List of bibliographic references
Number of relevant bibliographic references: 10.
| Ident. | Authors (with country if any) | Title |
|---|
| 000739 (2013) |
P. Peres [France] ; P. M. L. Hedberg [Allemagne] ; S. Walton [Royaume-Uni] ; N. Montgomery [Royaume-Uni] ; J. B. Cliff [Australie] ; F. Rabemananjara [France] ; M. Schuhmacher [France] | Nuclear safeguards applications using LG‐SIMS with automated screening capabilities |
| 000A55 (2003) |
Richard Payling [Suisse, Australie] ; Johann Michler [Suisse] ; Max Aeberhard [Suisse] ; Yuriy Popov [France] | New aspects of quantification in r.f. GDOES |
| 001183 (2003) |
Philippe Le Coustumer [France] ; Mikael Motelica-Heino [France] ; Patrick Chapon [France] ; Hugues François Saint-Cyr [États-Unis] ; Richard Payling [Australie] | Surface characterization and depth profile analysis of glasses by r.f. GDOES |
| 001A42 (2006) |
P. J. Evans [Australie] ; P. H. Mutin [France] ; G. Triani [Australie] ; K. E. Prince [Australie] ; J. R. Bartlett [Australie] | Characterisation of metal oxide films deposited by non‐hydrolytic ALD |
| 001C90 (2003) |
Richard Payling [Suisse, Australie] ; Max Aeberhard [Suisse] ; Johann Michler [Suisse] ; Cyril Authier [France] ; Patrick Chapon [France] ; Thomas Nelis [France] ; Leanne Pitchford [France] | Theory of relative sputtering rates in GDOES |
| 001D09 (1997) |
Andrzej Bernasik [France] ; Janusz Nowotny [Australie] ; Stanislas Scherrer [France] ; Sylvian Weber [France] | Application of the SIMS Method in Studies of Cr Segregation in Cr‐Doped CoO: I, Aspects of Quantitative Analysis |
| 001F55 (2015) |
Laure Sangely [France, Allemagne] ; Bernard Boyer [France, Allemagne] ; Emmanuel De Chambost [France, Allemagne] ; Nathalie Valle [France, Allemagne] ; Jean-Nicolas Audinot [France, Allemagne] ; Trevor Ireland [France, Allemagne] ; Michael Wiedenbeck [France, Allemagne] ; Jérôme Aléon [France, Allemagne] ; Harald Jungnickel [France, Allemagne] ; Jean-Paul Barnes [France, Allemagne] ; Philippe Bienvenu [France, Allemagne] ; Uwe Breuer [France, Allemagne] | CHAPTER 15 - Secondary Ion Mass Spectrometry |
| 002248 (2004) |
R. Payling [Suisse, Australie] ; T. Nelis [Suisse] ; M. Aeberhard [Suisse] ; J. Michler [Suisse] ; P. Seris [France] | Layer model approach to background correction in r.f.‐GDOES |
| 002C69 (2004) |
Thomas Nelis [Suisse, France, Oman] ; Max Aeberhard [Suisse, Oman] ; Richard Payling [Suisse, Australie, Oman] ; Johann Michler [Suisse, Oman] ; Patrick Chapon [France] | Relative calibration mode for compositional depth profiling in GD-OES |
| 002D99 (1997) |
Andrzej Bernasik [France] ; Janusz Nowotny [Australie] ; Stanislas Scherrer [France] ; Sylvian Weber [France] | Application of the SIMS Method in Studies of Cr Segregation in Cr‐Doped CoO: II, Depth Profiles |
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