Measurement of Scattering Cross Section with a Spectrophotometer with an Integrating Sphere Detector.
Identifieur interne : 001470 ( Main/Corpus ); précédent : 001469; suivant : 001471Measurement of Scattering Cross Section with a Spectrophotometer with an Integrating Sphere Detector.
Auteurs : A K Gaigalas ; Lili Wang ; V. Karpiak ; Yu-Zhong Zhang ; Steven ChoquetteSource :
- Journal of research of the National Institute of Standards and Technology [ 1044-677X ] ; 2012.
Abstract
A commercial spectrometer with an integrating sphere (IS) detector was used to measure the scattering cross section of microspheres. Analysis of the measurement process showed that two measurements of the absorbance, one with the cuvette placed in the normal spectrometer position, and the second with the cuvette placed inside the IS, provided enough information to separate the contributions from scattering and molecular absorption. Measurements were carried out with microspheres with different diameters. The data was fitted with a model consisting of the difference of two terms. The first term was the Lorenz-Mie (L-M) cross section which modeled the total absorbance due to scattering. The second term was the integral of the L-M differential cross section over the detector acceptance angle. The second term estimated the amount of forward scattered light that entered the detector. A wavelength dependent index of refraction was used in the model. The agreement between the model and the data was good between 300 nm and 800 nm. The fits provided values for the microsphere diameter, the concentration, and the wavelength dependent index of refraction. For wavelengths less than 300 nm, the scattering cross section had significant spectral structure which was inversely related to the molecular absorption. This work addresses the measurement and interpretation of the scattering cross section for wavelengths between 300 nm and 800 nm.
DOI: 10.6028/jres.117.012
PubMed: 26900524
PubMed Central: PMC4553878
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Karpiak</name><affiliation><nlm:affiliation>Life Technologies, 29851 Willow Creek Rd., Eugene, OR 97402.</nlm:affiliation></affiliation></author><author><name sortKey="Zhang, Yu Zhong" sort="Zhang, Yu Zhong" uniqKey="Zhang Y" first="Yu-Zhong" last="Zhang">Yu-Zhong Zhang</name><affiliation><nlm:affiliation>Life Technologies, 29851 Willow Creek Rd., Eugene, OR 97402.</nlm:affiliation></affiliation></author><author><name sortKey="Choquette, Steven" sort="Choquette, Steven" uniqKey="Choquette S" first="Steven" last="Choquette">Steven Choquette</name><affiliation><nlm:affiliation>National Institute of Standards and Technology, Gaithersburg, MD 20899.</nlm:affiliation></affiliation></author></titleStmt><publicationStmt><idno type="wicri:source">PubMed</idno><date when="2012">2012</date><idno type="RBID">pubmed:26900524</idno><idno type="pmid">26900524</idno><idno type="doi">10.6028/jres.117.012</idno><idno type="pmc">PMC4553878</idno><idno type="wicri:Area/Main/Corpus">001470</idno><idno type="wicri:explorRef" wicri:stream="Main" wicri:step="Corpus" wicri:corpus="PubMed">001470</idno></publicationStmt><sourceDesc><biblStruct><analytic><title xml:lang="en">Measurement of Scattering Cross Section with a Spectrophotometer with an Integrating Sphere Detector.</title><author><name sortKey="Gaigalas, A K" sort="Gaigalas, A K" uniqKey="Gaigalas A" first="A K" last="Gaigalas">A K Gaigalas</name><affiliation><nlm:affiliation>National Institute of Standards and Technology, Gaithersburg, MD 20899.</nlm:affiliation></affiliation></author><author><name sortKey="Wang, Lili" sort="Wang, Lili" uniqKey="Wang L" first="Lili" last="Wang">Lili Wang</name><affiliation><nlm:affiliation>National Institute of Standards and Technology, Gaithersburg, MD 20899.</nlm:affiliation></affiliation></author><author><name sortKey="Karpiak, V" sort="Karpiak, V" uniqKey="Karpiak V" first="V" last="Karpiak">V. Karpiak</name><affiliation><nlm:affiliation>Life Technologies, 29851 Willow Creek Rd., Eugene, OR 97402.</nlm:affiliation></affiliation></author><author><name sortKey="Zhang, Yu Zhong" sort="Zhang, Yu Zhong" uniqKey="Zhang Y" first="Yu-Zhong" last="Zhang">Yu-Zhong Zhang</name><affiliation><nlm:affiliation>Life Technologies, 29851 Willow Creek Rd., Eugene, OR 97402.</nlm:affiliation></affiliation></author><author><name sortKey="Choquette, Steven" sort="Choquette, Steven" uniqKey="Choquette S" first="Steven" last="Choquette">Steven Choquette</name><affiliation><nlm:affiliation>National Institute of Standards and Technology, Gaithersburg, MD 20899.</nlm:affiliation></affiliation></author></analytic><series><title level="j">Journal of research of the National Institute of Standards and Technology</title><idno type="ISSN">1044-677X</idno><imprint><date when="2012" type="published">2012</date></imprint></series></biblStruct></sourceDesc></fileDesc><profileDesc><textClass></textClass></profileDesc></teiHeader><front><div type="abstract" xml:lang="en">A commercial spectrometer with an integrating sphere (IS) detector was used to measure the scattering cross section of microspheres. Analysis of the measurement process showed that two measurements of the absorbance, one with the cuvette placed in the normal spectrometer position, and the second with the cuvette placed inside the IS, provided enough information to separate the contributions from scattering and molecular absorption. Measurements were carried out with microspheres with different diameters. The data was fitted with a model consisting of the difference of two terms. The first term was the Lorenz-Mie (L-M) cross section which modeled the total absorbance due to scattering. The second term was the integral of the L-M differential cross section over the detector acceptance angle. The second term estimated the amount of forward scattered light that entered the detector. A wavelength dependent index of refraction was used in the model. The agreement between the model and the data was good between 300 nm and 800 nm. The fits provided values for the microsphere diameter, the concentration, and the wavelength dependent index of refraction. For wavelengths less than 300 nm, the scattering cross section had significant spectral structure which was inversely related to the molecular absorption. This work addresses the measurement and interpretation of the scattering cross section for wavelengths between 300 nm and 800 nm. </div></front></TEI><pubmed><MedlineCitation Status="PubMed-not-MEDLINE" Owner="NLM"><PMID Version="1">26900524</PMID><DateCompleted><Year>2016</Year><Month>02</Month><Day>22</Day></DateCompleted><DateRevised><Year>2019</Year><Month>01</Month><Day>09</Day></DateRevised><Article PubModel="Electronic-eCollection"><Journal><ISSN IssnType="Print">1044-677X</ISSN><JournalIssue CitedMedium="Print"><Volume>117</Volume><PubDate><Year>2012</Year></PubDate></JournalIssue><Title>Journal of research of the National Institute of Standards and Technology</Title><ISOAbbreviation>J Res Natl Inst Stand Technol</ISOAbbreviation></Journal><ArticleTitle>Measurement of Scattering Cross Section with a Spectrophotometer with an Integrating Sphere Detector.</ArticleTitle><Pagination><MedlinePgn>202-15</MedlinePgn></Pagination><ELocationID EIdType="doi" ValidYN="Y">10.6028/jres.117.012</ELocationID><Abstract><AbstractText>A commercial spectrometer with an integrating sphere (IS) detector was used to measure the scattering cross section of microspheres. Analysis of the measurement process showed that two measurements of the absorbance, one with the cuvette placed in the normal spectrometer position, and the second with the cuvette placed inside the IS, provided enough information to separate the contributions from scattering and molecular absorption. Measurements were carried out with microspheres with different diameters. The data was fitted with a model consisting of the difference of two terms. The first term was the Lorenz-Mie (L-M) cross section which modeled the total absorbance due to scattering. The second term was the integral of the L-M differential cross section over the detector acceptance angle. The second term estimated the amount of forward scattered light that entered the detector. A wavelength dependent index of refraction was used in the model. The agreement between the model and the data was good between 300 nm and 800 nm. The fits provided values for the microsphere diameter, the concentration, and the wavelength dependent index of refraction. For wavelengths less than 300 nm, the scattering cross section had significant spectral structure which was inversely related to the molecular absorption. This work addresses the measurement and interpretation of the scattering cross section for wavelengths between 300 nm and 800 nm. </AbstractText></Abstract><AuthorList CompleteYN="Y"><Author ValidYN="Y"><LastName>Gaigalas</LastName><ForeName>A K</ForeName><Initials>AK</Initials><AffiliationInfo><Affiliation>National Institute of Standards and Technology, Gaithersburg, MD 20899.</Affiliation></AffiliationInfo></Author><Author ValidYN="Y"><LastName>Wang</LastName><ForeName>Lili</ForeName><Initials>L</Initials><AffiliationInfo><Affiliation>National Institute of Standards and Technology, Gaithersburg, MD 20899.</Affiliation></AffiliationInfo></Author><Author ValidYN="Y"><LastName>Karpiak</LastName><ForeName>V</ForeName><Initials>V</Initials><AffiliationInfo><Affiliation>Life Technologies, 29851 Willow Creek Rd., Eugene, OR 97402.</Affiliation></AffiliationInfo></Author><Author ValidYN="Y"><LastName>Zhang</LastName><ForeName>Yu-Zhong</ForeName><Initials>YZ</Initials><AffiliationInfo><Affiliation>Life Technologies, 29851 Willow Creek Rd., Eugene, OR 97402.</Affiliation></AffiliationInfo></Author><Author ValidYN="Y"><LastName>Choquette</LastName><ForeName>Steven</ForeName><Initials>S</Initials><AffiliationInfo><Affiliation>National Institute of Standards and Technology, Gaithersburg, MD 20899.</Affiliation></AffiliationInfo></Author></AuthorList><Language>eng</Language><PublicationTypeList><PublicationType UI="D016428">Journal Article</PublicationType></PublicationTypeList><ArticleDate DateType="Electronic"><Year>2012</Year><Month>09</Month><Day>13</Day></ArticleDate></Article><MedlineJournalInfo><Country>United States</Country><MedlineTA>J Res Natl Inst Stand Technol</MedlineTA><NlmUniqueID>8912688</NlmUniqueID><ISSNLinking>1044-677X</ISSNLinking></MedlineJournalInfo><KeywordList Owner="NOTNLM"><Keyword MajorTopicYN="N">Lorenz-Mie scattering</Keyword><Keyword MajorTopicYN="N">integrating sphere detector</Keyword><Keyword MajorTopicYN="N">microspheres</Keyword><Keyword MajorTopicYN="N">scattering</Keyword></KeywordList></MedlineCitation><PubmedData><History><PubMedPubDate PubStatus="accepted"><Year>2012</Year><Month>08</Month><Day>14</Day></PubMedPubDate><PubMedPubDate PubStatus="entrez"><Year>2016</Year><Month>2</Month><Day>23</Day><Hour>6</Hour><Minute>0</Minute></PubMedPubDate><PubMedPubDate PubStatus="pubmed"><Year>2012</Year><Month>1</Month><Day>1</Day><Hour>0</Hour><Minute>0</Minute></PubMedPubDate><PubMedPubDate PubStatus="medline"><Year>2012</Year><Month>1</Month><Day>1</Day><Hour>0</Hour><Minute>1</Minute></PubMedPubDate></History><PublicationStatus>epublish</PublicationStatus><ArticleIdList><ArticleId IdType="pubmed">26900524</ArticleId><ArticleId IdType="doi">10.6028/jres.117.012</ArticleId><ArticleId IdType="pii">jres.117.012</ArticleId><ArticleId IdType="pmc">PMC4553878</ArticleId></ArticleIdList><ReferenceList><Reference><Citation>Phys Med Biol. 2003 Dec 21;48(24):4165-72</Citation><ArticleIdList><ArticleId IdType="pubmed">14727759</ArticleId></ArticleIdList></Reference><Reference><Citation>Appl Opt. 1997 Jun 1;36(16):3785-7</Citation><ArticleIdList><ArticleId IdType="pubmed">18253406</ArticleId></ArticleIdList></Reference><Reference><Citation>Appl Opt. 2000 May 1;39(13):2067-70</Citation><ArticleIdList><ArticleId IdType="pubmed">18345107</ArticleId></ArticleIdList></Reference><Reference><Citation>J Res Natl Inst Stand Technol. 2009 Apr 01;114(2):69-81</Citation><ArticleIdList><ArticleId IdType="pubmed">27504214</ArticleId></ArticleIdList></Reference></ReferenceList></PubmedData></pubmed></record>Pour manipuler ce document sous Unix (Dilib)
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