ECO 4 : industrial applications of holographic and speckle measuring techniques, 12-13 March 1991, The Hague
Identifieur interne :
006162 ( PascalFrancis/Curation );
précédent :
006161;
suivant :
006163
ECO 4 : industrial applications of holographic and speckle measuring techniques, 12-13 March 1991, The Hague
Auteurs : Source :
-
SPIE proceedings series [ 1017-2653 ] ; 1991.
RBID : Pascal:93-0363286
Descripteurs français
English descriptors
| pA |
| A01 | 01 | 1 | | @0 1017-2653 |
|---|
| A05 | | | | @2 1508 |
|---|
| A09 | 01 | 1 | ENG | @1 ECO 4 : industrial applications of holographic and speckle measuring techniques, 12-13 March 1991, The Hague |
|---|
| A12 | 01 | 1 | | @1 JUPTNER (Werner P.) @9 ed. |
|---|
| A18 | 01 | 1 | | @1 Israel Laser and Electro-Optics Society @3 ISR @9 patr. |
|---|
| A18 | 02 | 1 | | @1 International Solar Energy Society @2 Melbourne @3 AUS @9 patr. |
|---|
| A18 | 03 | 1 | | @1 International Commission on Glass @2 Prague @3 CSK @9 patr. |
|---|
| A18 | 04 | 1 | | @1 National Group on Quantum Electronics and Plasma Physics @3 INC @9 patr. |
|---|
| A18 | 05 | 1 | | @1 European Association for Signal Processing @2 Lausanne @3 CHE @9 patr. |
|---|
| A18 | 06 | 1 | | @1 Ecole polytechnique fédérale de Lausanne @2 Lausanne @3 CHE @9 patr. |
|---|
| A18 | 07 | 1 | | @1 European Physical Society @2 Petit-Lancy @3 CHE @9 patr. |
|---|
| A18 | 08 | 1 | | @1 European Federation for Applied Optics @3 INT @9 patr. |
|---|
| A18 | 09 | 1 | | @1 International Society for Optical Engineering @2 Bellingham WA @3 USA @9 patr. |
|---|
| A18 | 10 | 1 | | @1 Association nationale de la recherche technique @2 Paris @3 FRA @9 patr. |
|---|
| A18 | 11 | 1 | | @1 Associazione elettrotecnica ed elettronica italiana @2 Milano @3 ITA @9 patr. |
|---|
| A18 | 12 | 1 | | @1 Société des électriciens et des électroniciens @2 Paris @3 FRA @9 patr. |
|---|
| A21 | | | | @1 1991 |
|---|
| A23 | 01 | | | @0 ENG |
|---|
| A24 | 01 | | | @0 eng |
|---|
| A29 | | | | @1 IX, 201 p. @2 28 cm @3 ill., index |
|---|
| A43 | 01 | | | @1 INIST @2 21760 @5 354000027470700000 |
|---|
| A44 | | | | @0 0000 |
|---|
| A47 | 01 | 1 | | @0 93-0363286 |
|---|
| A60 | | | | @1 P @2 C |
|---|
| A61 | | | | @0 M |
|---|
| A64 | | 1 | | @0 SPIE proceedings series |
|---|
| A66 | 01 | | | @0 USA |
|---|
| C02 | 01 | X | | @0 001A03B09D |
|---|
| C03 | 01 | X | FRE | @0 Interférométrie optique |
|---|
| C03 | 01 | X | ENG | @0 Optical interferometry |
|---|
| C03 | 01 | X | SPA | @0 Interferometría óptica |
|---|
| C03 | 02 | X | FRE | @0 Interférométrie holographique |
|---|
| C03 | 02 | X | ENG | @0 Holographic interferometry |
|---|
| C03 | 02 | X | GER | @0 Holographische Interferometrie |
|---|
| C03 | 02 | X | SPA | @0 Interferometría holográfica |
|---|
| C03 | 03 | X | FRE | @0 Holographie |
|---|
| C03 | 03 | X | ENG | @0 Holography |
|---|
| C03 | 03 | X | GER | @0 Holographie |
|---|
| C03 | 03 | X | SPA | @0 Holografía |
|---|
| C03 | 04 | X | FRE | @0 Application industrielle |
|---|
| C03 | 04 | X | ENG | @0 Industrial application |
|---|
| C03 | 04 | X | SPA | @0 Aplicación industrial |
|---|
| C03 | 05 | X | FRE | @0 Essai non destructif |
|---|
| C03 | 05 | X | ENG | @0 Non destructive test |
|---|
| C03 | 05 | X | GER | @0 Zerstoerungsfreie Pruefung |
|---|
| C03 | 05 | X | SPA | @0 Ensayo no destructivo |
|---|
| C03 | 06 | X | FRE | @0 Interférométrie speckle |
|---|
| C03 | 06 | X | ENG | @0 Speckle interferometry |
|---|
| C03 | 06 | X | GER | @0 Speckle Interferometrie |
|---|
| C03 | 06 | X | SPA | @0 Interferometría speckle |
|---|
| C03 | 07 | X | FRE | @0 Photographie speckle |
|---|
| C03 | 07 | X | ENG | @0 Speckle photography |
|---|
| C03 | 07 | X | SPA | @0 Fotografía speckle |
|---|
| C03 | 08 | X | FRE | @0 Télévision |
|---|
| C03 | 08 | X | ENG | @0 Television |
|---|
| C03 | 08 | X | GER | @0 Fernsehen |
|---|
| C03 | 08 | X | SPA | @0 Televisión |
|---|
| N21 | | | | @1 143 |
|---|
|
|---|
| pR |
| A30 | 01 | 1 | ENG | @1 European congress on optics @3 The Hague NLD @4 1991-03-12 |
|---|
|
|---|
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Le document en format XML
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<author><name sortKey="Juptner, Werner P" sort="Juptner, Werner P" uniqKey="Juptner W" first="Werner P." last="Juptner">Werner P. Juptner</name>
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<s9>patr.</s9>
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<s2>Melbourne</s2>
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<series><title level="j" type="main">SPIE proceedings series</title>
<idno type="ISSN">1017-2653</idno>
<imprint><date when="1991">1991</date>
</imprint><seriesStmt><title level="j" type="main">SPIE proceedings series</title>
<idno type="ISSN">1017-2653</idno>
</seriesStmt><profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Holographic interferometry</term>
<term>Holography</term>
<term>Industrial application</term>
<term>Non destructive test</term>
<term>Optical interferometry</term>
<term>Speckle interferometry</term>
<term>Speckle photography</term>
<term>Television</term>
</keywords><keywords scheme="Pascal" xml:lang="fr"><term>Interférométrie optique</term>
<term>Interférométrie holographique</term>
<term>Holographie</term>
<term>Application industrielle</term>
<term>Essai non destructif</term>
<term>Interférométrie speckle</term>
<term>Photographie speckle</term>
<term>Télévision</term>
</keywords><keywords scheme="Wicri" type="topic" xml:lang="fr"><term>Télévision</term>
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</fA05><fA09 i1="01" i2="1" l="ENG"><s1>ECO 4 : industrial applications of holographic and speckle measuring techniques, 12-13 March 1991, The Hague</s1>
</fA09><fA12 i1="01" i2="1"><s1>JUPTNER (Werner P.)</s1>
<s9>ed.</s9>
</fA12><fA18 i1="01" i2="1"><s1>Israel Laser and Electro-Optics Society</s1>
<s3>ISR</s3>
<s9>patr.</s9>
</fA18><fA18 i1="02" i2="1"><s1>International Solar Energy Society</s1>
<s2>Melbourne</s2>
<s3>AUS</s3>
<s9>patr.</s9>
</fA18><fA18 i1="03" i2="1"><s1>International Commission on Glass</s1>
<s2>Prague</s2>
<s3>CSK</s3>
<s9>patr.</s9>
</fA18><fA18 i1="04" i2="1"><s1>National Group on Quantum Electronics and Plasma Physics</s1>
<s3>INC</s3>
<s9>patr.</s9>
</fA18><fA18 i1="05" i2="1"><s1>European Association for Signal Processing</s1>
<s2>Lausanne</s2>
<s3>CHE</s3>
<s9>patr.</s9>
</fA18><fA18 i1="06" i2="1"><s1>Ecole polytechnique fédérale de Lausanne</s1>
<s2>Lausanne</s2>
<s3>CHE</s3>
<s9>patr.</s9>
</fA18><fA18 i1="07" i2="1"><s1>European Physical Society</s1>
<s2>Petit-Lancy</s2>
<s3>CHE</s3>
<s9>patr.</s9>
</fA18><fA18 i1="08" i2="1"><s1>European Federation for Applied Optics</s1>
<s3>INT</s3>
<s9>patr.</s9>
</fA18><fA18 i1="09" i2="1"><s1>International Society for Optical Engineering</s1>
<s2>Bellingham WA</s2>
<s3>USA</s3>
<s9>patr.</s9>
</fA18><fA18 i1="10" i2="1"><s1>Association nationale de la recherche technique</s1>
<s2>Paris</s2>
<s3>FRA</s3>
<s9>patr.</s9>
</fA18><fA18 i1="11" i2="1"><s1>Associazione elettrotecnica ed elettronica italiana</s1>
<s2>Milano</s2>
<s3>ITA</s3>
<s9>patr.</s9>
</fA18><fA18 i1="12" i2="1"><s1>Société des électriciens et des électroniciens</s1>
<s2>Paris</s2>
<s3>FRA</s3>
<s9>patr.</s9>
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</fA23><fA24 i1="01"><s0>eng</s0>
</fA24><fA29><s1>IX, 201 p.</s1>
<s2>28 cm</s2>
<s3>ill., index</s3>
</fA29><fA43 i1="01"><s1>INIST</s1>
<s2>21760</s2>
<s5>354000027470700000</s5>
</fA43><fA44><s0>0000</s0>
</fA44><fA47 i1="01" i2="1"><s0>93-0363286</s0>
</fA47><fA60><s1>P</s1>
<s2>C</s2>
</fA60><fA64 i2="1"><s0>SPIE proceedings series</s0>
</fA64><fA66 i1="01"><s0>USA</s0>
</fA66><fC02 i1="01" i2="X"><s0>001A03B09D</s0>
</fC02><fC03 i1="01" i2="X" l="FRE"><s0>Interférométrie optique</s0>
</fC03><fC03 i1="01" i2="X" l="ENG"><s0>Optical interferometry</s0>
</fC03><fC03 i1="01" i2="X" l="SPA"><s0>Interferometría óptica</s0>
</fC03><fC03 i1="02" i2="X" l="FRE"><s0>Interférométrie holographique</s0>
</fC03><fC03 i1="02" i2="X" l="ENG"><s0>Holographic interferometry</s0>
</fC03><fC03 i1="02" i2="X" l="GER"><s0>Holographische Interferometrie</s0>
</fC03><fC03 i1="02" i2="X" l="SPA"><s0>Interferometría holográfica</s0>
</fC03><fC03 i1="03" i2="X" l="FRE"><s0>Holographie</s0>
</fC03><fC03 i1="03" i2="X" l="ENG"><s0>Holography</s0>
</fC03><fC03 i1="03" i2="X" l="GER"><s0>Holographie</s0>
</fC03><fC03 i1="03" i2="X" l="SPA"><s0>Holografía</s0>
</fC03><fC03 i1="04" i2="X" l="FRE"><s0>Application industrielle</s0>
</fC03><fC03 i1="04" i2="X" l="ENG"><s0>Industrial application</s0>
</fC03><fC03 i1="04" i2="X" l="SPA"><s0>Aplicación industrial</s0>
</fC03><fC03 i1="05" i2="X" l="FRE"><s0>Essai non destructif</s0>
</fC03><fC03 i1="05" i2="X" l="ENG"><s0>Non destructive test</s0>
</fC03><fC03 i1="05" i2="X" l="GER"><s0>Zerstoerungsfreie Pruefung</s0>
</fC03><fC03 i1="05" i2="X" l="SPA"><s0>Ensayo no destructivo</s0>
</fC03><fC03 i1="06" i2="X" l="FRE"><s0>Interférométrie speckle</s0>
</fC03><fC03 i1="06" i2="X" l="ENG"><s0>Speckle interferometry</s0>
</fC03><fC03 i1="06" i2="X" l="GER"><s0>Speckle Interferometrie</s0>
</fC03><fC03 i1="06" i2="X" l="SPA"><s0>Interferometría speckle</s0>
</fC03><fC03 i1="07" i2="X" l="FRE"><s0>Photographie speckle</s0>
</fC03><fC03 i1="07" i2="X" l="ENG"><s0>Speckle photography</s0>
</fC03><fC03 i1="07" i2="X" l="SPA"><s0>Fotografía speckle</s0>
</fC03><fC03 i1="08" i2="X" l="FRE"><s0>Télévision</s0>
</fC03><fC03 i1="08" i2="X" l="ENG"><s0>Television</s0>
</fC03><fC03 i1="08" i2="X" l="GER"><s0>Fernsehen</s0>
</fC03><fC03 i1="08" i2="X" l="SPA"><s0>Televisión</s0>
</fC03><fN21><s1>143</s1>
</fN21><pR><fA30 i1="01" i2="1" l="ENG"><s1>European congress on optics</s1>
<s3>The Hague NLD</s3>
<s4>1991-03-12</s4>
</fA30>
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