0304-3975 < 0304-3991 < 0304-4203

Facettes :

List of bibliographic references indexed by 0304-3991

Number of relevant bibliographic references: 16.

Ident.	Authors (with country if any)	Title
000364 (1999)	O. L. Krivanek [États-Unis] ; N. Dellby [États-Unis] ; A. R. Lupini [Royaume-Uni]	Towards sub-Å electron beams
000B43 (1989)	M. Isaacson [États-Unis] ; C. Colliex [France]	Summary and conclusions
000B48 (1989)	O. L. Krivanek [États-Unis]	Spectroscopy techniques
000B49 (1989)	H. Shuman [États-Unis]	Spectral processing for EELS, auger and X-ray spectroscopies
000B51 (1989)	C. J. Humphreys [Royaume-Uni]	Radiation effects
000B53 (1989)	Nestor J. Zaluzec [États-Unis]	Processing and quantification of X-ray Energy-Dispersive Spectra in the Analytical Electron Microscope
000B54 (1989)	J. N. Chapman [Royaume-Uni]	Problems in X-ray emission spectroscopy
000B55 (1989)	B. G. Lowe [Royaume-Uni]	Problems associated with EDX detectors from a manufacturer's point of view
000B60 (1989)	J. A. Eades [États-Unis]	One-and two-dimensional electron detectors
000B62 (1989)	R. W. Devenish [Royaume-Uni] ; D. J. Eaglesham [Royaume-Uni] ; D. M. Maher [Royaume-Uni] ; C. J. Humphreys [Royaume-Uni]	Nanolithography using field emission and conventional thermionic electron sources
000B68 (1989)	Peter Rez [États-Unis]	Inner-shell spectroscopy: An atomic view
000B70 (1989)	C. Colliex [France] ; J. L. Maurice [France] ; D. Ugarte [France]	Frontiers of analytical electron microscopy with special reference to cluster and interface problems
000B72 (1989)	A. J. Craven [Royaume-Uni]	Evaluation of errors and accuracy of quantitative measurements
000D83 (1986)	Peter W. Hawkes [France]	Steady progress, special issues, familiar proceedings
000E48 (1985)	J. W. Steeds [Royaume-Uni] ; D. M. Bird [Royaume-Uni] ; D. J. Eaglesham [Royaume-Uni] ; S. Mckernan [Royaume-Uni] ; R. Vincent [Royaume-Uni] ; R. L. Withers [Royaume-Uni]	Study of modulated structures by transmission electron microscopy
000F34 (1983)	J. Vanhellemont [Belgique] ; H. Bender [Belgique] ; C. Claeys [Belgique] ; J. Van Landuyt [Belgique] ; G. Declerck [Belgique] ; S. Amelinckx [Belgique] ; R. Van Overstraeten [Belgique]	A novel sample preparation technique for cross-sectional tem investigation of integrated circuits

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