Significantly Reduced Bimolecular Recombination in a Novel Silole‐Based Polymer: Fullerene Blend
Identifieur interne : 002546 ( Istex/Corpus ); précédent : 002545; suivant : 002547Significantly Reduced Bimolecular Recombination in a Novel Silole‐Based Polymer: Fullerene Blend
Auteurs : Tracey M. Clarke ; Deanna B. Rodovsky ; Andrew A. Herzing ; Jeff Peet ; Gilles Dennler ; Dean Delongchamp ; Christoph Lungenschmied ; Attila J. MozerSource :
- Advanced Energy Materials [ 1614-6832 ] ; 2011-11.
English descriptors
- KwdEn :
- Active area, Active layer thickness, Active layers, Adjustable delay time, Behaviour, Bimolecular, Bimolecular recombination, Charge carriers, Charge extraction, Charge recombination, Circuit resistance, Current transients, Delay time, Dennler, Device geometry, Dithieno silole, Drift length, Energy mater, Function generator, Higher mobility, Input impedance, Lamellar structure, Langevin, Langevin behaviour, Langevin recombination, Laser pulse, Lett, Light harvesting, Light intensity, Mater, Morphology, Peet, Phase separation, Photocurrent, Photocurrent decay, Photocurrent plateau, Photocurrent transients, Photovoltaic, Photovoltaic devices, Phys, Polymer, Recombination, Recombination behaviour, Scharber, Transit time, Transmission electron microscopy, Verlag gmbh, Voltage pulse.
- Teeft :
- Active area, Active layer thickness, Active layers, Adjustable delay time, Behaviour, Bimolecular, Bimolecular recombination, Charge carriers, Charge extraction, Charge recombination, Circuit resistance, Current transients, Delay time, Dennler, Device geometry, Dithieno silole, Drift length, Energy mater, Function generator, Higher mobility, Input impedance, Lamellar structure, Langevin, Langevin behaviour, Langevin recombination, Laser pulse, Lett, Light harvesting, Light intensity, Mater, Morphology, Peet, Phase separation, Photocurrent, Photocurrent decay, Photocurrent plateau, Photocurrent transients, Photovoltaic, Photovoltaic devices, Phys, Polymer, Recombination, Recombination behaviour, Scharber, Transit time, Transmission electron microscopy, Verlag gmbh, Voltage pulse.
Abstract
Charge transport measurements reveal non‐Langevin recombination for KP115:PCBM organic photovoltaic devices. This rare but highly advantageous behaviour allows a long charge carrier drift length and thus devices with thick active layers retain a high fill factor. However, no clear correlation with morphology was found, indicating that the origin of non‐Langevin recombination may be more complex than previously thought.
Url:
DOI: 10.1002/aenm.201100390
Links to Exploration step
ISTEX:C94A27F4B8634663333013FB2772D799289BDCB0Le document en format XML
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Mozer</name><affiliation><mods:affiliation>ARC Centre of Excellence for Electromaterials Science, Intelligent Polymer Research Institute, University of Wollongong, North Wollongong, NSW 2500, Australia</mods:affiliation></affiliation><affiliation><mods:affiliation>E-mail: attila@uow.edu.au</mods:affiliation></affiliation><affiliation><mods:affiliation>Correspondence address: ARC Centre of Excellence for Electromaterials Science, Intelligent Polymer Research Institute, University of Wollongong, North Wollongong, NSW 2500, Australia.</mods:affiliation></affiliation></author></analytic><monogr></monogr><series><title level="j" type="main">Advanced Energy Materials</title><title level="j" type="alt">ADVANCED ENERGY MATERIALS</title><idno type="ISSN">1614-6832</idno><idno type="eISSN">1614-6840</idno><imprint><biblScope unit="vol">1</biblScope><biblScope unit="issue">6</biblScope><biblScope unit="page" from="1062">1062</biblScope><biblScope unit="page" to="1067">1067</biblScope><biblScope unit="page-count">8</biblScope><publisher>WILEY‐VCH Verlag</publisher><pubPlace>Weinheim</pubPlace><date type="published" when="2011-11">2011-11</date></imprint><idno type="ISSN">1614-6832</idno></series></biblStruct></sourceDesc><seriesStmt><idno type="ISSN">1614-6832</idno></seriesStmt></fileDesc><profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Active area</term><term>Active layer thickness</term><term>Active layers</term><term>Adjustable delay time</term><term>Behaviour</term><term>Bimolecular</term><term>Bimolecular recombination</term><term>Charge carriers</term><term>Charge extraction</term><term>Charge recombination</term><term>Circuit resistance</term><term>Current transients</term><term>Delay time</term><term>Dennler</term><term>Device geometry</term><term>Dithieno silole</term><term>Drift length</term><term>Energy mater</term><term>Function generator</term><term>Higher mobility</term><term>Input impedance</term><term>Lamellar structure</term><term>Langevin</term><term>Langevin behaviour</term><term>Langevin recombination</term><term>Laser pulse</term><term>Lett</term><term>Light harvesting</term><term>Light intensity</term><term>Mater</term><term>Morphology</term><term>Peet</term><term>Phase separation</term><term>Photocurrent</term><term>Photocurrent decay</term><term>Photocurrent plateau</term><term>Photocurrent transients</term><term>Photovoltaic</term><term>Photovoltaic devices</term><term>Phys</term><term>Polymer</term><term>Recombination</term><term>Recombination behaviour</term><term>Scharber</term><term>Transit time</term><term>Transmission electron microscopy</term><term>Verlag gmbh</term><term>Voltage pulse</term></keywords><keywords scheme="Teeft" xml:lang="en"><term>Active area</term><term>Active layer thickness</term><term>Active layers</term><term>Adjustable delay time</term><term>Behaviour</term><term>Bimolecular</term><term>Bimolecular recombination</term><term>Charge carriers</term><term>Charge extraction</term><term>Charge recombination</term><term>Circuit resistance</term><term>Current transients</term><term>Delay time</term><term>Dennler</term><term>Device geometry</term><term>Dithieno silole</term><term>Drift length</term><term>Energy mater</term><term>Function generator</term><term>Higher mobility</term><term>Input impedance</term><term>Lamellar structure</term><term>Langevin</term><term>Langevin behaviour</term><term>Langevin recombination</term><term>Laser pulse</term><term>Lett</term><term>Light harvesting</term><term>Light intensity</term><term>Mater</term><term>Morphology</term><term>Peet</term><term>Phase separation</term><term>Photocurrent</term><term>Photocurrent decay</term><term>Photocurrent plateau</term><term>Photocurrent transients</term><term>Photovoltaic</term><term>Photovoltaic devices</term><term>Phys</term><term>Polymer</term><term>Recombination</term><term>Recombination behaviour</term><term>Scharber</term><term>Transit time</term><term>Transmission electron microscopy</term><term>Verlag gmbh</term><term>Voltage pulse</term></keywords></textClass></profileDesc></teiHeader><front><div type="abstract">Charge transport measurements reveal non‐Langevin recombination for KP115:PCBM organic photovoltaic devices. This rare but highly advantageous behaviour allows a long charge carrier drift length and thus devices with thick active layers retain a high fill factor. However, no clear correlation with morphology was found, indicating that the origin of non‐Langevin recombination may be more complex than previously thought.</div></front></TEI><istex><corpusName>wiley</corpusName><keywords><teeft><json:string>recombination</json:string><json:string>phys</json:string><json:string>bimolecular recombination</json:string><json:string>photocurrent</json:string><json:string>langevin</json:string><json:string>charge extraction</json:string><json:string>photovoltaic</json:string><json:string>energy mater</json:string><json:string>lett</json:string><json:string>dennler</json:string><json:string>peet</json:string><json:string>scharber</json:string><json:string>bimolecular</json:string><json:string>light intensity</json:string><json:string>verlag gmbh</json:string><json:string>polymer</json:string><json:string>recombination behaviour</json:string><json:string>langevin recombination</json:string><json:string>charge carriers</json:string><json:string>active layer thickness</json:string><json:string>delay time</json:string><json:string>transit time</json:string><json:string>mater</json:string><json:string>photovoltaic devices</json:string><json:string>laser pulse</json:string><json:string>photocurrent transients</json:string><json:string>voltage pulse</json:string><json:string>behaviour</json:string><json:string>morphology</json:string><json:string>active layers</json:string><json:string>drift length</json:string><json:string>phase separation</json:string><json:string>photocurrent plateau</json:string><json:string>current transients</json:string><json:string>device geometry</json:string><json:string>circuit resistance</json:string><json:string>active area</json:string><json:string>light harvesting</json:string><json:string>adjustable delay time</json:string><json:string>transmission electron microscopy</json:string><json:string>higher mobility</json:string><json:string>lamellar structure</json:string><json:string>langevin behaviour</json:string><json:string>dithieno silole</json:string><json:string>function generator</json:string><json:string>input impedance</json:string><json:string>charge recombination</json:string><json:string>photocurrent decay</json:string></teeft></keywords><author><json:item><name>Tracey M. Clarke</name><affiliations><json:string>ARC Centre of Excellence for Electromaterials Science, Intelligent Polymer Research Institute, University of Wollongong, North Wollongong, NSW 2500, Australia</json:string><json:string>E-mail: tclarke@uow.edu.au</json:string><json:string>Correspondence address: ARC Centre of Excellence for Electromaterials Science, Intelligent Polymer Research Institute, University of Wollongong, North Wollongong, NSW 2500, Australia.</json:string></affiliations></json:item><json:item><name>Deanna B. Rodovsky</name><affiliations><json:string>National Institute of Standards and Technology, Gaithersburg, MD 20899, USA</json:string><json:string>Konarka Technologies, 116 John St., Suite 12, Lowell, MA 01852, USA</json:string></affiliations></json:item><json:item><name>Andrew A. Herzing</name><affiliations><json:string>National Institute of Standards and Technology, Gaithersburg, MD 20899, USA</json:string></affiliations></json:item><json:item><name>Jeff Peet</name><affiliations><json:string>Konarka Technologies, 116 John St., Suite 12, Lowell, MA 01852, USA</json:string></affiliations></json:item><json:item><name>Gilles Dennler</name><affiliations><json:string>Konarka Technologies, 116 John St., Suite 12, Lowell, MA 01852, USA</json:string><json:string>IMRA Europe, 220, rue Albert Caquot ‐ BP 213, 06904 Sophia‐Antipolis Cedex, France</json:string></affiliations></json:item><json:item><name>Dean DeLongchamp</name><affiliations><json:string>National Institute of Standards and Technology, Gaithersburg, MD 20899, USA</json:string></affiliations></json:item><json:item><name>Christoph Lungenschmied</name><affiliations><json:string>Konarka Technologies, 116 John St., Suite 12, Lowell, MA 01852, USA</json:string></affiliations></json:item><json:item><name>Attila J. Mozer</name><affiliations><json:string>ARC Centre of Excellence for Electromaterials Science, Intelligent Polymer Research Institute, University of Wollongong, North Wollongong, NSW 2500, Australia</json:string><json:string>E-mail: attila@uow.edu.au</json:string><json:string>Correspondence address: ARC Centre of Excellence for Electromaterials Science, Intelligent Polymer Research Institute, University of Wollongong, North Wollongong, NSW 2500, Australia.</json:string></affiliations></json:item></author><subject><json:item><lang><json:string>eng</json:string></lang><value>charge transport</value></json:item><json:item><lang><json:string>eng</json:string></lang><value>conducting polymers</value></json:item><json:item><lang><json:string>eng</json:string></lang><value>organic electronics</value></json:item><json:item><lang><json:string>eng</json:string></lang><value>photovoltaic devices</value></json:item></subject><articleId><json:string>AENM201100390</json:string></articleId><arkIstex>ark:/67375/WNG-QNDSCV77-X</arkIstex><language><json:string>eng</json:string></language><originalGenre><json:string>shortCommunication</json:string></originalGenre><abstract>Charge transport measurements reveal non‐Langevin recombination for KP115:PCBM organic photovoltaic devices. This rare but highly advantageous behaviour allows a long charge carrier drift length and thus devices with thick active layers retain a high fill factor. However, no clear correlation with morphology was found, indicating that the origin of non‐Langevin recombination may be more complex than previously thought.</abstract><qualityIndicators><score>6.489</score><pdfWordCount>3793</pdfWordCount><pdfCharCount>23869</pdfCharCount><pdfVersion>1.4</pdfVersion><pdfPageCount>6</pdfPageCount><pdfPageSize>595.276 x 793.701 pts</pdfPageSize><refBibsNative>true</refBibsNative><abstractWordCount>58</abstractWordCount><abstractCharCount>422</abstractCharCount><keywordCount>4</keywordCount></qualityIndicators><title>Significantly Reduced Bimolecular Recombination in a Novel Silole‐Based Polymer: Fullerene Blend</title><genre><json:string>brief-communication</json:string></genre><host><title>Advanced Energy Materials</title><language><json:string>unknown</json:string></language><doi><json:string>10.1002/(ISSN)1614-6840</json:string></doi><issn><json:string>1614-6832</json:string></issn><eissn><json:string>1614-6840</json:string></eissn><publisherId><json:string>AENM</json:string></publisherId><volume>1</volume><issue>6</issue><pages><first>1062</first><last>1067</last><total>8</total></pages><genre><json:string>journal</json:string></genre><subject><json:item><value>Communication</value></json:item></subject></host><namedEntities><unitex><date><json:string>2011</json:string></date><geogName></geogName><orgName><json:string>Konarka Technologies</json:string><json:string>National Institute of Standards</json:string><json:string>France DOI</json:string><json:string>Stanford Research DG</json:string></orgName><orgName_funder></orgName_funder><orgName_provider></orgName_provider><persName><json:string>J. D. Szmytkowski</json:string><json:string>L. Wen</json:string><json:string>R. Gaudiana</json:string><json:string>M. Westerling</json:string><json:string>N. Stingelin</json:string><json:string>H. Azimi</json:string><json:string>M. Koppe</json:string><json:string>A. Pivrikas</json:string><json:string>A. J. Heeger</json:string><json:string>J. Huang</json:string><json:string>T. M. Clarke</json:string><json:string>J. R. Durrant</json:string><json:string>M. Giles</json:string><json:string>D. D. C. Bradley</json:string><json:string>S. Raleva</json:string><json:string>V. D. Mihailetchi</json:string><json:string>J. Phys</json:string><json:string>R. Hamilton</json:string><json:string>F. Cordella</json:string><json:string>J. E. Macdonald</json:string><json:string>B. O’Regan</json:string><json:string>C. Groves</json:string><json:string>A. Ballantyne</json:string><json:string>G. Li</json:string><json:string>C. G. Shuttle</json:string><json:string>K. Genevieius</json:string><json:string>Nano Lett</json:string><json:string>J. Gao</json:string><json:string>E. Pires</json:string><json:string>M. Ree</json:string><json:string>N. Nekrašas</json:string><json:string>W. J. H. Verhees</json:string><json:string>S. A. Jenekhe</json:string><json:string>M. A. J. Michels</json:string><json:string>K. Forberich</json:string><json:string>Y. Yang</json:string><json:string>X. Gong</json:string><json:string>M. Viliunas</json:string><json:string>D. B. Rodovsky</json:string><json:string>M. Morana</json:string><json:string>G. Dennler</json:string><json:string>K. Arlauskas</json:string><json:string>C. J. Brabec</json:string><json:string>P. Byrne</json:string><json:string>Y. Shao</json:string><json:string>S. A. Choulis</json:string><json:string>A. J. Mozer</json:string><json:string>J. Nelson</json:string><json:string>S. Lilliu</json:string><json:string>S. Cook</json:string><json:string>Deanna B. Rodovsky</json:string><json:string>X. Shi</json:string><json:string>J. Loos</json:string><json:string>G. J. Adriaenssens</json:string><json:string>M. Campoy-Quiles</json:string><json:string>D. DeLongchamp</json:string><json:string>Gilles Dennler</json:string><json:string>M. C. Scharber</json:string><json:string>J. Durrant</json:string><json:string>N. Drolet</json:string><json:string>I. McCulloch</json:string><json:string>Christoph Lungenschmied</json:string><json:string>M. Zhang</json:string><json:string>N. S. Sariciftci</json:string><json:string>M. Hampton</json:string><json:string>U. Zhokhavets</json:string><json:string>G. Juška</json:string><json:string>P. Schilinsky</json:string><json:string>A. Maurano</json:string><json:string>R. Österbacka</json:string><json:string>R. A. J. Janssen</json:string><json:string>S. M. Tuladhar</json:string><json:string>T. C. Hammant</json:string><json:string>S. Ha</json:string><json:string>G. Gobsch</json:string><json:string>M. A. Loi</json:string><json:string>M. M. Wienk</json:string><json:string>I. M. Anderson</json:string><json:string>T. Erb</json:string><json:string>B. Stühn</json:string><json:string>S. Subramaniyan</json:string><json:string>Attila J. Mozer</json:string><json:string>Y. Li</json:string><json:string>A. A. Herzing</json:string><json:string>C. Yang</json:string><json:string>C. Müller</json:string><json:string>V. Dyakonov</json:string><json:string>L. J. Richter</json:string><json:string>F. S. Kim</json:string><json:string>Technology Gaithersburg</json:string><json:string>A. Wagenpfahl</json:string><json:string>Albert Caquot</json:string><json:string>G. Sliaužys</json:string><json:string>S. Shoaee</json:string><json:string>L. J. A. Koster</json:string><json:string>Y. Kim</json:string><json:string>J. Egelhaaf</json:string><json:string>P. Denk</json:string><json:string>S. Rodman</json:string><json:string>C. Deibel</json:string><json:string>Jeff Peet</json:string><json:string>J. Peet</json:string><json:string>W. W. 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KGaA, Weinheim</licence></availability><date type="published" when="2011-11"></date></publicationStmt><notesStmt><note type="content-type" subtype="brief-communication" source="shortCommunication" scheme="https://content-type.data.istex.fr/ark:/67375/XTP-S9SX2MFS-0">brief-communication</note><note type="publication-type" subtype="journal" scheme="https://publication-type.data.istex.fr/ark:/67375/JMC-0GLKJH51-B">journal</note></notesStmt><sourceDesc><biblStruct type="brief-communication"><analytic><title level="a" type="main" xml:lang="en">Significantly Reduced Bimolecular Recombination in a Novel Silole‐Based Polymer: Fullerene Blend</title><author xml:id="author-0000" role="corresp"><persName><forename type="first">Tracey M.</forename><surname>Clarke</surname></persName><email>tclarke@uow.edu.au</email><affiliation>ARC Centre of Excellence for Electromaterials Science, Intelligent Polymer Research Institute, University of Wollongong, North Wollongong, NSW 2500, Australia<address><country key="AU"></country></address></affiliation><affiliation>ARC Centre of Excellence for Electromaterials Science, Intelligent Polymer Research Institute, University of Wollongong, North Wollongong, NSW 2500, Australia.</affiliation></author><author xml:id="author-0001"><persName><forename type="first">Deanna B.</forename><surname>Rodovsky</surname></persName><affiliation>National Institute of Standards and Technology, Gaithersburg, MD 20899, USA<address><country key="US"></country></address></affiliation><affiliation>Konarka Technologies, 116 John St., Suite 12, Lowell, MA 01852, USA<address><country key="US"></country></address></affiliation></author><author xml:id="author-0002"><persName><forename type="first">Andrew A.</forename><surname>Herzing</surname></persName><affiliation>National Institute of Standards and Technology, Gaithersburg, MD 20899, USA<address><country key="US"></country></address></affiliation></author><author xml:id="author-0003"><persName><forename type="first">Jeff</forename><surname>Peet</surname></persName><affiliation>Konarka Technologies, 116 John St., Suite 12, Lowell, MA 01852, USA<address><country key="US"></country></address></affiliation></author><author xml:id="author-0004"><persName><forename type="first">Gilles</forename><surname>Dennler</surname></persName><affiliation>Konarka Technologies, 116 John St., Suite 12, Lowell, MA 01852, USA<address><country key="US"></country></address></affiliation><affiliation>IMRA Europe, 220, rue Albert Caquot ‐ BP 213, 06904 Sophia‐Antipolis Cedex, France<address><country key="FR"></country></address></affiliation></author><author xml:id="author-0005"><persName><forename type="first">Dean</forename><surname>DeLongchamp</surname></persName><affiliation>National Institute of Standards and Technology, Gaithersburg, MD 20899, USA<address><country key="US"></country></address></affiliation></author><author xml:id="author-0006"><persName><forename type="first">Christoph</forename><surname>Lungenschmied</surname></persName><affiliation>Konarka Technologies, 116 John St., Suite 12, Lowell, MA 01852, USA<address><country key="US"></country></address></affiliation></author><author xml:id="author-0007" role="corresp"><persName><forename type="first">Attila J.</forename><surname>Mozer</surname></persName><email>attila@uow.edu.au</email><affiliation>ARC Centre of Excellence for Electromaterials Science, Intelligent Polymer Research Institute, University of Wollongong, North Wollongong, NSW 2500, Australia<address><country key="AU"></country></address></affiliation><affiliation>ARC Centre of Excellence for Electromaterials Science, Intelligent Polymer Research Institute, University of Wollongong, North Wollongong, NSW 2500, Australia.</affiliation></author><idno type="istex">C94A27F4B8634663333013FB2772D799289BDCB0</idno><idno type="ark">ark:/67375/WNG-QNDSCV77-X</idno><idno type="DOI">10.1002/aenm.201100390</idno><idno type="unit">AENM201100390</idno><idno type="toTypesetVersion">file:AENM.AENM201100390.pdf</idno></analytic><monogr><title level="j" type="main">Advanced Energy Materials</title><title level="j" type="alt">ADVANCED ENERGY MATERIALS</title><idno type="pISSN">1614-6832</idno><idno type="eISSN">1614-6840</idno><idno type="book-DOI">10.1002/(ISSN)1614-6840</idno><idno type="book-part-DOI">10.1002/aenm.v1.6</idno><idno type="product">AENM</idno><imprint><biblScope unit="vol">1</biblScope><biblScope unit="issue">6</biblScope><biblScope unit="page" from="1062">1062</biblScope><biblScope unit="page" to="1067">1067</biblScope><biblScope unit="page-count">8</biblScope><publisher>WILEY‐VCH Verlag</publisher><pubPlace>Weinheim</pubPlace><date type="published" when="2011-11"></date></imprint></monogr></biblStruct></sourceDesc></fileDesc><profileDesc><abstract xml:lang="en" style="graphical"><p><hi rend="bold">Charge transport measurements</hi> reveal non‐Langevin recombination for KP115:PCBM organic photovoltaic devices. This rare but highly advantageous behaviour allows a long charge carrier drift length and thus devices with thick active layers retain a high fill factor. However, no clear correlation with morphology was found, indicating that the origin of non‐Langevin recombination may be more complex than previously thought.
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KGaA, Weinheim</copyright><eventGroup><event type="manuscriptReceived" date="2011-07-12"></event><event type="manuscriptRevised" date="2011-08-19"></event><event type="xmlConverted" agent="Converter:JWSART34_TO_WML3G version:3.0.1 mode:FullText mathml2tex" date="2011-12-01"></event><event type="publishedOnlineEarlyUnpaginated" date="2011-09-12"></event><event type="publishedOnlineFinalForm" date="2011-11-15"></event><event type="firstOnline" date="2011-09-12"></event><event type="xmlConverted" agent="Converter:WILEY_ML3G_TO_WILEY_ML3GV2 version:3.8.8" date="2014-01-01"></event><event type="xmlConverted" agent="Converter:WML3G_To_WML3G version:4.1.7 mode:FullText,remove_FC" date="2014-10-14"></event></eventGroup><numberingGroup><numbering type="pageFirst">1062</numbering><numbering type="pageLast">1067</numbering></numberingGroup><correspondenceTo>ARC Centre of Excellence for Electromaterials Science, Intelligent Polymer Research Institute, University of Wollongong, North Wollongong, NSW 2500, Australia.</correspondenceTo><linkGroup><link type="toTypesetVersion" href="file:AENM.AENM201100390.pdf"></link></linkGroup></publicationMeta><contentMeta><countGroup><count type="figureTotal" number="4"></count><count type="referenceTotal" number="27"></count></countGroup><titleGroup><title type="main" xml:lang="en">Significantly Reduced Bimolecular Recombination in a Novel Silole‐Based Polymer: Fullerene Blend</title></titleGroup><creators><creator xml:id="au1" creatorRole="author" affiliationRef="#af1" corresponding="yes"><personName><givenNames>Tracey M.</givenNames><familyName>Clarke</familyName></personName><contactDetails><email>tclarke@uow.edu.au</email></contactDetails></creator><creator xml:id="au2" creatorRole="author" affiliationRef="#af2 #af3"><personName><givenNames>Deanna B.</givenNames><familyName>Rodovsky</familyName></personName></creator><creator xml:id="au3" creatorRole="author" affiliationRef="#af2"><personName><givenNames>Andrew A.</givenNames><familyName>Herzing</familyName></personName></creator><creator xml:id="au4" creatorRole="author" affiliationRef="#af3"><personName><givenNames>Jeff</givenNames><familyName>Peet</familyName></personName></creator><creator xml:id="au5" creatorRole="author" affiliationRef="#af3 #af4"><personName><givenNames>Gilles</givenNames><familyName>Dennler</familyName></personName></creator><creator xml:id="au6" creatorRole="author" affiliationRef="#af2"><personName><givenNames>Dean</givenNames><familyName>DeLongchamp</familyName></personName></creator><creator xml:id="au7" creatorRole="author" affiliationRef="#af3"><personName><givenNames>Christoph</givenNames><familyName>Lungenschmied</familyName></personName></creator><creator xml:id="au8" creatorRole="author" affiliationRef="#af1" corresponding="yes"><personName><givenNames>Attila J.</givenNames><familyName>Mozer</familyName></personName><contactDetails><email>attila@uow.edu.au</email></contactDetails></creator></creators><affiliationGroup><affiliation xml:id="af1" countryCode="AU" type="organization"><unparsedAffiliation>ARC Centre of Excellence for Electromaterials Science, Intelligent Polymer Research Institute, University of Wollongong, North Wollongong, NSW 2500, Australia</unparsedAffiliation></affiliation><affiliation xml:id="af2" countryCode="US" type="organization"><unparsedAffiliation>National Institute of Standards and Technology, Gaithersburg, MD 20899, USA</unparsedAffiliation></affiliation><affiliation xml:id="af3" countryCode="US" type="organization"><unparsedAffiliation>Konarka Technologies, 116 John St., Suite 12, Lowell, MA 01852, USA</unparsedAffiliation></affiliation><affiliation xml:id="af4" countryCode="FR" type="organization"><unparsedAffiliation>IMRA Europe, 220, rue Albert Caquot ‐ BP 213, 06904 Sophia‐Antipolis Cedex, France</unparsedAffiliation></affiliation></affiliationGroup><keywordGroup xml:lang="en" type="author"><keyword xml:id="kwd1">charge transport</keyword><keyword xml:id="kwd2">conducting polymers</keyword><keyword xml:id="kwd3">organic electronics</keyword><keyword xml:id="kwd4">photovoltaic devices</keyword></keywordGroup><supportingInformation><p>Detailed facts of importance to specialist readers are published as ”Supporting Information”. Such documents are peer‐reviewed, but not copy‐edited or typeset. They are made available as submitted by the authors.
</p><supportingInfoItem><mediaResource alt="supporting information" href="urn-x:wiley:16146832:media:aenm201100390:aenm_201100390_sm_suppl"></mediaResource><caption>suppl</caption></supportingInfoItem></supportingInformation><abstractGroup><abstract type="graphical" xml:lang="en"><p><b>Charge transport measurements</b> reveal non‐Langevin recombination for KP115:PCBM organic photovoltaic devices. This rare but highly advantageous behaviour allows a long charge carrier drift length and thus devices with thick active layers retain a high fill factor. However, no clear correlation with morphology was found, indicating that the origin of non‐Langevin recombination may be more complex than previously thought.
<blockFixed type="graphic"><mediaResourceGroup><mediaResource alt="image" eRights="yes" copyright="WILEY-VCH" href="urn:x-wiley:16146832:media:AENM201100390:content"></mediaResource><mediaResource alt="thumbnail image" rendition="webLoRes" mimeType="image/gif" href=""></mediaResource><mediaResource alt="original image" rendition="webOriginal" mimeType="image/jpeg" href=""></mediaResource><mediaResource alt="magnified image" rendition="webHiRes" mimeType="image/jpeg" href=""></mediaResource></mediaResourceGroup></blockFixed></p></abstract></abstractGroup></contentMeta></header></component></istex:document></istex:metadataXml><mods version="3.6"><titleInfo lang="en"><title>Significantly Reduced Bimolecular Recombination in a Novel Silole‐Based Polymer: Fullerene Blend</title></titleInfo><titleInfo type="alternative" contentType="CDATA" lang="en"><title>Significantly Reduced Bimolecular Recombination in a Novel Silole‐Based Polymer: Fullerene Blend</title></titleInfo><name type="personal"><namePart type="given">Tracey M.</namePart><namePart type="family">Clarke</namePart><affiliation>ARC Centre of Excellence for Electromaterials Science, Intelligent Polymer Research Institute, University of Wollongong, North Wollongong, NSW 2500, Australia</affiliation><affiliation>E-mail: tclarke@uow.edu.au</affiliation><affiliation>Correspondence address: ARC Centre of Excellence for Electromaterials Science, Intelligent Polymer Research Institute, University of Wollongong, North Wollongong, NSW 2500, Australia.</affiliation><role><roleTerm type="text">author</roleTerm></role></name><name type="personal"><namePart type="given">Deanna B.</namePart><namePart type="family">Rodovsky</namePart><affiliation>National Institute of Standards and Technology, Gaithersburg, MD 20899, USA</affiliation><affiliation>Konarka Technologies, 116 John St., Suite 12, Lowell, MA 01852, USA</affiliation><role><roleTerm type="text">author</roleTerm></role></name><name type="personal"><namePart type="given">Andrew A.</namePart><namePart type="family">Herzing</namePart><affiliation>National Institute of Standards and Technology, Gaithersburg, MD 20899, USA</affiliation><role><roleTerm type="text">author</roleTerm></role></name><name type="personal"><namePart type="given">Jeff</namePart><namePart type="family">Peet</namePart><affiliation>Konarka Technologies, 116 John St., Suite 12, Lowell, MA 01852, USA</affiliation><role><roleTerm type="text">author</roleTerm></role></name><name type="personal"><namePart type="given">Gilles</namePart><namePart type="family">Dennler</namePart><affiliation>Konarka Technologies, 116 John St., Suite 12, Lowell, MA 01852, USA</affiliation><affiliation>IMRA Europe, 220, rue Albert Caquot ‐ BP 213, 06904 Sophia‐Antipolis Cedex, France</affiliation><role><roleTerm type="text">author</roleTerm></role></name><name type="personal"><namePart type="given">Dean</namePart><namePart type="family">DeLongchamp</namePart><affiliation>National Institute of Standards and Technology, Gaithersburg, MD 20899, USA</affiliation><role><roleTerm type="text">author</roleTerm></role></name><name type="personal"><namePart type="given">Christoph</namePart><namePart type="family">Lungenschmied</namePart><affiliation>Konarka Technologies, 116 John St., Suite 12, Lowell, MA 01852, USA</affiliation><role><roleTerm type="text">author</roleTerm></role></name><name type="personal"><namePart type="given">Attila J.</namePart><namePart type="family">Mozer</namePart><affiliation>ARC Centre of Excellence for Electromaterials Science, Intelligent Polymer Research Institute, University of Wollongong, North Wollongong, NSW 2500, Australia</affiliation><affiliation>E-mail: attila@uow.edu.au</affiliation><affiliation>Correspondence address: ARC Centre of Excellence for Electromaterials Science, Intelligent Polymer Research Institute, University of Wollongong, North Wollongong, NSW 2500, Australia.</affiliation><role><roleTerm type="text">author</roleTerm></role></name><typeOfResource>text</typeOfResource><genre type="brief-communication" displayLabel="shortCommunication" authority="ISTEX" authorityURI="https://content-type.data.istex.fr" valueURI="https://content-type.data.istex.fr/ark:/67375/XTP-S9SX2MFS-0">brief-communication</genre><originInfo><publisher>WILEY‐VCH Verlag</publisher><place><placeTerm type="text">Weinheim</placeTerm></place><dateIssued encoding="w3cdtf">2011-11</dateIssued><dateCaptured encoding="w3cdtf">2011-07-12</dateCaptured><copyrightDate encoding="w3cdtf">2011</copyrightDate></originInfo><language><languageTerm type="code" authority="rfc3066">en</languageTerm><languageTerm type="code" authority="iso639-2b">eng</languageTerm></language><physicalDescription><extent unit="figures">4</extent><extent unit="references">27</extent></physicalDescription><abstract>Charge transport measurements reveal non‐Langevin recombination for KP115:PCBM organic photovoltaic devices. This rare but highly advantageous behaviour allows a long charge carrier drift length and thus devices with thick active layers retain a high fill factor. However, no clear correlation with morphology was found, indicating that the origin of non‐Langevin recombination may be more complex than previously thought.</abstract><subject lang="en"><genre>keywords</genre><topic>charge transport</topic><topic>conducting polymers</topic><topic>organic electronics</topic><topic>photovoltaic devices</topic></subject><relatedItem type="host"><titleInfo><title>Advanced Energy Materials</title></titleInfo><titleInfo type="abbreviated"><title>Adv. Energy Mater.</title></titleInfo><genre type="journal" authority="ISTEX" authorityURI="https://publication-type.data.istex.fr" valueURI="https://publication-type.data.istex.fr/ark:/67375/JMC-0GLKJH51-B">journal</genre><note type="content"> Detailed facts of importance to specialist readers are published as ”Supporting Information”. 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