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Exploration
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Exploration
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Serveur d'exploration sur le nickel au Maghreb - Exploration (Accueil)

Index « ISSN » - entrée « 0042-207X »
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0041-4131 < 0042-207X < 0042-9007  Facettes :

List of bibliographic references indexed by 0042-207X

Number of relevant bibliographic references: 19.
Ident.Authors (with country if any)Title
000D71 (1997) E. Gourmelon [France] ; H. Hadouda [Algérie] ; Jc Bernede [France] ; J. Pouzet [France]High quality crystalline MoS2 thin films obtained on Ni coated substrates: optimization of the post-annealing treatment
001142 (1991) C. Jardin [France] ; M. Ghamnia [Algérie] ; M. Bouslama [Algérie] ; B. Khelifa [Algérie]The oxygen O - KLL Auger spectra of cadmium oxide
001848 (1964) W. H. Kohl [États-Unis]Ceramics and ceramic-to-metal sealing
001855 (1963) Vacuum system for the U.S. Naval Research Laboratory electron storage ring
001856 (1963) The preparation and study of the optical absorption edge of thin films of gallium arsenide
001857 (1963) The Associated Electrical Industries levitron
001858 (1963) Silicon surface barrier radiation detectors: some designs and applications
001859 (1963) Radiation between the optical absorption spectrum of silver film and its film structure
001860 (1963) Quartz crystal microbalance for measuring ultra-thin films
001861 (1963) Preparation and optical properties of thin layers of gallium arsenide and cadmium telluride
001862 (1963) Optical properties of thin palladium film
001863 (1963) Optical absorption in very thin (<100 Å) dielectric films and its origin
001864 (1963) Optical Faraday effect in ferrite films
001865 (1963) High-power axial-beam tubes
001866 (1963) Ellipsometric investigations of oxide films on GaAs
001867 (1963) Ellipsometric investigation of thin SiO2 films obrained by various methods of preparation
001868 (1963) A simple non-destructive technique for thickness and refractive index measurements of transparent films on reflective substrates
001869 (1963) A high vacuum glass system for thin films study
001870 (1963) 1178. Hydrogen thyratrons

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