Characterization of micromachining processes during KrF excimer laser ablation of TiNi shape memory alloy thin sheets and films
Identifieur interne : 005504 ( PascalFrancis/Corpus ); précédent : 005503; suivant : 005505Characterization of micromachining processes during KrF excimer laser ablation of TiNi shape memory alloy thin sheets and films
Auteurs : S. T. Davies ; E. C. Harvey ; H. Jin ; J. P. Hayes ; M. K. Ghantasala ; I. Roch ; L. BuchaillotSource :
- Smart materials and structures [ 0964-1726 ] ; 2002.
Descripteurs français
- Pascal (Inist)
English descriptors
- KwdEn :
Abstract
We investigate excimer laser ablation of TiNi shape memory alloy thin sheets and films using an image projection system as a tool for micromachining and patterning. Characteristics of material removal by KrF excimer laser induced ablation at 248 nm and the dependence of material removal rates on laser parameters such as fluence and pulse frequency are explored. Fluences at the workpiece using a 10 × projection lens were up to 2.5 J cm-2 with pulse repetition rates up to 100 Hz. Conventional chrome-on-quartz masks were used for pattern transfer. Material removal mechanisms and rates of material removal were investigated for thin film samples and thin sheet samples having thicknesses of 3 and 150 μm respectively.
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Format Inist (serveur)
NO : | PASCAL 03-0039964 INIST |
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ET : | Characterization of micromachining processes during KrF excimer laser ablation of TiNi shape memory alloy thin sheets and films |
AU : | DAVIES (S. T.); HARVEY (E. C.); JIN (H.); HAYES (J. P.); GHANTASALA (M. K.); ROCH (I.); BUCHAILLOT (L.); KISH (L. B.) |
AF : | Centre for Nanotechnology and Microengineering, School of Engineering, University of Warwick/Coventry CV4 7AL/Royaume-Uni (1 aut.); Industrial Research Institute Swinburne (IRIS), Swinburne University of Technology, 533-545 Burwood Road/Hawthorn, Melbourne 3122/Australie (2 aut., 3 aut., 4 aut., 5 aut.); Institut d'Electronique et de Microelectronique du Nord, Cite Scientifique, Av H Poincare, B P 69/59652 Villeneuve d'Ascq/France (6 aut., 7 aut.); Department of Electrical Engineering, Texas A&M University/College Station TX 77843-3128/Etats-Unis (1 aut.) |
DT : | Publication en série; Niveau analytique |
SO : | Smart materials and structures; ISSN 0964-1726; Royaume-Uni; Da. 2002; Vol. 11; No. 5; Pp. 708-714; Bibl. 18 ref. |
LA : | Anglais |
EA : | We investigate excimer laser ablation of TiNi shape memory alloy thin sheets and films using an image projection system as a tool for micromachining and patterning. Characteristics of material removal by KrF excimer laser induced ablation at 248 nm and the dependence of material removal rates on laser parameters such as fluence and pulse frequency are explored. Fluences at the workpiece using a 10 × projection lens were up to 2.5 J cm-2 with pulse repetition rates up to 100 Hz. Conventional chrome-on-quartz masks were used for pattern transfer. Material removal mechanisms and rates of material removal were investigated for thin film samples and thin sheet samples having thicknesses of 3 and 150 μm respectively. |
CC : | 001B00G10C; 001B80A65 |
FD : | Dispositif microélectromécanique; Microusinage; Gravure faisceau laser; Méthode ablation laser; Laser excimère; Feuille métallique; Couche mince; Alliage mémoire forme; Alliage base titane; Nickel alliage; Etude expérimentale; 0710C; 8165C |
ED : | Microelectromechanical device; Micromachining; Laser beam etching; Laser ablation technique; Excimer lasers; Metal foil; Thin films; Shape memory alloy; Titanium base alloys; Nickel alloys; Experimental study |
SD : | Dispositivo microelectromecánico; Hoja metálica; Aleación memoria forma |
LO : | INIST-26248.354000109358240130 |
ID : | 03-0039964 |
Links to Exploration step
Pascal:03-0039964Le document en format XML
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<front><div type="abstract" xml:lang="en">We investigate excimer laser ablation of TiNi shape memory alloy thin sheets and films using an image projection system as a tool for micromachining and patterning. Characteristics of material removal by KrF excimer laser induced ablation at 248 nm and the dependence of material removal rates on laser parameters such as fluence and pulse frequency are explored. Fluences at the workpiece using a 10 × projection lens were up to 2.5 J cm<sup>-2</sup>
with pulse repetition rates up to 100 Hz. Conventional chrome-on-quartz masks were used for pattern transfer. Material removal mechanisms and rates of material removal were investigated for thin film samples and thin sheet samples having thicknesses of 3 and 150 μm respectively.</div>
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<ET>Characterization of micromachining processes during KrF excimer laser ablation of TiNi shape memory alloy thin sheets and films</ET>
<AU>DAVIES (S. T.); HARVEY (E. C.); JIN (H.); HAYES (J. P.); GHANTASALA (M. K.); ROCH (I.); BUCHAILLOT (L.); KISH (L. B.)</AU>
<AF>Centre for Nanotechnology and Microengineering, School of Engineering, University of Warwick/Coventry CV4 7AL/Royaume-Uni (1 aut.); Industrial Research Institute Swinburne (IRIS), Swinburne University of Technology, 533-545 Burwood Road/Hawthorn, Melbourne 3122/Australie (2 aut., 3 aut., 4 aut., 5 aut.); Institut d'Electronique et de Microelectronique du Nord, Cite Scientifique, Av H Poincare, B P 69/59652 Villeneuve d'Ascq/France (6 aut., 7 aut.); Department of Electrical Engineering, Texas A&M University/College Station TX 77843-3128/Etats-Unis (1 aut.)</AF>
<DT>Publication en série; Niveau analytique</DT>
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<LA>Anglais</LA>
<EA>We investigate excimer laser ablation of TiNi shape memory alloy thin sheets and films using an image projection system as a tool for micromachining and patterning. Characteristics of material removal by KrF excimer laser induced ablation at 248 nm and the dependence of material removal rates on laser parameters such as fluence and pulse frequency are explored. Fluences at the workpiece using a 10 × projection lens were up to 2.5 J cm<sup>-2</sup>
with pulse repetition rates up to 100 Hz. Conventional chrome-on-quartz masks were used for pattern transfer. Material removal mechanisms and rates of material removal were investigated for thin film samples and thin sheet samples having thicknesses of 3 and 150 μm respectively.</EA>
<CC>001B00G10C; 001B80A65</CC>
<FD>Dispositif microélectromécanique; Microusinage; Gravure faisceau laser; Méthode ablation laser; Laser excimère; Feuille métallique; Couche mince; Alliage mémoire forme; Alliage base titane; Nickel alliage; Etude expérimentale; 0710C; 8165C</FD>
<ED>Microelectromechanical device; Micromachining; Laser beam etching; Laser ablation technique; Excimer lasers; Metal foil; Thin films; Shape memory alloy; Titanium base alloys; Nickel alloys; Experimental study</ED>
<SD>Dispositivo microelectromecánico; Hoja metálica; Aleación memoria forma</SD>
<LO>INIST-26248.354000109358240130</LO>
<ID>03-0039964</ID>
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