2	Speckle interferometry
2	Speckles
2	Rough surfaces
2	Optical method
2	Microelectromechanical device
2	Measuring methods
2	Light interferometry

Freq.	Weight	Association
2	2	Speckle interferometry - Speckles
2	2	Rough surfaces - Speckles
2	2	Rough surfaces - Speckle interferometry
2	2	Optical method - Speckles
2	2	Optical method - Speckle interferometry
2	2	Optical method - Rough surfaces
2	2	Microelectromechanical device - Speckles
2	2	Microelectromechanical device - Speckle interferometry
2	2	Microelectromechanical device - Rough surfaces
2	2	Microelectromechanical device - Optical method
2	2	Measuring methods - Speckles
2	2	Measuring methods - Speckle interferometry
2	2	Measuring methods - Rough surfaces
2	2	Measuring methods - Optical method
2	2	Measuring methods - Microelectromechanical device
2	2	Light interferometry - Speckles
2	2	Light interferometry - Speckle interferometry
2	2	Light interferometry - Rough surfaces
2	2	Light interferometry - Optical method
2	2	Light interferometry - Microelectromechanical device
2	2	Light interferometry - Measuring methods

Documents par ordre de pertinence

000177 (2009)	L. X. Yang [États-Unis] ; M. Schuth [Allemagne] ; D. Thomas [États-Unis] ; Y. H. Wang [États-Unis, République populaire de Chine] ; F. Voesing [Allemagne]	Stroboscopic digital speckle pattern interferometry for vibration analysis of microsystem
000215 (2008)	Michael Schuth [Allemagne] ; Frank Vossing [Allemagne] ; LIANXIANG YANG [États-Unis]	Digital Laser Microferoscope for NDT

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