiliation><Affiliation ID="Aff3"><OrgDivision>Sektion Physik</OrgDivision><OrgName>Ludwig-Maximilians-Universität München</OrgName><OrgAddress><Street>Geschwister-Scholl-Platz 1</Street><Postcode>D-80539</Postcode><City>München</City><Country>Germany</Country></OrgAddress></Affiliation></EditorGroup></BookHeader><Chapter ID="Chap1" Language="En"><ChapterInfo ChapterType="OriginalPaper" ContainsESM="No" Language="En" NumberingStyle="ChapterOnly" OutputMedium="All" TocLevels="0"><ChapterID>1</ChapterID><ChapterNumber>1</ChapterNumber><ChapterDOI>10.1007/978-3-642-74291-0_1</ChapterDOI><ChapterSequenceNumber>1</ChapterSequenceNumber><ChapterTitle Language="En">Distribution of the Scattering Intensity. General Aspects</ChapterTitle><ChapterFirstPage>1</ChapterFirstPage><ChapterLastPage>73</ChapterLastPage><ChapterCopyright><CopyrightHolderName>Springer-Verlag Berlin Heidelberg</CopyrightHolderName><CopyrightYear>1996</CopyrightYear></ChapterCopyright><ChapterHistory><RegistrationDate><Year>2011</Year><Month>11</Month><Day>29</Day></RegistrationDate></ChapterHistory><ChapterGrants Type="Regular"><MetadataGrant Grant="OpenAccess"></MetadataGrant><AbstractGrant Grant="OpenAccess"></AbstractGrant><BodyPDFGrant Grant="Restricted"></BodyPDFGrant><BodyHTMLGrant Grant="Restricted"></BodyHTMLGrant><BibliographyGrant Grant="Restricted"></BibliographyGrant><ESMGrant Grant="Restricted"></ESMGrant></ChapterGrants><ChapterContext><BookID>978-3-642-74291-0</BookID><BookTitle>X-Ray and Neutron Diffraction in Nonideal Crystals</BookTitle></ChapterContext></ChapterInfo><ChapterHeader><AuthorGroup><Author><AuthorName DisplayOrder="Western"><Prefix>Professor Dr.</Prefix><GivenName>Mikhail</GivenName><GivenName>A.</GivenName><FamilyName>Krivoglaz</FamilyName></AuthorName></Author></AuthorGroup><Abstract ID="Abs1" Language="En" OutputMedium="Online"><Heading>Abstract</Heading><Para>X-ray and neutron diffraction techniques occupy a prominent position among various methods for studying imperfections in crystals. Their main advantages are explained by the fact that the characteristic wavelengths of X-rays and thermal neutrons are comparable with the interatomic distances. For instance, the wavelength of the X-rays corresponding to the <Emphasis Type="Italic">K</Emphasis><Subscript>α</Subscript> doublet of copper is 1.54 Å, in silver it is 0.56 Å and in tungsten 0.21 Å. The mean energy of thermal neutrons at 300 K is 0.026 eV corresponding to a wavelength of 1.8 Å. When radiation with such a short wavelength is scattered, the resulting interference pattern is related to the details of the arrangement of atoms in the crystal at distance of the interatomic spacing. Therefore analysis of the pattern allows us to study the violations of the crystal perfection on this scale and determine atomic displacements of the order of 0.1 Å. When necessary, we can study crystal inhomogeneities on a considerably larger scale (up to 10<Superscript>2</Superscript> – 10<Superscript>3</Superscript> Å) by using small-angle scattering in the vicinities of the reciprocal lattice points, or cold neutrons with large wavelengths.</Para></Abstract></ChapterHeader><NoBody></NoBody></Chapter></Book></Publisher></istex:document></istex:metadataXml><mods version="3.6"><titleInfo lang="en"><title>Distribution of the Scattering Intensity. General Aspects</title></titleInfo><titleInfo type="alternative" contentType="CDATA"><title>Distribution of the Scattering Intensity. General Aspects</title></titleInfo><name type="personal"><namePart type="termsOfAddress">Professor Dr.</namePart><namePart type="given">Mikhail</namePart><namePart type="given">A.</namePart><namePart type="family">Krivoglaz</namePart><role><roleTerm type="text">author</roleTerm></role></name><name type="personal"><namePart type="termsOfAddress">Prof.</namePart><namePart type="given">V.</namePart><namePart type="given">G.</namePart><namePart type="family">Baryakhtar</namePart><affiliation>Institute of Metal Physics, Ukrainian Academy of Sciences, pr. Vernadskogo 36, 252680, Kiev, Ukraine</affiliation><role><roleTerm type="text">editor</roleTerm></role></name><name type="personal"><namePart type="termsOfAddress">Prof.</namePart><namePart type="given">M.</namePart><namePart type="given">A.</namePart><namePart type="family">Ivanov</namePart><affiliation>Institute of Metal Physics, Ukrainian Academy of Sciences, pr. Vernadskogo 36, 252680, Kiev, Ukraine</affiliation><role><roleTerm type="text">editor</roleTerm></role></name><name type="personal"><namePart type="termsOfAddress">Prof.</namePart><namePart type="given">S.</namePart><namePart type="given">C.</namePart><namePart type="family">Moss</namePart><affiliation>Department of Physics, University of Houston, 77204-5506, Houston, Texas, USA</affiliation><role><roleTerm type="text">editor</roleTerm></role></name><name type="personal"><namePart type="termsOfAddress">Prof.</namePart><namePart type="given">J.</namePart><namePart type="family">Peisl</namePart><affiliation>Sektion Physik, Ludwig-Maximilians-Universität München, Geschwister-Scholl-Platz 1, D-80539, München, Germany</affiliation><role><roleTerm type="text">editor</roleTerm></role></name><typeOfResource>text</typeOfResource><genre type="chapter" displayLabel="chapter" authority="ISTEX" authorityURI="https://content-type.data.istex.fr" valueURI="https://content-type.data.istex.fr/ark:/67375/XTP-CGT4WMJM-6"></genre><originInfo><publisher>Springer Berlin Heidelberg</publisher><place><placeTerm type="text">Berlin, Heidelberg</placeTerm></place><dateIssued encoding="w3cdtf">1996</dateIssued><copyrightDate encoding="w3cdtf">1996</copyrightDate></originInfo><language><languageTerm type="code" authority="rfc3066">en</languageTerm><languageTerm type="code" authority="iso639-2b">eng</languageTerm></language><abstract lang="en">Abstract: X-ray and neutron diffraction techniques occupy a prominent position among various methods for studying imperfections in crystals. Their main advantages are explained by the fact that the characteristic wavelengths of X-rays and thermal neutrons are comparable with the interatomic distances. For instance, the wavelength of the X-rays corresponding to the K α doublet of copper is 1.54 Å, in silver it is 0.56 Å and in tungsten 0.21 Å. The mean energy of thermal neutrons at 300 K is 0.026 eV corresponding to a wavelength of 1.8 Å. When radiation with such a short wavelength is scattered, the resulting interference pattern is related to the details of the arrangement of atoms in the crystal at distance of the interatomic spacing. Therefore analysis of the pattern allows us to study the violations of the crystal perfection on this scale and determine atomic displacements of the order of 0.1 Å. When necessary, we can study crystal inhomogeneities on a considerably larger scale (up to 102 – 103 Å) by using small-angle scattering in the vicinities of the reciprocal lattice points, or cold neutrons with large wavelengths.</abstract><relatedItem type="host"><titleInfo><title>X-Ray and Neutron Diffraction in Nonideal Crystals</title></titleInfo><name type="personal"><namePart type="termsOfAddress">Prof.</namePart><namePart type="given">V.</namePart><namePart type="given">G.</namePart><namePart type="family">Baryakhtar</namePart><affiliation>Institute of Metal Physics, Ukrainian Academy of Sciences, pr. Vernadskogo 36, 252680, Kiev, Ukraine</affiliation><role><roleTerm type="text">editor</roleTerm></role></name><name type="personal"><namePart type="termsOfAddress">Prof.</namePart><namePart type="given">M.</namePart><namePart type="given">A.</namePart><namePart type="family">Ivanov</namePart><affiliation>Institute of Metal Physics, Ukrainian Academy of Sciences, pr. Vernadskogo 36, 252680, Kiev, Ukraine</affiliation><role><roleTerm type="text">editor</roleTerm></role></name><name type="personal"><namePart type="termsOfAddress">Prof.</namePart><namePart type="given">S.</namePart><namePart type="given">C.</namePart><namePart type="family">Moss</namePart><affiliation>Department of Physics, University of Houston, 77204-5506, Houston, Texas, USA</affiliation><role><roleTerm type="text">editor</roleTerm></role></name><name type="personal"><namePart type="termsOfAddress">Prof.</namePart><namePart type="given">J.</namePart><namePart type="family">Peisl</namePart><affiliation>Sektion Physik, Ludwig-Maximilians-Universität München, Geschwister-Scholl-Platz 1, D-80539, München, Germany</affiliation><role><roleTerm type="text">editor</roleTerm></role></name><name type="personal"><namePart type="termsOfAddress">Professor Dr.</namePart><namePart type="given">Mikhail</namePart><namePart type="given">A.</namePart><namePart type="family">Krivoglaz</namePart></name><genre type="book" authority="ISTEX" authorityURI="https://publication-type.data.istex.fr" valueURI="https://publication-type.data.istex.fr/ark:/67375/JMC-5WTPMB5N-F">book</genre><originInfo><publisher>Springer</publisher><copyrightDate encoding="w3cdtf">1996</copyrightDate><issuance>monographic</issuance></originInfo><subject><genre>Book-Subject-Collection</genre><topic authority="SpringerSubjectCodes" authorityURI="SUCO11651">Physics and Astronomy</topic></subject><subject><genre>Book-Subject-Group</genre><topic authority="SpringerSubjectCodes" authorityURI="P">Physics</topic><topic authority="SpringerSubjectCodes" authorityURI="P25056">Crystallography</topic><topic authority="SpringerSubjectCodes" authorityURI="P31060">Optics, Optoelectronics, Plasmonics and Optical Devices</topic><topic authority="SpringerSubjectCodes" authorityURI="T24027">Electronics and Microelectronics, Instrumentation</topic></subject><identifier type="DOI">10.1007/978-3-642-74291-0</identifier><identifier type="ISBN">978-3-642-74293-4</identifier><identifier type="eISBN">978-3-642-74291-0</identifier><identifier type="BookTitleID">21765</identifier><identifier type="BookID">978-3-642-74291-0</identifier><identifier type="BookChapterCount">5</identifier><part><date>1996</date><detail type="chapter"><number>1</number><caption>chapter</caption></detail><extent unit="pages"><start>1</start><end>73</end></extent></part><recordInfo><recordOrigin>Springer-Verlag Berlin Heidelberg, 1996</recordOrigin></recordInfo></relatedItem><identifier type="istex">40BD0EE7199B84A034EDCAB92ABC86F089027F63</identifier><identifier type="ark">ark:/67375/HCB-LB7PJ55Z-W</identifier><identifier type="DOI">10.1007/978-3-642-74291-0_1</identifier><identifier type="ChapterID">1</identifier><identifier type="ChapterID">Chap1</identifier><accessCondition type="use and reproduction" contentType="copyright">Springer-Verlag Berlin Heidelberg, 1996</accessCondition><recordInfo><recordContentSource authority="ISTEX" authorityURI="https://loaded-corpus.data.istex.fr" valueURI="https://loaded-corpus.data.istex.fr/ark:/67375/XBH-RLRX46XW-4">springer</recordContentSource><recordOrigin>Springer-Verlag Berlin Heidelberg, 1996</recordOrigin></recordInfo></mods><json:item><extension>json</extension><original>false</original><mimetype>application/json</mimetype><uri>https://api.istex.fr/ark:/67375/HCB-LB7PJ55Z-W/record.json</uri></json:item></metadata><annexes><json:item><extension>txt</extension><original>true</original><mimetype>text/plain</mimetype><uri>https://api.istex.fr/ark:/67375/HCB-LB7PJ55Z-W/annexes.txt</uri></json:item></annexes><serie></serie></istex></record>Pour manipuler ce document sous Unix (Dilib)
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