resistivity < resolution < resolve

Facettes :

List of bibliographic references

Number of relevant bibliographic references: 63.
[0-20] [0 - 20][0 - 50][20-40]

Ident.	Authors (with country if any)	Title
000396 (2001)	Jan G. P. W. Clevers [Pays-Bas] ; Steven M. De Jong [Pays-Bas] ; Gerrit F. Epema [Pays-Bas] ; Freek Van Der Meer [Pays-Bas] ; Wim H. Bakker [Pays-Bas] ; Andrew K. Skidmore [Pays-Bas] ; Elisabeth A. Addink [États-Unis]	MERIS and the red-edge position
000403 (2007)	K. D. Shcherbachev [Russie] ; V. T. Bublik [Russie] ; V. N. Mordkovich [Russie] ; D. M. Pazhin [Russie] ; E. Alves [Portugal] ; N. P. Barradas [Portugal]	Radiation‐induced structural transformations in a silicon layer of SOI
000452 (1993)	David J. Major [Canada] ; Sean M. Mcginn [Canada] ; Terry J. Gillespie [Canada] ; Frédéric Baret [France]	A technique for determination of single leaf reflectance and transmittance in field studies
000494 (1994)	A. O. Jones [Royaume-Uni] ; B. T. Parker [Royaume-Uni] ; P. Clifford [Royaume-Uni] ; N. S. Fore [Royaume-Uni] ; C. Hall [Royaume-Uni] ; W. I. Helsby [Royaume-Uni] ; R. A. Lewis [Royaume-Uni] ; J. Sheldon [Royaume-Uni]	A feasibility study on a multiwire gas proportional counter using a 28 ns delay line
000515 (1997)	F. A. F. Fraga [Portugal] ; M. M. F. R. Fraga [Portugal] ; R. F. Marques [Portugal] ; L. M. S. Margato [Portugal] ; J. R. Gonçalo [Portugal] ; A. J. P. L. Policarpo [Portugal] ; C. W. E. Van Eijk [Pays-Bas] ; R. W. Hollander [Pays-Bas] ; J. Van Der Marel [Pays-Bas]	Performance of microstrip and microgap gas detectors at high pressure
000530 (1994)	C. Monteil [France] ; J. Durand [France] ; R. Berjoan [France] ; B. Cros [France] ; J. P. Martinez [France]	AES and HRTEM study of an a‐SiNx: H/W/WSix/a‐SiNx: H multilayer structure realized by PEVCD
000569 (1992)	F. Baret [France] ; S. Jacquemoud [France] ; G. Guyot [France] ; C. Leprieur [France]	Modeled analysis of the biophysical nature of spectral shifts and comparison with information content of broad bands
000591 (1994)	L. Potez [France] ; A. Loiseau [France]	High-resolution electron microscopy studies of antiphase boundaries in Cu3Au
000619 (1995)	A. San-Miguel [France]	A program for fast classic or dispersive XAS data analysis in a PC
000633 (1995)	V. M Aulchenko [Russie] ; S. E Baru [Russie] ; M. S Dubrovin [Russie] ; V. M Titov [Russie] ; Ju. S Velikzhanin [Russie] ; Ju. V Usov [Russie]	The OD-3 fast one-coordinate X-ray detector
000683 (1993)	G. D. Minakov [Russie] ; Yu. N. Pestov [Russie] ; V. S. Prokopenko [Russie] ; L. I. Shekhtman [Russie]	Performance of gas microstrip chambers on glass with ionic and electronic conductivity
000736 (1987)	A. Hampel ; H. Neuh User	Investigation of slip line growth in F.C.C. Cu alloys with high resolution in time
000747 (1990)	Y. Liu ; S. Xiang ; H. Fan ; D. Tang ; F. Li ; Q. Pan ; N. Uyeda ; Y. Fujiyoshi	Image deconvolution of a single high‐resolution electron micrograph
000752 (1991)	B. Ruth [Allemagne]	Measurement of the chlorophyll fluorescence induction kinetics with a 10 µs time resolution and its application in the forest decline research
000798 (1990)	A. Krej [Tchécoslovaquie]	Gas-puff Z-pinch experiment
000842 (1994)	S. P. Chernenko [Russie] ; G. A. Cheremukhina [Russie] ; O. V. Fateev [Russie] ; L. P. Smykov [Russie] ; S. E. Vasiliev [Russie] ; Yu. V. Zanevsky [Russie] ; D. M. Kheiker [Russie] ; A. N. Popov [Russie]	X-ray detectors for structure investigations constructed at JINR
000845 (1993)	M. D. Steven [Royaume-Uni]	Satellite remote sensing for agricultural management: opportunities and logistic constraints
000853 (1997)	S. E. Baru [Sénégal, Russie] ; V. M. Aulchenko [Russie] ; E. A. Babichev [Russie] ; M. S. Dubrovin [Russie] ; V. R. Groshev [Russie] ; A. G. Khabakhpashev [Russie] ; E. L. Nekhanevich [Russie] ; V. V. Porosev [Russie] ; G. A. Savinov [Russie] ; L. I. Shekhtman [Russie] ; L. Smykov [Russie] ; A. A. Talyshev [Russie] ; V. M. Titov [Russie] ; Yu. G. Ukraintsev [Russie] ; Yu. S. Velikzhanin [Russie] ; Yu. V. Zanevsky [Russie]	X-ray detectors based on multiwire proportional chambers
000858 (1995)	M. Chemloul [France] ; V. Comparat [France]	A high resolution and fast TDC for sensitive position gas-filled detectors
000867 (1989)	B. G. Lowe [Royaume-Uni]	Problems associated with EDX detectors from a manufacturer's point of view
000871 (1992)	V. K. Myalitsin [Allemagne] ; H.-J. Besch [Allemagne] ; H. W. Schenk [Allemagne] ; A. H. Walenta [Allemagne]	A multichannel position sensitive ionization chamber for X-ray intensity monitoring

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