Eléments de l'association

	L. Edwards	2
	Diffraction RX	118
	L. Edwards *Sauf* Diffraction RX"	1
	Diffraction RX *Sauf* L. Edwards"	117
	L. Edwards Et Diffraction RX	1
	L. Edwards Ou Diffraction RX	119
	*Corpus*	11069

List of bibliographic references

Number of relevant bibliographic references: 1.

Ident.	Authors (with country if any)	Title
001D41	M. K. Khan [Royaume-Uni] ; M. E. Fitzpatrick [Royaume-Uni] ; S. V. Hainsworth [Royaume-Uni] ; A. D. Evans [France] ; L. Edwards [Royaume-Uni, Australie]	Application of synchrotron X-ray diffraction and nanoindentation for the determination of residual stress fields around scratches

Wicri

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