Interfacial strength development of roll-bonded aluminium/copper metal laminates
Identifieur interne : 009552 ( Main/Merge ); précédent : 009551; suivant : 009553Interfacial strength development of roll-bonded aluminium/copper metal laminates
Auteurs : G. Heness [Australie] ; R. Wuhrer [Australie] ; W. Y. Yeung [Australie]Source :
- Materials science & engineering. A, Structural materials : properties, microstructure and processing [ 0921-5093 ] ; 2008.
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Abstract
The development of the phases in the interface of roll-bonded Al/Cu metal laminates controls the strength. Phase development as a function of sintering time was monitored via X-ray diffraction and X-ray mapping. Both techniques revealed essentially the same phase presence and highlighted a limitation of X-ray diffraction. Initial rolling reduction has no effect on phase development but does affect the interface thickness.
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Wuhrer</name><affiliation wicri:level="1"><inist:fA14 i1="02"><s1>Microstructural Analysis Unit, University of Technology, Sydney, PO Box 123</s1><s2>Broadway, NSW 2007</s2><s3>AUS</s3><sZ>2 aut.</sZ></inist:fA14><country>Australie</country><wicri:noRegion>Broadway, NSW 2007</wicri:noRegion></affiliation></author><author><name sortKey="Yeung, W Y" sort="Yeung, W Y" uniqKey="Yeung W" first="W. Y." last="Yeung">W. Y. Yeung</name><affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Department of Chemistry, Materials and Forensic Science, University of Technology, Sydney, PO Box 123</s1><s2>Broadway, NSW 2007</s2><s3>AUS</s3><sZ>1 aut.</sZ><sZ>3 aut.</sZ></inist:fA14><country>Australie</country><wicri:noRegion>Broadway, NSW 2007</wicri:noRegion></affiliation></author></titleStmt><publicationStmt><idno type="wicri:source">INIST</idno><idno type="inist">08-0284618</idno><date when="2008">2008</date><idno type="stanalyst">PASCAL 08-0284618 INIST</idno><idno type="RBID">Pascal:08-0284618</idno><idno type="wicri:Area/PascalFrancis/Corpus">003531</idno><idno type="wicri:Area/PascalFrancis/Curation">002B17</idno><idno type="wicri:Area/PascalFrancis/Checkpoint">003138</idno><idno type="wicri:explorRef" wicri:stream="PascalFrancis" wicri:step="Checkpoint">003138</idno><idno type="wicri:doubleKey">0921-5093:2008:Heness G:interfacial:strength:development</idno><idno type="wicri:Area/Main/Merge">009552</idno></publicationStmt><sourceDesc><biblStruct><analytic><title xml:lang="en" level="a">Interfacial strength development of roll-bonded aluminium/copper metal laminates</title><author><name sortKey="Heness, G" sort="Heness, G" uniqKey="Heness G" first="G." last="Heness">G. Heness</name><affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Department of Chemistry, Materials and Forensic Science, University of Technology, Sydney, PO Box 123</s1><s2>Broadway, NSW 2007</s2><s3>AUS</s3><sZ>1 aut.</sZ><sZ>3 aut.</sZ></inist:fA14><country>Australie</country><wicri:noRegion>Broadway, NSW 2007</wicri:noRegion></affiliation></author><author><name sortKey="Wuhrer, R" sort="Wuhrer, R" uniqKey="Wuhrer R" first="R." last="Wuhrer">R. Wuhrer</name><affiliation wicri:level="1"><inist:fA14 i1="02"><s1>Microstructural Analysis Unit, University of Technology, Sydney, PO Box 123</s1><s2>Broadway, NSW 2007</s2><s3>AUS</s3><sZ>2 aut.</sZ></inist:fA14><country>Australie</country><wicri:noRegion>Broadway, NSW 2007</wicri:noRegion></affiliation></author><author><name sortKey="Yeung, W Y" sort="Yeung, W Y" uniqKey="Yeung W" first="W. Y." last="Yeung">W. Y. Yeung</name><affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Department of Chemistry, Materials and Forensic Science, University of Technology, Sydney, PO Box 123</s1><s2>Broadway, NSW 2007</s2><s3>AUS</s3><sZ>1 aut.</sZ><sZ>3 aut.</sZ></inist:fA14><country>Australie</country><wicri:noRegion>Broadway, NSW 2007</wicri:noRegion></affiliation></author></analytic><series><title level="j" type="main">Materials science & engineering. A, Structural materials : properties, microstructure and processing</title><title level="j" type="abbreviated">Mater. sci. eng. A Struct. mater. prop. microstruct. proces.</title><idno type="ISSN">0921-5093</idno><imprint><date when="2008">2008</date></imprint></series></biblStruct></sourceDesc><seriesStmt><title level="j" type="main">Materials science & engineering. A, Structural materials : properties, microstructure and processing</title><title level="j" type="abbreviated">Mater. sci. eng. A Struct. mater. prop. microstruct. proces.</title><idno type="ISSN">0921-5093</idno></seriesStmt></fileDesc><profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Aluminium</term><term>Copper</term><term>Interface</term><term>Laminate</term><term>Roll bonding</term><term>Sintering</term><term>Strength</term><term>Thickness</term><term>Time dependence</term><term>Transition metal</term><term>X ray diffraction</term></keywords><keywords scheme="Pascal" xml:lang="fr"><term>Résistance mécanique</term><term>Interface</term><term>Dépendance du temps</term><term>Frittage</term><term>Diffraction RX</term><term>Epaisseur</term><term>Aluminium</term><term>Cuivre</term><term>Stratifié</term><term>Métal transition</term><term>Colaminage</term></keywords><keywords scheme="Wicri" type="topic" xml:lang="fr"><term>Aluminium</term><term>Cuivre</term></keywords></textClass></profileDesc></teiHeader><front><div type="abstract" xml:lang="en">The development of the phases in the interface of roll-bonded Al/Cu metal laminates controls the strength. Phase development as a function of sintering time was monitored via X-ray diffraction and X-ray mapping. Both techniques revealed essentially the same phase presence and highlighted a limitation of X-ray diffraction. Initial rolling reduction has no effect on phase development but does affect the interface thickness.</div></front></TEI><affiliations><list><country><li>Australie</li></country></list><tree><country name="Australie"><noRegion><name sortKey="Heness, G" sort="Heness, G" uniqKey="Heness G" first="G." last="Heness">G. Heness</name></noRegion><name sortKey="Wuhrer, R" sort="Wuhrer, R" uniqKey="Wuhrer R" first="R." last="Wuhrer">R. Wuhrer</name><name sortKey="Yeung, W Y" sort="Yeung, W Y" uniqKey="Yeung W" first="W. Y." last="Yeung">W. Y. Yeung</name></country></tree></affiliations></record>Pour manipuler ce document sous Unix (Dilib)
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