High mass resolution And NotWilliam H. Peck
List of bibliographic references
Number of relevant bibliographic references: 2.Ident. | Authors (with country if any) | Title |
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000E64 | Laure Sangely [France, Allemagne] ; Bernard Boyer [France, Allemagne] ; Emmanuel De Chambost [France, Allemagne] ; Nathalie Valle [France, Allemagne] ; Jean-Nicolas Audinot [France, Allemagne] ; Trevor Ireland [France, Allemagne] ; Michael Wiedenbeck [France, Allemagne] ; Jérôme Aléon [France, Allemagne] ; Harald Jungnickel [France, Allemagne] ; Jean-Paul Barnes [France, Allemagne] ; Philippe Bienvenu [France, Allemagne] ; Uwe Breuer [France, Allemagne] | CHAPTER 15 - Secondary Ion Mass Spectrometry |
001414 | P. Peres [France] ; P. M. L. Hedberg [Allemagne] ; S. Walton [Royaume-Uni] ; N. Montgomery [Royaume-Uni] ; J. B. Cliff [Australie] ; F. Rabemananjara [France] ; M. Schuhmacher [France] | Nuclear safeguards applications using LG‐SIMS with automated screening capabilities |
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