| Thickness < Thin film < Thin film transistor | Facettes : |
List of bibliographic references
Number of relevant bibliographic references: 3.| Ident. | Authors (with country if any) | Title |
|---|---|---|
| 000037 (2014) | M. Ben Amor [Tunisie] ; A. Boukhachem [Tunisie] ; K. Boubaker [Tunisie] ; M. Amlouk [Tunisie] | Structural, optical and electrical studies on Mg-doped NiO thin films for sensitivity applications |
| 000047 (2014) | M. Jlassi [Tunisie] ; I. Sta [Tunisie] ; M. Hajji [Tunisie] ; B. Ben Haoua [Algérie] ; H. Ezzaouia [Tunisie] | Effect of annealing atmosphere on the electrical properties of nickel oxide/zinc oxide p-n junction grown by sol-gel technique |
| 000252 (1998) | R. Mlika [Tunisie] ; H. Ben Ouada [Tunisie] ; R. Ben Chaabane [Tunisie] ; M. Gamoudi [France] ; G. Guillaud [France] ; N. Jaffrezic-Renault [France] ; R. Lamartine [France] | Calixarene membranes on semiconductor substrates for E.I.S. chemical sensors |
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