Réflexion RX And NotSebastian Schöder

List of bibliographic references

Number of relevant bibliographic references: 4.

Ident.	Authors (with country if any)	Title
002D03	B. M. Law [États-Unis] ; M. D. Brown [États-Unis] ; L. Marchand [États-Unis] ; L. B. Lurio [États-Unis] ; W. A. Hamilton [Australie] ; I. Kuzmenko [États-Unis] ; T. Gog [États-Unis] ; S. Satija [États-Unis] ; E. Watkins [États-Unis] ; J. Majewski [États-Unis]	Adsorption at liquid interfaces : A comparison of multiple experimental techniques
003F51	A. Fonseca [Portugal] ; N. A. Sobolev [Portugal] ; J. P. Leitao [Portugal] ; E. Alves [Portugal] ; M. C. Carmo [Portugal] ; N. D. Zakharov [Allemagne] ; P. Werner [Allemagne] ; A. A. Tonkikh [Russie] ; G. E. Cirlin [Russie]	Influence of defects on the optical and structural properties of Ge dots embedded in an Si/Ge superlattice
004214	M. J. Henderson [Australie] ; A. Gibaud [France] ; J.-F. Bardeau [France] ; J. W. White [Australie]	An X-ray reflectivity study of evaporation-induced self-assembled titania-based films
004762	M. J. Henderson [Australie] ; A. Gibaud [France] ; J.-F. Bardeau [France] ; A. R. Rennie [Suède] ; J. W. White [Australie]	A zirconium oxide film self-assembled at the air-water interface

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