Development of nanomanipulator using a high-speed atomic force microscope coupled with a haptic device.
Identifieur interne : 001C79 ( Main/Merge ); précédent : 001C78; suivant : 001C80Development of nanomanipulator using a high-speed atomic force microscope coupled with a haptic device.
Auteurs : F. Iwata [Japon] ; Y. Ohashi ; I. Ishisaki ; L M Picco ; T. UshikiSource :
- Ultramicroscopy [ 1879-2723 ] ; 2013.
English descriptors
- KwdEn :
- MESH :
- instrumentation : Microscopy, Atomic Force, Nanotechnology.
- methods : Microscopy, Atomic Force, Nanotechnology.
- Feedback, Humans.
Abstract
The atomic force microscope (AFM) has been widely used for surface fabrication and manipulation. However, nanomanipulation using a conventional AFM is inefficient because of the sequential nature of the scan-manipulation scan cycle, which makes it difficult for the operator to observe the region of interest and perform the manipulation simultaneously. In this paper, a nanomanipulation technique using a high-speed atomic force microscope (HS-AFM) is described. During manipulation using the AFM probe, the operation is periodically interrupted for a fraction of a second for high-speed imaging that allows the topographical image of the manipulated surface to be periodically updated. With the use of high-speed imaging, the interrupting time for imaging can be greatly reduced, and as a result, the operator almost does not notice the blink time of the interruption for imaging during the manipulation. This creates a more intuitive interface with greater feedback and finesse to the operator. Nanofabrication under real-time monitoring was performed to demonstrate the utility of this arrangement for real-time nanomanipulation of sample surfaces under ambient conditions. Furthermore, the HS-AFM is coupled with a haptic device for the human interface, enabling the operator to move the HS-AFM probe to any position on the surface while feeling the response from the surface during the manipulation.
DOI: 10.1016/j.ultramic.2013.06.014
PubMed: 23933597
Links toward previous steps (curation, corpus...)
- to stream PubMed, to step Corpus: 000900
- to stream PubMed, to step Curation: 000900
- to stream PubMed, to step Checkpoint: 000938
- to stream Ncbi, to step Merge: 002861
- to stream Ncbi, to step Curation: 002861
- to stream Ncbi, to step Checkpoint: 002861
Links to Exploration step
pubmed:23933597Le document en format XML
<record><TEI><teiHeader><fileDesc><titleStmt><title xml:lang="en">Development of nanomanipulator using a high-speed atomic force microscope coupled with a haptic device.</title>
<author><name sortKey="Iwata, F" sort="Iwata, F" uniqKey="Iwata F" first="F" last="Iwata">F. Iwata</name>
<affiliation wicri:level="1"><nlm:affiliation>Faculty of Engineering, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8561, Japan; Research Institute of Electronics, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8011, Japan. Electronic address: tmfiwat@ipc.shizuoka.ac.jp.</nlm:affiliation>
<country xml:lang="fr">Japon</country>
<wicri:regionArea>Faculty of Engineering, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8561, Japan; Research Institute of Electronics, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8011</wicri:regionArea>
<wicri:noRegion>Hamamatsu 432-8011</wicri:noRegion>
</affiliation>
</author>
<author><name sortKey="Ohashi, Y" sort="Ohashi, Y" uniqKey="Ohashi Y" first="Y" last="Ohashi">Y. Ohashi</name>
</author>
<author><name sortKey="Ishisaki, I" sort="Ishisaki, I" uniqKey="Ishisaki I" first="I" last="Ishisaki">I. Ishisaki</name>
</author>
<author><name sortKey="Picco, L M" sort="Picco, L M" uniqKey="Picco L" first="L M" last="Picco">L M Picco</name>
</author>
<author><name sortKey="Ushiki, T" sort="Ushiki, T" uniqKey="Ushiki T" first="T" last="Ushiki">T. Ushiki</name>
</author>
</titleStmt>
<publicationStmt><idno type="wicri:source">PubMed</idno>
<date when="2013">2013</date>
<idno type="RBID">pubmed:23933597</idno>
<idno type="pmid">23933597</idno>
<idno type="doi">10.1016/j.ultramic.2013.06.014</idno>
<idno type="wicri:Area/PubMed/Corpus">000900</idno>
<idno type="wicri:Area/PubMed/Curation">000900</idno>
<idno type="wicri:Area/PubMed/Checkpoint">000938</idno>
<idno type="wicri:Area/Ncbi/Merge">002861</idno>
<idno type="wicri:Area/Ncbi/Curation">002861</idno>
<idno type="wicri:Area/Ncbi/Checkpoint">002861</idno>
<idno type="wicri:Area/Main/Merge">001C79</idno>
</publicationStmt>
<sourceDesc><biblStruct><analytic><title xml:lang="en">Development of nanomanipulator using a high-speed atomic force microscope coupled with a haptic device.</title>
<author><name sortKey="Iwata, F" sort="Iwata, F" uniqKey="Iwata F" first="F" last="Iwata">F. Iwata</name>
<affiliation wicri:level="1"><nlm:affiliation>Faculty of Engineering, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8561, Japan; Research Institute of Electronics, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8011, Japan. Electronic address: tmfiwat@ipc.shizuoka.ac.jp.</nlm:affiliation>
<country xml:lang="fr">Japon</country>
<wicri:regionArea>Faculty of Engineering, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8561, Japan; Research Institute of Electronics, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8011</wicri:regionArea>
<wicri:noRegion>Hamamatsu 432-8011</wicri:noRegion>
</affiliation>
</author>
<author><name sortKey="Ohashi, Y" sort="Ohashi, Y" uniqKey="Ohashi Y" first="Y" last="Ohashi">Y. Ohashi</name>
</author>
<author><name sortKey="Ishisaki, I" sort="Ishisaki, I" uniqKey="Ishisaki I" first="I" last="Ishisaki">I. Ishisaki</name>
</author>
<author><name sortKey="Picco, L M" sort="Picco, L M" uniqKey="Picco L" first="L M" last="Picco">L M Picco</name>
</author>
<author><name sortKey="Ushiki, T" sort="Ushiki, T" uniqKey="Ushiki T" first="T" last="Ushiki">T. Ushiki</name>
</author>
</analytic>
<series><title level="j">Ultramicroscopy</title>
<idno type="eISSN">1879-2723</idno>
<imprint><date when="2013" type="published">2013</date>
</imprint>
</series>
</biblStruct>
</sourceDesc>
</fileDesc>
<profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Feedback</term>
<term>Humans</term>
<term>Microscopy, Atomic Force (instrumentation)</term>
<term>Microscopy, Atomic Force (methods)</term>
<term>Nanotechnology (instrumentation)</term>
<term>Nanotechnology (methods)</term>
</keywords>
<keywords scheme="MESH" qualifier="instrumentation" xml:lang="en"><term>Microscopy, Atomic Force</term>
<term>Nanotechnology</term>
</keywords>
<keywords scheme="MESH" qualifier="methods" xml:lang="en"><term>Microscopy, Atomic Force</term>
<term>Nanotechnology</term>
</keywords>
<keywords scheme="MESH" xml:lang="en"><term>Feedback</term>
<term>Humans</term>
</keywords>
</textClass>
</profileDesc>
</teiHeader>
<front><div type="abstract" xml:lang="en">The atomic force microscope (AFM) has been widely used for surface fabrication and manipulation. However, nanomanipulation using a conventional AFM is inefficient because of the sequential nature of the scan-manipulation scan cycle, which makes it difficult for the operator to observe the region of interest and perform the manipulation simultaneously. In this paper, a nanomanipulation technique using a high-speed atomic force microscope (HS-AFM) is described. During manipulation using the AFM probe, the operation is periodically interrupted for a fraction of a second for high-speed imaging that allows the topographical image of the manipulated surface to be periodically updated. With the use of high-speed imaging, the interrupting time for imaging can be greatly reduced, and as a result, the operator almost does not notice the blink time of the interruption for imaging during the manipulation. This creates a more intuitive interface with greater feedback and finesse to the operator. Nanofabrication under real-time monitoring was performed to demonstrate the utility of this arrangement for real-time nanomanipulation of sample surfaces under ambient conditions. Furthermore, the HS-AFM is coupled with a haptic device for the human interface, enabling the operator to move the HS-AFM probe to any position on the surface while feeling the response from the surface during the manipulation.</div>
</front>
</TEI>
</record>
Pour manipuler ce document sous Unix (Dilib)
EXPLOR_STEP=$WICRI_ROOT/Ticri/CIDE/explor/HapticV1/Data/Main/Merge
HfdSelect -h $EXPLOR_STEP/biblio.hfd -nk 001C79 | SxmlIndent | more
Ou
HfdSelect -h $EXPLOR_AREA/Data/Main/Merge/biblio.hfd -nk 001C79 | SxmlIndent | more
Pour mettre un lien sur cette page dans le réseau Wicri
{{Explor lien |wiki= Ticri/CIDE |area= HapticV1 |flux= Main |étape= Merge |type= RBID |clé= pubmed:23933597 |texte= Development of nanomanipulator using a high-speed atomic force microscope coupled with a haptic device. }}
Pour générer des pages wiki
HfdIndexSelect -h $EXPLOR_AREA/Data/Main/Merge/RBID.i -Sk "pubmed:23933597" \ | HfdSelect -Kh $EXPLOR_AREA/Data/Main/Merge/biblio.hfd \ | NlmPubMed2Wicri -a HapticV1
![]() | This area was generated with Dilib version V0.6.23. | ![]() |