Serveur d'exploration sur les relations entre la France et l'Australie - Analysis (Allemagne)

Index « Auteurs » - entrée « A. Freund »
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A. French < A. Freund < A. Frieling  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 1.
Ident.Authors (with country if any)Title
002917 (2001) A. Y. Nikulin [Australie] ; K. Siu [Australie] ; J. R. Davis [Australie] ; P. Zaumseil [Allemagne] ; A. Y. Souvorov [France] ; A. Freund [France]Application of the Phase‐Retrieval X‐Ray Diffractometry to an Ultra‐High Spatial Resolution Mapping of SiGe Films near the Absorption Edge of Ge

List of associated KwdEn.i

Nombre de
documents
Descripteur
1Absorption edge
1Alloy
1Alloy impurity
1Amplitude contrast
1Analytical technique
1Angular range
1Atomic planes
1Atomic resolution
1Azimuthal orientation
1Bragg
1Bragg diffraction data
1Broad peak
1Complete phase profile
1Complex function
1Complex profile
1Constant value
1Crystal surface
1Diffraction
1Diffraction data
1Diffraction profiles
1Diffraction techniques
1Diffractometry
1Dzmin 2dhkl
1Electron microscopy
1Emission techniques
1European synchrotron radiation facility
1Exact bragg point
1Experimental intensity
1Fine structure
1Formal conclusion
1Formalism
1Intensity profile
1Intensity profiles
1Interface
1Lattice
1Lattice spacing
1Layer surface
1Logarithmic dispersion relation
1Modulus
1Monochromator
1Nikulin
1Normalised intensity
1Numerical implementation
1Parasitic
1Parasitic effects
1Peak shape
1Phys
1Physical zeros
1Point defects
1Present analysis
1Present experiment
1Present observation
1Present technique
1Primary monochromator
1Profile
1Prxrd technique
1Radiation energies
1Radiation energy
1Real experiment
1Real part
1Reconstructed modulus
1Reconstructed phase
1Secondary monochromator
1Sige
1Sige layers
1Silicon lattice
1Single crystal
1Single crystals
1Single point
1Spatial resolution
1Strain profiles
1Synchrotron
1Synchrotron source
1Thick layer
1True zeros

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