| Joachim Wuttke < Joachim Würfl < Joachim Yahalom | Facettes : |
List of bibliographic references
Number of relevant bibliographic references: 1.| Ident. | Authors (with country if any) | Title |
|---|---|---|
| 001469 (2013) | Clément Fleury [Australie] ; Rimma Zhytnytska [Allemagne] ; Sergey Bychikhin [Australie] ; Mattia Cappriotti [Australie] ; Oliver Hilt [Allemagne] ; Domenica Visalli [Belgique] ; Gaudenzio Meneghesso [Italie] ; Enrico Zanoni [Italie] ; Joachim Würfl [Allemagne] ; Joff Derluyn [Belgique] ; Gottfried Strasser [Australie] ; Dionyz Pogany [Australie] | Statistics and localisation of vertical breakdown in AlGaN/GaN HEMTs on SiC and Si substrates for power applications |
List of associated KwdEn.i
| Nombre de documents | Descripteur |
|---|---|
| 1 | Aluminium nitride |
| 1 | Back surface |
| 1 | Binary compound |
| 1 | Damaging |
| 1 | Disruptive voltage |
| 1 | Distribution function |
| 1 | Epitaxy |
| 1 | Failures |
| 1 | Gallium nitride |
| 1 | High electron mobility transistor |
| 1 | Probability density function |
| 1 | Silicon carbide |
| 1 | Ternary compound |
| 1 | Time dependence |
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