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Monte-Carlo-Based Automatic Design of Chromeless Phase Shift Mask

Identifieur interne : 000156 ( PascalFrancis/Curation ); précédent : 000155; suivant : 000157

Monte-Carlo-Based Automatic Design of Chromeless Phase Shift Mask

Auteurs : Jai-Cheol Lee [Corée du Sud] ; Yong-Ho Oh [Corée du Sud] ; Sungwoo Lim [Corée du Sud] ; Chun Soo Go [Corée du Sud] ; Sung Su Roh [Corée du Sud]

Source :

RBID : Pascal:04-0165991

Descripteurs français

English descriptors

Abstract

The optical proximity effect correction algorithm (OPERA) program based on the Monte-Carlo method has been used for optical proximity correction (OPC) and phase shift mask (PSM) generation for low-NA projection lithography systems. To apply OPERA to high-NA systems, we adopted an imaging model based on a vector diffraction theory. Also, we developed a new convergence algorithm that does not reduce the degree of freedom and prevents the convergence process from falling into a local minimum. The new program, OPERA-V, is at least 10 times faster than the previous version. OPERA-V not only improves the computation time of traditional OPC, but can also be used as an automatic design tool for creating chromeless PSMs. © 2004 The Japan Society of Applied Physics
pA  
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A08 01  1  ENG  @1 Monte-Carlo-Based Automatic Design of Chromeless Phase Shift Mask
A11 01  1    @1 LEE (Jai-Cheol)
A11 02  1    @1 OH (Yong-Ho)
A11 03  1    @1 LIM (Sungwoo)
A11 04  1    @1 GO (Chun Soo)
A11 05  1    @1 ROH (Sung Su)
A14 01      @1 School of Electrical Engineering and Information Technology, Wonkwang University, Shinyongdong 344-2, Iksan, Jeonbuk 570-749, Korea @Z 1 aut. @Z 2 aut. @Z 5 aut.
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A47 01  1    @0 04-0165991
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A64 01  1    @0 Japanese Journal of Applied Physics, Part I : Regular papers, short notes & review papers
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C01 01    ENG  @0 The optical proximity effect correction algorithm (OPERA) program based on the Monte-Carlo method has been used for optical proximity correction (OPC) and phase shift mask (PSM) generation for low-NA projection lithography systems. To apply OPERA to high-NA systems, we adopted an imaging model based on a vector diffraction theory. Also, we developed a new convergence algorithm that does not reduce the degree of freedom and prevents the convergence process from falling into a local minimum. The new program, OPERA-V, is at least 10 times faster than the previous version. OPERA-V not only improves the computation time of traditional OPC, but can also be used as an automatic design tool for creating chromeless PSMs. © 2004 The Japan Society of Applied Physics
C02 01  X    @0 001D03F17
C03 01  3  FRE  @0 8540H @2 PAC @4 INC
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C03 02  3  ENG  @0 Theoretical study
C03 03  3  FRE  @0 Méthode mesure
C03 03  3  ENG  @0 Measuring methods
C03 04  3  FRE  @0 Photolithographie
C03 04  3  ENG  @0 Photolithography
C03 05  3  FRE  @0 Masque déphasage
C03 05  3  ENG  @0 Phase shifting masks
C03 06  3  FRE  @0 Effet proximité(lithographie)
C03 06  3  ENG  @0 Proximity effect (lithography)
C03 07  3  FRE  @0 Méthode Monte Carlo
C03 07  3  ENG  @0 Monte Carlo methods
C03 08  3  FRE  @0 Convergence méthode numérique
C03 08  3  ENG  @0 Convergence of numerical methods
C03 09  3  FRE  @0 Technologie circuit intégré
C03 09  3  ENG  @0 Integrated circuit technology
C03 10  3  FRE  @0 Technique conception optique
C03 10  3  ENG  @0 Optical design techniques
C03 11  3  FRE  @0 Automatisation conception électronique
C03 11  3  ENG  @0 Electronic design automation
N21       @1 110
N47 01  1    @0 0414M000325

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