The 2-ID-B intermediate-energy scanning X-ray microscope at the APS
Identifieur interne : 005337 ( PascalFrancis/Corpus ); précédent : 005336; suivant : 005338The 2-ID-B intermediate-energy scanning X-ray microscope at the APS
Auteurs : I. Mcnulty ; D. Paterson ; J. Arko ; M. Erdmann ; S. P. Frigo ; K. Goetze ; P. Llinski ; N. Kraf ; T. Mooney ; C. C. Retsch ; A. P. J. Stampfl ; S. Vogt ; Y. Wang ; S. XuSource :
- Journal de physique. IV [ 1155-4339 ] ; 2003.
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- Pascal (Inist)
English descriptors
- KwdEn :
Abstract
The intermediate-energy scanning x-ray microscope at beamline 2-ID-B at the Advanced Photon Source is a dedicated instrument for materials and biological research. The microscope uses a zone plate lens to focus coherent I-4 keV x-rays to a 60 nm focal spot of 109photons/ s onto the sample. It records simultaneous transmission and energy-resolved fluorescence images. We have used the microscope for nanotomography of chips and microspectroscopy of cells.
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Format Inist (serveur)
NO : | PASCAL 03-0295174 INIST |
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ET : | The 2-ID-B intermediate-energy scanning X-ray microscope at the APS |
AU : | MCNULTY (I.); PATERSON (D.); ARKO (J.); ERDMANN (M.); FRIGO (S. P.); GOETZE (K.); LLINSKI (P.); KRAF (N.); MOONEY (T.); RETSCH (C. C.); STAMPFL (A. P. J.); VOGT (S.); WANG (Y.); XU (S.); SUSINI (J.); JOYEUX (D.); POLACK (F.) |
AF : | Argonne National Laboratory, 9700 S. Cass Ave./Argonne, IL 60439/Etats-Unis (1 aut., 2 aut., 3 aut., 4 aut., 6 aut., 7 aut., 9 aut., 12 aut., 14 aut.); Department of Physics and Astronomy, Northern Arizona University, P.O. Box 6010/Flagstaff, AZ 86011/Etats-Unis (5 aut.); Department of Physics, University of Chicago/Chicago, IL 60637/Etats-Unis (8 aut.); Saint-Gobain Sekurit Deutschland, ZAF - PT, Glasstrasse 1/52134 Herzogenrath/Allemagne (10 aut.); Physics Division, Australian Nuclear Science and Technology Organisation/Menai, NSW 2234/Australie (11 aut.); X-Radia Inc., 4075A Sprig Dr./Concord, CA 94520/Etats-Unis (13 aut.); ESRF, 6 rue Jules Horowitz, BP. 220/38043 Grenoble/France (1 aut.); IOTA/CNRS, Institut Optique, bâtiment 503, Centre Universitaire Paris-Sud/91405 Orsay/France (2 aut.); LURE, bâtiment 209D, Centre Universitaire Paris-Sud, BP. 34/91898 Orsay/France (3 aut.) |
DT : | Publication en série; Congrès; Niveau analytique |
SO : | Journal de physique. IV; ISSN 1155-4339; France; Da. 2003; Vol. 104; Pp. 11-15; Bibl. 17 ref. |
LA : | Anglais |
EA : | The intermediate-energy scanning x-ray microscope at beamline 2-ID-B at the Advanced Photon Source is a dedicated instrument for materials and biological research. The microscope uses a zone plate lens to focus coherent I-4 keV x-rays to a 60 nm focal spot of 109photons/ s onto the sample. It records simultaneous transmission and energy-resolved fluorescence images. We have used the microscope for nanotomography of chips and microspectroscopy of cells. |
CC : | 001B00G85T |
FD : | Microscopie RX; Microscope; Mode balayage; Source lumière; Appareillage; Optique faisceau; Etude expérimentale; 0785T |
ED : | X-ray microscopy; Microscopes; Scanning mode; Light sources; Instrumentation; Beam optics; Experimental study |
SD : | Modo exploración |
LO : | INIST-125C.354000109873380030 |
ID : | 03-0295174 |
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Pascal:03-0295174Le document en format XML
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<sourceDesc><biblStruct><analytic><title xml:lang="en" level="a">The 2-ID-B intermediate-energy scanning X-ray microscope at the APS</title>
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<front><div type="abstract" xml:lang="en">The intermediate-energy scanning x-ray microscope at beamline 2-ID-B at the Advanced Photon Source is a dedicated instrument for materials and biological research. The microscope uses a zone plate lens to focus coherent I-4 keV x-rays to a 60 nm focal spot of 10<sup>9</sup>
photons/ s onto the sample. It records simultaneous transmission and energy-resolved fluorescence images. We have used the microscope for nanotomography of chips and microspectroscopy of cells.</div>
</front>
</TEI>
<inist><standard h6="B"><pA><fA01 i1="01" i2="1"><s0>1155-4339</s0>
</fA01>
<fA03 i2="1"><s0>J. phys., IV</s0>
</fA03>
<fA05><s2>104</s2>
</fA05>
<fA08 i1="01" i2="1" l="ENG"><s1>The 2-ID-B intermediate-energy scanning X-ray microscope at the APS</s1>
</fA08>
<fA09 i1="01" i2="1" l="ENG"><s1>X-Ray Microscopy 2002: 7th International Conference on X-Ray Microscopy, ESRF, Grenoble, France, July 28 - August 2, 2002</s1>
</fA09>
<fA11 i1="01" i2="1"><s1>MCNULTY (I.)</s1>
</fA11>
<fA11 i1="02" i2="1"><s1>PATERSON (D.)</s1>
</fA11>
<fA11 i1="03" i2="1"><s1>ARKO (J.)</s1>
</fA11>
<fA11 i1="04" i2="1"><s1>ERDMANN (M.)</s1>
</fA11>
<fA11 i1="05" i2="1"><s1>FRIGO (S. P.)</s1>
</fA11>
<fA11 i1="06" i2="1"><s1>GOETZE (K.)</s1>
</fA11>
<fA11 i1="07" i2="1"><s1>LLINSKI (P.)</s1>
</fA11>
<fA11 i1="08" i2="1"><s1>KRAF (N.)</s1>
</fA11>
<fA11 i1="09" i2="1"><s1>MOONEY (T.)</s1>
</fA11>
<fA11 i1="10" i2="1"><s1>RETSCH (C. C.)</s1>
</fA11>
<fA11 i1="11" i2="1"><s1>STAMPFL (A. P. J.)</s1>
</fA11>
<fA11 i1="12" i2="1"><s1>VOGT (S.)</s1>
</fA11>
<fA11 i1="13" i2="1"><s1>WANG (Y.)</s1>
</fA11>
<fA11 i1="14" i2="1"><s1>XU (S.)</s1>
</fA11>
<fA12 i1="01" i2="1"><s1>SUSINI (J.)</s1>
<s9>ed.</s9>
</fA12>
<fA12 i1="02" i2="1"><s1>JOYEUX (D.)</s1>
<s9>ed.</s9>
</fA12>
<fA12 i1="03" i2="1"><s1>POLACK (F.)</s1>
<s9>ed.</s9>
</fA12>
<fA14 i1="01"><s1>Argonne National Laboratory, 9700 S. Cass Ave.</s1>
<s2>Argonne, IL 60439</s2>
<s3>USA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>3 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>6 aut.</sZ>
<sZ>7 aut.</sZ>
<sZ>9 aut.</sZ>
<sZ>12 aut.</sZ>
<sZ>14 aut.</sZ>
</fA14>
<fA14 i1="02"><s1>Department of Physics and Astronomy, Northern Arizona University, P.O. Box 6010</s1>
<s2>Flagstaff, AZ 86011</s2>
<s3>USA</s3>
<sZ>5 aut.</sZ>
</fA14>
<fA14 i1="03"><s1>Department of Physics, University of Chicago</s1>
<s2>Chicago, IL 60637</s2>
<s3>USA</s3>
<sZ>8 aut.</sZ>
</fA14>
<fA14 i1="04"><s1>Saint-Gobain Sekurit Deutschland, ZAF - PT, Glasstrasse 1</s1>
<s2>52134 Herzogenrath</s2>
<s3>DEU</s3>
<sZ>10 aut.</sZ>
</fA14>
<fA14 i1="05"><s1>Physics Division, Australian Nuclear Science and Technology Organisation</s1>
<s2>Menai, NSW 2234</s2>
<s3>AUS</s3>
<sZ>11 aut.</sZ>
</fA14>
<fA14 i1="06"><s1>X-Radia Inc., 4075A Sprig Dr.</s1>
<s2>Concord, CA 94520</s2>
<s3>USA</s3>
<sZ>13 aut.</sZ>
</fA14>
<fA15 i1="01"><s1>ESRF, 6 rue Jules Horowitz, BP. 220</s1>
<s2>38043 Grenoble</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
</fA15>
<fA15 i1="02"><s1>IOTA/CNRS, Institut Optique, bâtiment 503, Centre Universitaire Paris-Sud</s1>
<s2>91405 Orsay</s2>
<s3>FRA</s3>
<sZ>2 aut.</sZ>
</fA15>
<fA15 i1="03"><s1>LURE, bâtiment 209D, Centre Universitaire Paris-Sud, BP. 34</s1>
<s2>91898 Orsay</s2>
<s3>FRA</s3>
<sZ>3 aut.</sZ>
</fA15>
<fA18 i1="01" i2="1"><s1>Synchroton SOLEIL</s1>
<s2>Orsay</s2>
<s3>FRA</s3>
<s9>patr.</s9>
</fA18>
<fA18 i1="02" i2="1"><s1>Laboratoire d'utilisation du rayonnement électromagnétique (LURE)</s1>
<s2>Orsay</s2>
<s3>FRA</s3>
<s9>patr.</s9>
</fA18>
<fA18 i1="03" i2="1"><s1>Institut d'optique théorique et appliquée (IOTA-CNRS). Laboratoire Charles Fabry</s1>
<s2>Orsay</s2>
<s3>FRA</s3>
<s9>patr.</s9>
</fA18>
<fA18 i1="04" i2="1"><s1>The European Synchroton Radiation Facility (ESRF)</s1>
<s2>Grenoble</s2>
<s3>FRA</s3>
<s9>patr.</s9>
</fA18>
<fA20><s1>11-15</s1>
</fA20>
<fA21><s1>2003</s1>
</fA21>
<fA23 i1="01"><s0>ENG</s0>
</fA23>
<fA43 i1="01"><s1>INIST</s1>
<s2>125C</s2>
<s5>354000109873380030</s5>
</fA43>
<fA44><s0>0000</s0>
<s1>© 2003 INIST-CNRS. All rights reserved.</s1>
</fA44>
<fA45><s0>17 ref.</s0>
</fA45>
<fA47 i1="01" i2="1"><s0>03-0295174</s0>
</fA47>
<fA60><s1>P</s1>
<s2>C</s2>
</fA60>
<fA61><s0>A</s0>
</fA61>
<fA64 i1="01" i2="1"><s0>Journal de physique. IV</s0>
</fA64>
<fA66 i1="01"><s0>FRA</s0>
</fA66>
<fC01 i1="01" l="ENG"><s0>The intermediate-energy scanning x-ray microscope at beamline 2-ID-B at the Advanced Photon Source is a dedicated instrument for materials and biological research. The microscope uses a zone plate lens to focus coherent I-4 keV x-rays to a 60 nm focal spot of 10<sup>9</sup>
photons/ s onto the sample. It records simultaneous transmission and energy-resolved fluorescence images. We have used the microscope for nanotomography of chips and microspectroscopy of cells.</s0>
</fC01>
<fC02 i1="01" i2="3"><s0>001B00G85T</s0>
</fC02>
<fC03 i1="01" i2="3" l="FRE"><s0>Microscopie RX</s0>
<s5>01</s5>
</fC03>
<fC03 i1="01" i2="3" l="ENG"><s0>X-ray microscopy</s0>
<s5>01</s5>
</fC03>
<fC03 i1="02" i2="3" l="FRE"><s0>Microscope</s0>
<s5>02</s5>
</fC03>
<fC03 i1="02" i2="3" l="ENG"><s0>Microscopes</s0>
<s5>02</s5>
</fC03>
<fC03 i1="03" i2="X" l="FRE"><s0>Mode balayage</s0>
<s5>03</s5>
</fC03>
<fC03 i1="03" i2="X" l="ENG"><s0>Scanning mode</s0>
<s5>03</s5>
</fC03>
<fC03 i1="03" i2="X" l="SPA"><s0>Modo exploración</s0>
<s5>03</s5>
</fC03>
<fC03 i1="04" i2="3" l="FRE"><s0>Source lumière</s0>
<s5>04</s5>
</fC03>
<fC03 i1="04" i2="3" l="ENG"><s0>Light sources</s0>
<s5>04</s5>
</fC03>
<fC03 i1="05" i2="3" l="FRE"><s0>Appareillage</s0>
<s5>05</s5>
</fC03>
<fC03 i1="05" i2="3" l="ENG"><s0>Instrumentation</s0>
<s5>05</s5>
</fC03>
<fC03 i1="06" i2="3" l="FRE"><s0>Optique faisceau</s0>
<s5>06</s5>
</fC03>
<fC03 i1="06" i2="3" l="ENG"><s0>Beam optics</s0>
<s5>06</s5>
</fC03>
<fC03 i1="07" i2="3" l="FRE"><s0>Etude expérimentale</s0>
<s5>07</s5>
</fC03>
<fC03 i1="07" i2="3" l="ENG"><s0>Experimental study</s0>
<s5>07</s5>
</fC03>
<fC03 i1="08" i2="3" l="FRE"><s0>0785T</s0>
<s2>PAC</s2>
<s4>INC</s4>
<s5>91</s5>
</fC03>
<fN21><s1>195</s1>
</fN21>
<fN82><s1>PSI</s1>
</fN82>
</pA>
<pR><fA30 i1="01" i2="1" l="ENG"><s1>X-Ray Microscopy Conference</s1>
<s2>7</s2>
<s3>Grenoble FRA</s3>
<s4>2002-07-28</s4>
</fA30>
</pR>
</standard>
<server><NO>PASCAL 03-0295174 INIST</NO>
<ET>The 2-ID-B intermediate-energy scanning X-ray microscope at the APS</ET>
<AU>MCNULTY (I.); PATERSON (D.); ARKO (J.); ERDMANN (M.); FRIGO (S. P.); GOETZE (K.); LLINSKI (P.); KRAF (N.); MOONEY (T.); RETSCH (C. C.); STAMPFL (A. P. J.); VOGT (S.); WANG (Y.); XU (S.); SUSINI (J.); JOYEUX (D.); POLACK (F.)</AU>
<AF>Argonne National Laboratory, 9700 S. Cass Ave./Argonne, IL 60439/Etats-Unis (1 aut., 2 aut., 3 aut., 4 aut., 6 aut., 7 aut., 9 aut., 12 aut., 14 aut.); Department of Physics and Astronomy, Northern Arizona University, P.O. Box 6010/Flagstaff, AZ 86011/Etats-Unis (5 aut.); Department of Physics, University of Chicago/Chicago, IL 60637/Etats-Unis (8 aut.); Saint-Gobain Sekurit Deutschland, ZAF - PT, Glasstrasse 1/52134 Herzogenrath/Allemagne (10 aut.); Physics Division, Australian Nuclear Science and Technology Organisation/Menai, NSW 2234/Australie (11 aut.); X-Radia Inc., 4075A Sprig Dr./Concord, CA 94520/Etats-Unis (13 aut.); ESRF, 6 rue Jules Horowitz, BP. 220/38043 Grenoble/France (1 aut.); IOTA/CNRS, Institut Optique, bâtiment 503, Centre Universitaire Paris-Sud/91405 Orsay/France (2 aut.); LURE, bâtiment 209D, Centre Universitaire Paris-Sud, BP. 34/91898 Orsay/France (3 aut.)</AF>
<DT>Publication en série; Congrès; Niveau analytique</DT>
<SO>Journal de physique. IV; ISSN 1155-4339; France; Da. 2003; Vol. 104; Pp. 11-15; Bibl. 17 ref.</SO>
<LA>Anglais</LA>
<EA>The intermediate-energy scanning x-ray microscope at beamline 2-ID-B at the Advanced Photon Source is a dedicated instrument for materials and biological research. The microscope uses a zone plate lens to focus coherent I-4 keV x-rays to a 60 nm focal spot of 10<sup>9</sup>
photons/ s onto the sample. It records simultaneous transmission and energy-resolved fluorescence images. We have used the microscope for nanotomography of chips and microspectroscopy of cells.</EA>
<CC>001B00G85T</CC>
<FD>Microscopie RX; Microscope; Mode balayage; Source lumière; Appareillage; Optique faisceau; Etude expérimentale; 0785T</FD>
<ED>X-ray microscopy; Microscopes; Scanning mode; Light sources; Instrumentation; Beam optics; Experimental study</ED>
<SD>Modo exploración</SD>
<LO>INIST-125C.354000109873380030</LO>
<ID>03-0295174</ID>
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