Réflexion RX And NotE. Watkins

List of bibliographic references

Number of relevant bibliographic references: 4.

Ident.	Authors (with country if any)	Title
003062	Markus Mezger [Allemagne] ; Heiko Schröder [Allemagne] ; Harald Reichert [Allemagne] ; Sebastian Schramm [Allemagne] ; John S. Okasinski [Allemagne] ; Sebastian Schöder [Allemagne, France] ; Veijo Honkim Ki [France] ; Moshe Deutsch [Israël] ; Benjamin M. Ocko [États-Unis] ; John Ralston [Australie] ; Michael Rohwerder [Allemagne] ; Martin Stratmann [Allemagne] ; Helmut Dosch [Allemagne]	Molecular Layering of Fluorinated Ionic Liquids at a Charged Sapphire (0001) Surface
003F51	A. Fonseca [Portugal] ; N. A. Sobolev [Portugal] ; J. P. Leitao [Portugal] ; E. Alves [Portugal] ; M. C. Carmo [Portugal] ; N. D. Zakharov [Allemagne] ; P. Werner [Allemagne] ; A. A. Tonkikh [Russie] ; G. E. Cirlin [Russie]	Influence of defects on the optical and structural properties of Ge dots embedded in an Si/Ge superlattice
004214	M. J. Henderson [Australie] ; A. Gibaud [France] ; J.-F. Bardeau [France] ; J. W. White [Australie]	An X-ray reflectivity study of evaporation-induced self-assembled titania-based films
004762	M. J. Henderson [Australie] ; A. Gibaud [France] ; J.-F. Bardeau [France] ; A. R. Rennie [Suède] ; J. W. White [Australie]	A zirconium oxide film self-assembled at the air-water interface

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