Circuit intégré And NotJason Flinn
List of bibliographic references
Number of relevant bibliographic references: 14.| Ident. | Authors (with country if any) | Title |
|---|---|---|
| 000141 | DOOHO CHOI [États-Unis, Corée du Sud] | The electron scattering at grain boundaries in tungsten films |
| 000A62 | Andre B. Reis [États-Unis, Portugal] ; Susana Sargento [Portugal] ; Filipe Neves [Portugal] ; Ozan K. Tonguz [États-Unis] | Deploying Roadside Units in Sparse Vehicular Networks: What Really Works and What Does Not |
| 000B90 | Dylan F. Williams [États-Unis] ; Phillip Corson [États-Unis] ; Jahnavi Sharma [États-Unis] ; Harish Krishnaswamy [États-Unis] ; WEI TAI [États-Unis] ; Zacharias George [États-Unis] ; David S. Ricketts [États-Unis] ; Paul M. Watson [États-Unis] ; Eric Dacquay [Canada] ; Sorin P. Voinigescu [Canada] | Calibrations for Millimeter-Wave Silicon Transistor Characterization |
| 000E81 | YUSHI HU [États-Unis] ; David Perello [États-Unis] ; Minhee Tun [États-Unis] ; Deok-Hwang Kwon [Corée du Sud] ; Miyoung Kim [Corée du Sud] | Variation of switching mechanism in TiO2 thin film resistive random access memory with Ag and graphene electrodes |
| 001724 | Siddharth Garg [Canada] ; Diana Marculescu [États-Unis] | Mitigating the Impact of Process Variation on the Performance of 3-D Integrated Circuits |
| 001E46 | Suk-Bok Lee [États-Unis] ; Starsky Ho Yin Wong [États-Unis] ; Kang-Won Lee [États-Unis] ; SONGWU LU [États-Unis] | Content management in a mobile ad hoc network: beyond opportunistic strategy |
| 001F84 | Dylan F. Williams [États-Unis] ; Phillip Corson [États-Unis] ; Jahnavi Sharma [États-Unis] ; Harish Krishnaswamy [États-Unis] ; WEI TAI [États-Unis] ; Zacharias George [États-Unis] ; David Ricketts [États-Unis] ; Paul Watson [États-Unis] ; Eric Dacquay [Canada] ; Sorin P. Voinigescu [Canada] | Calibration-Kit Design for Millimeter-Wave Silicon Integrated Circuits |
| 002261 | Kai-Chiang Wu [États-Unis] ; Diana Marculescu [États-Unis] | A Low-Cost, Systematic Methodology for Soft Error Robustness of Logic Circuits |
| 002366 | ZHENYU SUN [États-Unis] ; HAI LI [États-Unis] ; YIRAN CHEN [États-Unis] ; XIAOBIN WANG [États-Unis] | Voltage Driven Nondestructive Self-Reference Sensing Scheme of Spin-Transfer Torque Memory |
| 002749 | Siddharth Garg [Canada] ; Diana Marculescu [États-Unis] | System-Level Leakage Variability Mitigation for MPSoC Platforms Using Body-Bias Islands |
| 003629 | Sebastian Herbert [États-Unis] ; Siddharth Garg [Canada] ; Diana Marculescu [États-Unis] | Exploiting Process Variability in Voltage/Frequency Control |
| 003F39 | WEI TAI [États-Unis] ; HONGTAO XU [États-Unis] ; Ashoke Ravi [États-Unis] ; Hasnain Lakdawala [États-Unis] ; Ofir Bochobza-Degani [États-Unis] ; L. Richard Carley [États-Unis] ; Yorgos Palaskas [États-Unis] | A Transformer-Combined 31.5 dBm Outphasing Power Amplifier in 45 nm LP CMOS With Dynamic Power Control for Back-Off Power Efficiency Enhancement |
| 003F81 | Adrian Schupbach [Canada] ; Andrew Baumann [Canada] ; Timothy Roscoe [Canada] ; Simon Peter [Canada] | A Declarative Language Approach to Device Configuration |
| 003F99 | YIRAN CHEN [États-Unis] ; HAI LI [États-Unis] ; XIAOBIN WANG [États-Unis] ; WENZHONG ZHU [États-Unis] ; WEI XU [États-Unis] ; TONG ZHANG [États-Unis] | A 130 nm 1.2 V/3.3 V 16 Kb Spin-Transfer Torque Random Access Memory With Nondestructive Self-Reference Sensing Scheme |
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