A Method for Measuring the Thickness of Thin Bent Foils in Transmission Electron Microscopy
Identifieur interne : 000762 ( Istex/Corpus ); précédent : 000761; suivant : 000763A Method for Measuring the Thickness of Thin Bent Foils in Transmission Electron Microscopy
Auteurs : P. Delavignette ; R. W. VookSource :
- physica status solidi (b) [ 0370-1972 ] ; 1963.
Abstract
A new method for measuring the thickness of thin monocrystalline foils in the range of 1000 Å is presented. This method is based on the observation of Kossel‐Möllenstedt fringes in transmission electron microscopy. It differs from the classical Kossel‐Möllenstedt method in electron diffraction by the fact that no divergent beam is needed. However, the foil should be bent and the method is based on the measurement of this radius of curvature.
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DOI: 10.1002/pssb.19630030406
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However, the foil should be bent and the method is based on the measurement of this radius of curvature.</p></abstract><abstract type="main" xml:lang="de"><p>Es wird eine neue Methode zur Dickenbestimmung dünner monokristalliner Folien im Bereich von etwa 1000 A angegeben. Diese Methode beruht auf der Beobachtung von Kossel‐Möllenstedt‐Streifen bei elektronenmikroskopischen Durchstrahlungsversuchen und unterscheidet sich von der klassischen Kossel‐Möllenstedt‐Methode der Elektronenbeugung dadurch, daß kein divergentes Strahlenbündel benötigt wird. Die Folie muß jedoch gebogen werden und die Methode beruht auf der Messung des Krümmungsradius.</p></abstract></abstractGroup></contentMeta><noteGroup><note xml:id="fn1"><p>C.E.N. Mol, Belgium</p></note></noteGroup></header></component></istex:document></istex:metadataXml><mods version="3.6"><titleInfo lang="en"><title>A Method for Measuring the Thickness of Thin Bent Foils in Transmission Electron Microscopy</title></titleInfo><titleInfo type="alternative" contentType="CDATA" lang="en"><title>A Method for Measuring the Thickness of Thin Bent Foils in Transmission Electron Microscopy</title></titleInfo><name type="personal"><namePart type="given">P.</namePart><namePart type="family">Delavignette</namePart><affiliation>The Franklin Institute Laboratories, Philadelphia, Pennsylvania</affiliation><description>C.E.N. Mol, Belgium</description><role><roleTerm type="text">author</roleTerm></role></name><name type="personal"><namePart type="given">R. 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This method is based on the observation of Kossel‐Möllenstedt fringes in transmission electron microscopy. It differs from the classical Kossel‐Möllenstedt method in electron diffraction by the fact that no divergent beam is needed. However, the foil should be bent and the method is based on the measurement of this radius of curvature.</abstract><abstract lang="de">Es wird eine neue Methode zur Dickenbestimmung dünner monokristalliner Folien im Bereich von etwa 1000 A angegeben. Diese Methode beruht auf der Beobachtung von Kossel‐Möllenstedt‐Streifen bei elektronenmikroskopischen Durchstrahlungsversuchen und unterscheidet sich von der klassischen Kossel‐Möllenstedt‐Methode der Elektronenbeugung dadurch, daß kein divergentes Strahlenbündel benötigt wird. Die Folie muß jedoch gebogen werden und die Methode beruht auf der Messung des Krümmungsradius.</abstract><relatedItem type="host"><titleInfo><title>physica status solidi (b)</title></titleInfo><titleInfo type="abbreviated"><title>phys. stat. sol. 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