SIMS And NotX. J. Hao
List of bibliographic references
Number of relevant bibliographic references: 4.| Ident. | Authors (with country if any) | Title |
|---|---|---|
| 000760 | P. Peres [France] ; P. M. L. Hedberg [Allemagne] ; S. Walton [Royaume-Uni] ; N. Montgomery [Royaume-Uni] ; J. B. Cliff [Australie] ; F. Rabemananjara [France] ; M. Schuhmacher [France] | Nuclear safeguards applications using LG-SIMS with automated screening capabilities |
| 004169 | P. J. Evans [Australie] ; P. H. Mutin [France] ; G. Triani [Australie] ; K. E. Prince [Australie] ; J. R. Bartlett [Australie] | Characterisation of metal oxide films deposited by non-hydrolytic ALD |
| 006797 | A. Bernasik [France, Australie] ; J. Nowotny ; S. Scherrer ; S. Weber | Application of the SIMS method in studies of Cr segregation in Cr-doped CoO: II, depth profiles |
| 006798 | A. Bernasik [France, Australie] ; J. Nowotny ; S. Scherrer ; S. Weber | Application of the SIMS method in studies of Cr segregation in Cr-doped CoO: I, aspects of quantitative analysis |
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