List of bibliographic references
Number of relevant bibliographic references: 15.
| Ident. | Authors (with country if any) | Title |
|---|
| 000070 (2012) |
M. Boudard [France] ; C. Girardot [France] ; N. Ihzaz [France, Tunisie] ; S. Pignard [France] ; L. Rapenne [France] ; H. Roussel [France] ; A. Bartasyte [France] | X-ray and transmission electron microscopy structural characterization of multifunctional Perovskite thin films |
| 000093 (2011) |
A. Souissi [Tunisie] ; A. Marzouki [Tunisie, France] ; A. Sayari [Tunisie] ; V. Sallet [France] ; A. Lusson [France] ; M. Oueslati [Tunisie] | Origin of the Raman mode at 379 cm−1 observed in ZnO thin films grown on sapphire |
| 000129 (2009) |
Chrif Dridi [Tunisie, France] ; Maha Benzarti-Ghdira [Tunisie] ; Francis Vocanson [France] ; Rafik Ben Chaabane [Tunisie] ; Joel Davenas [France] ; Hafedh Ben Ouada [Tunisie] | Optical and electrical properties of semi-conducting calix[5,9]arene thin films with potential applications in organic electronics |
| 000156 (2008) |
Nejib Ihzaz [Tunisie] ; Mohamed Oumezzine [Tunisie] ; Jens Kreisel [France] ; Henri Vincent [France] ; Stephane Pignard [France] | Growth of SmNiO3 Thin Films on LaAlO3 Single Crystals |
| 000166 (2008) |
L. Cattin [France] ; B. A. Reguig [Algérie] ; A. Khelil [Algérie] ; M. Morsli [France] ; K. Benchouk [Algérie] ; J. C. Bernede [France] | Properties of NiO thin films deposited by chemical spray pyrolysis using different precursor solutions |
| 000184 (2007) |
S.-M. Cherif [France] ; A. Layadi [Algérie] ; J. Ben Youssef [France] ; C. Nacereddine [Algérie] ; Y. Roussigne [France] | Study of the magnetic anisotropy in Ni/Cu and Ni/glass thin films |
| 000185 (2007) |
B. A. Reguig [Algérie] ; A. Khelil [Algérie] ; L. Cattin [France] ; M. Morsli [France] ; J. C. Bernede [France] | Properties of NiO thin films deposited by intermittent spray pyrolysis process |
| 000214 (2006) |
B. A. Reguig [Algérie] ; M. Regragui [France, Maroc] ; M. Morsli [France] ; A. Khelil [Algérie] ; M. Addou [Maroc] ; J. C. Bernede [France] | Effect of the precursor solution concentration on the NiO thin film properties deposited by spray pyrolysis |
| 000249 (2004) |
N. Ihzaz [France, Tunisie] ; S. Pignard [France] ; J. Kreisel [France] ; H. Vincent [France] ; J. Marcus [France] ; J. Dhahri [Tunisie] ; M. Oumezzine [Tunisie] | Synthesis and characterization of SmNiO3 thin films |
| 000288 (2003) |
A. Kellou [Algérie] ; N. E. Fenineche [France] ; A. Tadjer [Algérie] ; H. Aourag [Algérie, France] | Ferromagnetic and antiferromagnetic couplings in Cr(0 0 1) thin films and TM monolayer/Cr(0 0 1) (TM = Ti, V, Cr, Mn, Fe, Co, Ni) |
| 000362 (2000) |
V. Branger [France] ; C. Coupeau [France] ; P. Goudeau [France] ; B. Boubeker [France, Maroc] ; K. F. Badawi [France] ; J. Grilhe [France] | Atomic force microscopy analysis of buckling phenomena in metallic thin films on substrates |
| 000402 (1998) |
N. Guettari [Algérie] ; J. Ouerfelli [France] ; J. C. Bernède [France] ; A. Khelil [Algérie] ; J. Pouzet [France] ; A. Conan [France] | Photoconductive WSe2 thin films obtained by solid state reaction in the presence of a thin nickel layer |
| 000436 (1997) |
R. Ben Chaabane [France] ; G. Guillaud [France] ; M. Gamoudi [France] | Study of the electrical properties of thin film transistors based on nickel phthalocyanine |
| 000452 (1997) |
H. Hadouda [Algérie] ; J. C. Bernede [France] ; E. Gourmelon [France] ; J. Pouzet [France] | Experimental obviousness of the necessity for a thin Ni interfacial layer to obtain highly ordered photoconductive MoS2 films |
| 000485 (1995) |
A. Mzerd [Maroc] ; D. Sayah [Maroc] ; G. Brun [France] ; J. C. Tedenac [France] ; A. Boyer [France] | Crystal growth and sticking coefficient of Bi2Te3 thin films on Si(1 1 1) substrate |
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