Microscopie force atomique And NotI. Sta
List of bibliographic references
Number of relevant bibliographic references: 3.| Ident. | Authors (with country if any) | Title |
|---|---|---|
| 000011 | M. Ben Amor [Tunisie] ; A. Boukhachem [Tunisie] ; K. Boubaker [Tunisie] ; M. Amlouk [Tunisie] | Structural, optical and electrical studies on Mg-doped NiO thin films for sensitivity applications |
| 000153 | S. Chouchane [Algérie] ; A. Levesque [France] ; P. Zabinski [Pologne] ; R. Rehamnia [Algérie] ; J.-P. Chopart [France] | Electrochemical corrosion behavior in NaCl medium of zinc-nickel alloys electrodeposited under applied magnetic field |
| 000432 | V. Branger [France] ; C. Coupeau [France] ; P. Goudeau [France] ; B. Boubeker [France, Maroc] ; K. F. Badawi [France] ; J. Grilhe [France] | Atomic force microscopy analysis of buckling phenomena in metallic thin films on substrates |
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