| J. Micheau < J. Michler < J. Mieszkowski | Facettes : |
List of bibliographic references
Number of relevant bibliographic references: 3.| Ident. | Authors (with country if any) | Title |
|---|---|---|
| 00B563 (2004) | R. Payling [Suisse, Australie] ; T. Nelis [Suisse] ; M. Aeberhard [Suisse] ; J. Michler [Suisse] ; P. Seris [France] | Layer model approach to background correction in r.f.‐GDOES |
| 00B917 (2004) | R. Payling [Suisse, Australie] ; T. Nelis [Suisse] ; M. Aeberhard [Suisse] ; J. Michler [Suisse] ; P. Seris [France] | Layer model approach to background correction in r.f.-GDOES |
| 00BA33 (2004) | J. Michler [Suisse] ; M. Aeberhard [Suisse] ; D. Velten [Allemagne] ; S. Winter [Allemagne] ; R. Payling [Suisse, Australie] ; J. Breme [Allemagne] | Depth profiling by GDOES: application of hydrogen and d.c. bias voltage corrections to the analysis of thin oxide films |
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