Studies of nanomagnetism using synchrotron-based x-ray photoemission electron microscopy (X-PEEM)
Identifieur interne : 000011 ( Main/Exploration ); précédent : 000010; suivant : 000012Studies of nanomagnetism using synchrotron-based x-ray photoemission electron microscopy (X-PEEM)
Auteurs : X M Cheng [États-Unis] ; D J Keavney [États-Unis]Source :
- Reports on Progress in Physics [ 0034-4885 ] ; 2012.
Abstract
As interest in magnetic devices has increased over the last 20 years, research into nanomagnetism has experienced a corresponding growth. Device applications from magnetic storage to magnetic logic have compelled interest in the influence of geometry and finite size on magnetism and magnetic excitations, in particular where the smallest dimensions reach the important magnetic interaction length scales. The dynamical behavior of nanoscale magnets is an especially important subset of research, as these phenomena are both critical for device physics and profoundly influenced by finite size. At the same time, nanoscale systems offer unique geometries to promote and study model systems, such as magnetic vortices, leading to new fundamental insights into magnetization dynamics. A wide array of experimental and computational techniques have been applied to these problems. Among these, imaging techniques that provide real-space information on the magnetic order are particularly useful. X-ray microscopy offers several advantages over scanning probe or optical techniques, such as high spatial resolution, element specificity and the possibility for high time resolution. Here, we review recent contributions using static and time-resolved x-ray photoemission electron microscopy to nanomagnetism research.
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DOI: 10.1088/0034-4885/75/2/026501
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