Size distribution and volume fraction of T(1) phase precipitates from TEM images: Direct measurements and related correction.
Identifieur interne : 002672 ( PubMed/Checkpoint ); précédent : 002671; suivant : 002673Size distribution and volume fraction of T(1) phase precipitates from TEM images: Direct measurements and related correction.
Auteurs : Thomas Dorin [France] ; Patricia Donnadieu [France] ; Jean-Marc Chaix [France] ; Williams Lefebvre [France] ; Frédéric De Geuser [France] ; Alexis Deschamps [France]Source :
- Micron (Oxford, England : 1993) [ 1878-4291 ] ; 2015.
Abstract
Transmission Electron Microscopy (TEM) can be used to measure the size distribution and volume fraction of fine scale precipitates in metallic systems. However, such measurements suffer from a number of artefacts that need to be accounted for, related to the finite thickness of the TEM foil and to the projected observation in two dimensions of the microstructure. We present a correction procedure to describe the 3D distribution of disc-like particles and apply this method to the plate-like T1 precipitates in an Al-Li-Cu alloy in two ageing conditions showing different particle morphologies. The precipitates were imaged in a High-Angular Annular Dark Field Microscope (HAADF-STEM). The corrected size distribution is further used to determine the precipitate volume fraction. Atom probe tomography (APT) is finally utilised as an alternative way to measure the precipitate volume fraction and test the validity of the electron microscopy results.
DOI: 10.1016/j.micron.2015.06.002
PubMed: 26203532
Affiliations:
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Electronic address: thomas.dorin@deakin.edu.au.</nlm:affiliation><country xml:lang="fr">France</country><wicri:regionArea>Univ Grenoble Alpes, SIMAP, F-38000 Grenoble, France; CNRS, SIMAP, F-38000 Grenoble, France; Institute for Frontier Materials, Deakin University, Geelong, Victoria 3217, Australia; Constellium C-Tec, Voreppe, BP 27, 38341 Voreppe, Cedex</wicri:regionArea><wicri:noRegion>Cedex</wicri:noRegion><wicri:noRegion>Cedex</wicri:noRegion></affiliation></author><author><name sortKey="Donnadieu, Patricia" sort="Donnadieu, Patricia" uniqKey="Donnadieu P" first="Patricia" last="Donnadieu">Patricia Donnadieu</name><affiliation wicri:level="1"><nlm:affiliation>Univ Grenoble Alpes, SIMAP, F-38000 Grenoble, France; CNRS, SIMAP, F-38000 Grenoble, France.</nlm:affiliation><country xml:lang="fr">France</country><wicri:regionArea>Univ Grenoble Alpes, SIMAP, F-38000 Grenoble, France; CNRS, SIMAP, F-38000 Grenoble</wicri:regionArea><wicri:noRegion>38000 Grenoble</wicri:noRegion><wicri:noRegion>38000 Grenoble</wicri:noRegion></affiliation></author><author><name sortKey="Chaix, Jean Marc" sort="Chaix, Jean Marc" uniqKey="Chaix J" first="Jean-Marc" last="Chaix">Jean-Marc Chaix</name><affiliation wicri:level="1"><nlm:affiliation>Univ Grenoble Alpes, SIMAP, F-38000 Grenoble, France; CNRS, SIMAP, F-38000 Grenoble, France.</nlm:affiliation><country xml:lang="fr">France</country><wicri:regionArea>Univ Grenoble Alpes, SIMAP, F-38000 Grenoble, France; CNRS, SIMAP, F-38000 Grenoble</wicri:regionArea><wicri:noRegion>38000 Grenoble</wicri:noRegion><wicri:noRegion>38000 Grenoble</wicri:noRegion></affiliation></author><author><name sortKey="Lefebvre, Williams" sort="Lefebvre, Williams" uniqKey="Lefebvre W" first="Williams" last="Lefebvre">Williams Lefebvre</name><affiliation wicri:level="1"><nlm:affiliation>Groupe de Physique des Materiaux - CNRS - University of Rouen, 76 801 St Etienne du Rouvray Cedex, France.</nlm:affiliation><country xml:lang="fr">France</country><wicri:regionArea>Groupe de Physique des Materiaux - CNRS - University of Rouen, 76 801 St Etienne du Rouvray Cedex</wicri:regionArea><wicri:noRegion>76 801 St Etienne du Rouvray Cedex</wicri:noRegion><wicri:noRegion>76 801 St Etienne du Rouvray Cedex</wicri:noRegion></affiliation></author><author><name sortKey="Geuser, Frederic De" sort="Geuser, Frederic De" uniqKey="Geuser F" first="Frédéric De" last="Geuser">Frédéric De Geuser</name><affiliation wicri:level="1"><nlm:affiliation>Univ Grenoble Alpes, SIMAP, F-38000 Grenoble, France; CNRS, SIMAP, F-38000 Grenoble, France.</nlm:affiliation><country xml:lang="fr">France</country><wicri:regionArea>Univ Grenoble Alpes, SIMAP, F-38000 Grenoble, France; CNRS, SIMAP, F-38000 Grenoble</wicri:regionArea><wicri:noRegion>38000 Grenoble</wicri:noRegion><wicri:noRegion>38000 Grenoble</wicri:noRegion></affiliation></author><author><name sortKey="Deschamps, Alexis" sort="Deschamps, Alexis" uniqKey="Deschamps A" first="Alexis" last="Deschamps">Alexis Deschamps</name><affiliation wicri:level="1"><nlm:affiliation>Univ Grenoble Alpes, SIMAP, F-38000 Grenoble, France; CNRS, SIMAP, F-38000 Grenoble, France.</nlm:affiliation><country xml:lang="fr">France</country><wicri:regionArea>Univ Grenoble Alpes, SIMAP, F-38000 Grenoble, France; CNRS, SIMAP, F-38000 Grenoble</wicri:regionArea><wicri:noRegion>38000 Grenoble</wicri:noRegion><wicri:noRegion>38000 Grenoble</wicri:noRegion></affiliation></author></analytic><series><title level="j">Micron (Oxford, England : 1993)</title><idno type="eISSN">1878-4291</idno><imprint><date when="2015" type="published">2015</date></imprint></series></biblStruct></sourceDesc></fileDesc><profileDesc><textClass></textClass></profileDesc></teiHeader><front><div type="abstract" xml:lang="en">Transmission Electron Microscopy (TEM) can be used to measure the size distribution and volume fraction of fine scale precipitates in metallic systems. However, such measurements suffer from a number of artefacts that need to be accounted for, related to the finite thickness of the TEM foil and to the projected observation in two dimensions of the microstructure. We present a correction procedure to describe the 3D distribution of disc-like particles and apply this method to the plate-like T1 precipitates in an Al-Li-Cu alloy in two ageing conditions showing different particle morphologies. The precipitates were imaged in a High-Angular Annular Dark Field Microscope (HAADF-STEM). The corrected size distribution is further used to determine the precipitate volume fraction. Atom probe tomography (APT) is finally utilised as an alternative way to measure the precipitate volume fraction and test the validity of the electron microscopy results.</div></front></TEI><pubmed><MedlineCitation Status="PubMed-not-MEDLINE" Owner="NLM"><PMID Version="1">26203532</PMID><DateCreated><Year>2015</Year><Month>09</Month><Day>11</Day></DateCreated><DateCompleted><Year>2015</Year><Month>11</Month><Day>24</Day></DateCompleted><DateRevised><Year>2015</Year><Month>09</Month><Day>11</Day></DateRevised><Article PubModel="Print-Electronic"><Journal><ISSN IssnType="Electronic">1878-4291</ISSN><JournalIssue CitedMedium="Internet"><Volume>78</Volume><PubDate><Year>2015</Year><Month>Nov</Month></PubDate></JournalIssue><Title>Micron (Oxford, England : 1993)</Title><ISOAbbreviation>Micron</ISOAbbreviation></Journal><ArticleTitle>Size distribution and volume fraction of T(1) phase precipitates from TEM images: Direct measurements and related correction.</ArticleTitle><Pagination><MedlinePgn>19-27</MedlinePgn></Pagination><ELocationID EIdType="doi" ValidYN="Y">10.1016/j.micron.2015.06.002</ELocationID><ELocationID EIdType="pii" ValidYN="Y">S0968-4328(15)30015-9</ELocationID><Abstract><AbstractText>Transmission Electron Microscopy (TEM) can be used to measure the size distribution and volume fraction of fine scale precipitates in metallic systems. However, such measurements suffer from a number of artefacts that need to be accounted for, related to the finite thickness of the TEM foil and to the projected observation in two dimensions of the microstructure. We present a correction procedure to describe the 3D distribution of disc-like particles and apply this method to the plate-like T1 precipitates in an Al-Li-Cu alloy in two ageing conditions showing different particle morphologies. The precipitates were imaged in a High-Angular Annular Dark Field Microscope (HAADF-STEM). The corrected size distribution is further used to determine the precipitate volume fraction. Atom probe tomography (APT) is finally utilised as an alternative way to measure the precipitate volume fraction and test the validity of the electron microscopy results.</AbstractText><CopyrightInformation>Copyright © 2015 Elsevier Ltd. All rights reserved.</CopyrightInformation></Abstract><AuthorList CompleteYN="Y"><Author ValidYN="Y"><LastName>Dorin</LastName><ForeName>Thomas</ForeName><Initials>T</Initials><AffiliationInfo><Affiliation>Univ Grenoble Alpes, SIMAP, F-38000 Grenoble, France; CNRS, SIMAP, F-38000 Grenoble, France; Institute for Frontier Materials, Deakin University, Geelong, Victoria 3217, Australia; Constellium C-Tec, Voreppe, BP 27, 38341 Voreppe, Cedex, France. Electronic address: thomas.dorin@deakin.edu.au.</Affiliation></AffiliationInfo></Author><Author ValidYN="Y"><LastName>Donnadieu</LastName><ForeName>Patricia</ForeName><Initials>P</Initials><AffiliationInfo><Affiliation>Univ Grenoble Alpes, SIMAP, F-38000 Grenoble, France; CNRS, SIMAP, F-38000 Grenoble, France.</Affiliation></AffiliationInfo></Author><Author ValidYN="Y"><LastName>Chaix</LastName><ForeName>Jean-Marc</ForeName><Initials>JM</Initials><AffiliationInfo><Affiliation>Univ Grenoble Alpes, SIMAP, F-38000 Grenoble, France; CNRS, SIMAP, F-38000 Grenoble, France.</Affiliation></AffiliationInfo></Author><Author ValidYN="Y"><LastName>Lefebvre</LastName><ForeName>Williams</ForeName><Initials>W</Initials><AffiliationInfo><Affiliation>Groupe de Physique des Materiaux - CNRS - University of Rouen, 76 801 St Etienne du Rouvray Cedex, France.</Affiliation></AffiliationInfo></Author><Author ValidYN="Y"><LastName>Geuser</LastName><ForeName>Frédéric De</ForeName><Initials>FD</Initials><AffiliationInfo><Affiliation>Univ Grenoble Alpes, SIMAP, F-38000 Grenoble, France; CNRS, SIMAP, F-38000 Grenoble, France.</Affiliation></AffiliationInfo></Author><Author ValidYN="Y"><LastName>Deschamps</LastName><ForeName>Alexis</ForeName><Initials>A</Initials><AffiliationInfo><Affiliation>Univ Grenoble Alpes, SIMAP, F-38000 Grenoble, France; CNRS, SIMAP, F-38000 Grenoble, France.</Affiliation></AffiliationInfo></Author></AuthorList><Language>eng</Language><PublicationTypeList><PublicationType UI="D016428">Journal Article</PublicationType></PublicationTypeList><ArticleDate DateType="Electronic"><Year>2015</Year><Month>07</Month><Day>04</Day></ArticleDate></Article><MedlineJournalInfo><Country>England</Country><MedlineTA>Micron</MedlineTA><NlmUniqueID>9312850</NlmUniqueID><ISSNLinking>0968-4328</ISSNLinking></MedlineJournalInfo><KeywordList Owner="NOTNLM"><Keyword MajorTopicYN="N">Atom probe tomography</Keyword><Keyword MajorTopicYN="N">Correction method</Keyword><Keyword MajorTopicYN="N">High angle dark field imaging</Keyword><Keyword MajorTopicYN="N">Precipitates</Keyword></KeywordList></MedlineCitation><PubmedData><History><PubMedPubDate PubStatus="received"><Year>2015</Year><Month>04</Month><Day>09</Day></PubMedPubDate><PubMedPubDate PubStatus="revised"><Year>2015</Year><Month>06</Month><Day>12</Day></PubMedPubDate><PubMedPubDate PubStatus="accepted"><Year>2015</Year><Month>06</Month><Day>15</Day></PubMedPubDate><PubMedPubDate PubStatus="entrez"><Year>2015</Year><Month>7</Month><Day>24</Day><Hour>6</Hour><Minute>0</Minute></PubMedPubDate><PubMedPubDate PubStatus="pubmed"><Year>2015</Year><Month>7</Month><Day>24</Day><Hour>6</Hour><Minute>0</Minute></PubMedPubDate><PubMedPubDate PubStatus="medline"><Year>2015</Year><Month>7</Month><Day>24</Day><Hour>6</Hour><Minute>1</Minute></PubMedPubDate></History><PublicationStatus>ppublish</PublicationStatus><ArticleIdList><ArticleId IdType="pubmed">26203532</ArticleId><ArticleId IdType="pii">S0968-4328(15)30015-9</ArticleId><ArticleId IdType="doi">10.1016/j.micron.2015.06.002</ArticleId></ArticleIdList></PubmedData></pubmed><affiliations><list><country><li>France</li></country></list><tree><country name="France"><noRegion><name sortKey="Dorin, Thomas" sort="Dorin, Thomas" uniqKey="Dorin T" first="Thomas" last="Dorin">Thomas Dorin</name></noRegion><name sortKey="Chaix, Jean Marc" sort="Chaix, Jean Marc" uniqKey="Chaix J" first="Jean-Marc" last="Chaix">Jean-Marc Chaix</name><name sortKey="Deschamps, Alexis" sort="Deschamps, Alexis" uniqKey="Deschamps A" first="Alexis" last="Deschamps">Alexis Deschamps</name><name sortKey="Donnadieu, Patricia" sort="Donnadieu, Patricia" uniqKey="Donnadieu P" first="Patricia" last="Donnadieu">Patricia Donnadieu</name><name sortKey="Geuser, Frederic De" sort="Geuser, Frederic De" uniqKey="Geuser F" first="Frédéric De" last="Geuser">Frédéric De Geuser</name><name sortKey="Lefebvre, Williams" sort="Lefebvre, Williams" uniqKey="Lefebvre W" first="Williams" last="Lefebvre">Williams Lefebvre</name></country></tree></affiliations></record>Pour manipuler ce document sous Unix (Dilib)
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