Development of nanomanipulator using a high-speed atomic force microscope coupled with a haptic device.
Identifieur interne : 001C79 ( Main/Merge ); précédent : 001C78; suivant : 001C80Development of nanomanipulator using a high-speed atomic force microscope coupled with a haptic device.
Auteurs : F. Iwata [Japon] ; Y. Ohashi ; I. Ishisaki ; L M Picco ; T. UshikiSource :
- Ultramicroscopy [ 1879-2723 ] ; 2013.
English descriptors
- KwdEn :
- MESH :
- instrumentation : Microscopy, Atomic Force, Nanotechnology.
- methods : Microscopy, Atomic Force, Nanotechnology.
- Feedback, Humans.
Abstract
The atomic force microscope (AFM) has been widely used for surface fabrication and manipulation. However, nanomanipulation using a conventional AFM is inefficient because of the sequential nature of the scan-manipulation scan cycle, which makes it difficult for the operator to observe the region of interest and perform the manipulation simultaneously. In this paper, a nanomanipulation technique using a high-speed atomic force microscope (HS-AFM) is described. During manipulation using the AFM probe, the operation is periodically interrupted for a fraction of a second for high-speed imaging that allows the topographical image of the manipulated surface to be periodically updated. With the use of high-speed imaging, the interrupting time for imaging can be greatly reduced, and as a result, the operator almost does not notice the blink time of the interruption for imaging during the manipulation. This creates a more intuitive interface with greater feedback and finesse to the operator. Nanofabrication under real-time monitoring was performed to demonstrate the utility of this arrangement for real-time nanomanipulation of sample surfaces under ambient conditions. Furthermore, the HS-AFM is coupled with a haptic device for the human interface, enabling the operator to move the HS-AFM probe to any position on the surface while feeling the response from the surface during the manipulation.
DOI: 10.1016/j.ultramic.2013.06.014
PubMed: 23933597
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Electronic address: tmfiwat@ipc.shizuoka.ac.jp.</nlm:affiliation><country xml:lang="fr">Japon</country><wicri:regionArea>Faculty of Engineering, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8561, Japan; Research Institute of Electronics, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8011</wicri:regionArea><wicri:noRegion>Hamamatsu 432-8011</wicri:noRegion></affiliation></author><author><name sortKey="Ohashi, Y" sort="Ohashi, Y" uniqKey="Ohashi Y" first="Y" last="Ohashi">Y. Ohashi</name></author><author><name sortKey="Ishisaki, I" sort="Ishisaki, I" uniqKey="Ishisaki I" first="I" last="Ishisaki">I. Ishisaki</name></author><author><name sortKey="Picco, L M" sort="Picco, L M" uniqKey="Picco L" first="L M" last="Picco">L M Picco</name></author><author><name sortKey="Ushiki, T" sort="Ushiki, T" uniqKey="Ushiki T" first="T" last="Ushiki">T. Ushiki</name></author></titleStmt><publicationStmt><idno type="wicri:source">PubMed</idno><date when="2013">2013</date><idno type="RBID">pubmed:23933597</idno><idno type="pmid">23933597</idno><idno type="doi">10.1016/j.ultramic.2013.06.014</idno><idno type="wicri:Area/PubMed/Corpus">000900</idno><idno type="wicri:Area/PubMed/Curation">000900</idno><idno type="wicri:Area/PubMed/Checkpoint">000938</idno><idno type="wicri:Area/Ncbi/Merge">002861</idno><idno type="wicri:Area/Ncbi/Curation">002861</idno><idno type="wicri:Area/Ncbi/Checkpoint">002861</idno><idno type="wicri:Area/Main/Merge">001C79</idno></publicationStmt><sourceDesc><biblStruct><analytic><title xml:lang="en">Development of nanomanipulator using a high-speed atomic force microscope coupled with a haptic device.</title><author><name sortKey="Iwata, F" sort="Iwata, F" uniqKey="Iwata F" first="F" last="Iwata">F. Iwata</name><affiliation wicri:level="1"><nlm:affiliation>Faculty of Engineering, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8561, Japan; Research Institute of Electronics, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8011, Japan. Electronic address: tmfiwat@ipc.shizuoka.ac.jp.</nlm:affiliation><country xml:lang="fr">Japon</country><wicri:regionArea>Faculty of Engineering, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8561, Japan; Research Institute of Electronics, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8011</wicri:regionArea><wicri:noRegion>Hamamatsu 432-8011</wicri:noRegion></affiliation></author><author><name sortKey="Ohashi, Y" sort="Ohashi, Y" uniqKey="Ohashi Y" first="Y" last="Ohashi">Y. Ohashi</name></author><author><name sortKey="Ishisaki, I" sort="Ishisaki, I" uniqKey="Ishisaki I" first="I" last="Ishisaki">I. Ishisaki</name></author><author><name sortKey="Picco, L M" sort="Picco, L M" uniqKey="Picco L" first="L M" last="Picco">L M Picco</name></author><author><name sortKey="Ushiki, T" sort="Ushiki, T" uniqKey="Ushiki T" first="T" last="Ushiki">T. Ushiki</name></author></analytic><series><title level="j">Ultramicroscopy</title><idno type="eISSN">1879-2723</idno><imprint><date when="2013" type="published">2013</date></imprint></series></biblStruct></sourceDesc></fileDesc><profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Feedback</term><term>Humans</term><term>Microscopy, Atomic Force (instrumentation)</term><term>Microscopy, Atomic Force (methods)</term><term>Nanotechnology (instrumentation)</term><term>Nanotechnology (methods)</term></keywords><keywords scheme="MESH" qualifier="instrumentation" xml:lang="en"><term>Microscopy, Atomic Force</term><term>Nanotechnology</term></keywords><keywords scheme="MESH" qualifier="methods" xml:lang="en"><term>Microscopy, Atomic Force</term><term>Nanotechnology</term></keywords><keywords scheme="MESH" xml:lang="en"><term>Feedback</term><term>Humans</term></keywords></textClass></profileDesc></teiHeader><front><div type="abstract" xml:lang="en">The atomic force microscope (AFM) has been widely used for surface fabrication and manipulation. However, nanomanipulation using a conventional AFM is inefficient because of the sequential nature of the scan-manipulation scan cycle, which makes it difficult for the operator to observe the region of interest and perform the manipulation simultaneously. In this paper, a nanomanipulation technique using a high-speed atomic force microscope (HS-AFM) is described. During manipulation using the AFM probe, the operation is periodically interrupted for a fraction of a second for high-speed imaging that allows the topographical image of the manipulated surface to be periodically updated. With the use of high-speed imaging, the interrupting time for imaging can be greatly reduced, and as a result, the operator almost does not notice the blink time of the interruption for imaging during the manipulation. This creates a more intuitive interface with greater feedback and finesse to the operator. Nanofabrication under real-time monitoring was performed to demonstrate the utility of this arrangement for real-time nanomanipulation of sample surfaces under ambient conditions. Furthermore, the HS-AFM is coupled with a haptic device for the human interface, enabling the operator to move the HS-AFM probe to any position on the surface while feeling the response from the surface during the manipulation.</div></front></TEI></record>Pour manipuler ce document sous Unix (Dilib)
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