Hardware Reliability

Hardware Reliability

Source :

• Lecture Notes in Computer Science [ 0302-9743 ] ; 2008.

English descriptors

• Teeft :
  • Acceleration factors, Access point, Aleatory, Aleatory uncertainty, Atomic proposition, Atomic propositions, Automotive industry, Availability measures, Available information, Base failure rate, Basic event, Basic events, Birnbaum, Birnbaum importance, Birnbaum importance measure, British telecom handbook, Certain faults, Common measures, Component, Component failures, Conditional probability, Constant failure rate, Constant failure rates, Criticality importance measure, Criticality importance measures, Ctmc, Data sources, Dependability, Dependability metrics, Design cycle, Device failure rate, Different components, Different sources, Different types, Different ways, Direct manipulation, Discrete semiconductors, Distribution function, Distribution functions, Effective device temperature, Electrical stress, Electromagnetic interferences, Electronic components, Elicitation, Environmental conditions, Environmental stimuli, Environmental stress screening, Epistemic, Epistemic uncertainty, Error prediction models, Eusgeld, Expert judgement, Exponential distribution, Failure data, Failure density function, Failure rate, Failure rates, Fault, Fault injection, Fault injection techniques, Fault model, Fault tolerance, Fault tree, Fault trees, Fault types, Field data, Functional level, Fuzzy probabilities, Gold unit, Handbook, Hardware, Hardware component, Hardware faults, Hardware reliability, High level description, Higher stress levels, Hybrid approaches, Hybrid tools, Identical components, Implementation details, Importance analysis, Importance measure, Importance measures, Importance value, Imprecise probabilities, Imprecision, Independent events, Indeterminacy, Individual contributions, Injection, Injector, Instantaneous availability, Interval availability, Joint availability, Jtag, Large systems, Last phase, Lifetime data, Limited relevance, Logic level, Logical characterisation, Long period, Manufacturing screens, Many components, Markov, Markov chain, Markov chains, Markov model, Metrics, Mission availability, Model type, Modelling, Modelling process, More detail, Mttf, Mttr, Normal distribution, Other factors, Other hand, Overall availability, Part failure rate, Part reliability, Passive component, Path formula, Path formulas, Permanent faults, Petri, Petri nets, Physical fault injection, Physical model, Physical models, Point availability, Prediction, Prediction models, Probability theory, Rate matrix, Reachability graph, Real faults, Redundancy, Redundancy structure, Redundancy structures, Redundant components, Reliability, Reliability block diagram, Reliability block diagrams, Reliability data, Reliability evidence, Reliability metrics, Reliability modelling, Reliability models, Reliability prediction, Reliability theory, Reliable systems, Renewal density function, Repair events, Repair rate, Repair time, Repairable, Repairable systems, Reward function, Same results, Same time, Second step, Second term, Sect, Sensitivity analysis, Several reasons, Similar components, Simplest case, Simulation, Software, Software simulation, Special case, State formula, State formulas, Stochastic, Stochastic petri nets, Stress screening, Structure formula, Such systems, System failure, System level, System reliability, System reliability modelling, System works, Systematic failures, Telcordia, Test data, Test plans, Time interval, Time point, Time points, Time unit, Time units, Timing aspects, Train conductor, Transient faults, Transistor level, Transportation environment, Uncertain data, Unusual conditions, Useful information, Weibull distribution, Worst case.

Abstract

• https://api.istex.fr/document/1AAEDF6F0B7B0C8C4F574C5F25E5C79AE18CB408/fulltext/pdf

Affiliations:

• Allemagne, Suisse

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