Interfacial strength development of roll-bonded aluminium/copper metal laminates
Identifieur interne : 009552 ( Main/Merge ); précédent : 009551; suivant : 009553Interfacial strength development of roll-bonded aluminium/copper metal laminates
Auteurs : G. Heness [Australie] ; R. Wuhrer [Australie] ; W. Y. Yeung [Australie]Source :
- Materials science & engineering. A, Structural materials : properties, microstructure and processing [ 0921-5093 ] ; 2008.
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English descriptors
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Abstract
The development of the phases in the interface of roll-bonded Al/Cu metal laminates controls the strength. Phase development as a function of sintering time was monitored via X-ray diffraction and X-ray mapping. Both techniques revealed essentially the same phase presence and highlighted a limitation of X-ray diffraction. Initial rolling reduction has no effect on phase development but does affect the interface thickness.
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Pascal:08-0284618Le document en format XML
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<profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Aluminium</term>
<term>Copper</term>
<term>Interface</term>
<term>Laminate</term>
<term>Roll bonding</term>
<term>Sintering</term>
<term>Strength</term>
<term>Thickness</term>
<term>Time dependence</term>
<term>Transition metal</term>
<term>X ray diffraction</term>
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<keywords scheme="Pascal" xml:lang="fr"><term>Résistance mécanique</term>
<term>Interface</term>
<term>Dépendance du temps</term>
<term>Frittage</term>
<term>Diffraction RX</term>
<term>Epaisseur</term>
<term>Aluminium</term>
<term>Cuivre</term>
<term>Stratifié</term>
<term>Métal transition</term>
<term>Colaminage</term>
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<keywords scheme="Wicri" type="topic" xml:lang="fr"><term>Aluminium</term>
<term>Cuivre</term>
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<front><div type="abstract" xml:lang="en">The development of the phases in the interface of roll-bonded Al/Cu metal laminates controls the strength. Phase development as a function of sintering time was monitored via X-ray diffraction and X-ray mapping. Both techniques revealed essentially the same phase presence and highlighted a limitation of X-ray diffraction. Initial rolling reduction has no effect on phase development but does affect the interface thickness.</div>
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<name sortKey="Yeung, W Y" sort="Yeung, W Y" uniqKey="Yeung W" first="W. Y." last="Yeung">W. Y. Yeung</name>
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