Orientation cristalline And NotA. Reinicker
List of bibliographic references
Number of relevant bibliographic references: 2.| Ident. | Authors (with country if any) | Title |
|---|---|---|
| 000B16 | XUAN LIU [États-Unis] ; Andrew P. Warren [États-Unis] ; Noel T. Nuhfer [États-Unis] ; Anthony D. Rollett [États-Unis] ; Kevin R. Coffey [États-Unis] ; Katayun Barmak [États-Unis] | Comparison of crystal orientation mapping-based and image-based measurement of grain size and grain size distribution in a thin aluminum film |
| 004066 | XUEMING YANG [République populaire de Chine, États-Unis] ; Albert C. To [États-Unis] ; Mesut Kirca [États-Unis] | Thermal conductivity of periodic array of intermolecular junctions of silicon nanowires |
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