| A. C Chami < A. C. Chami < A. C. Roger | Facettes : |
List of bibliographic references
Number of relevant bibliographic references: 4.| Ident. | Authors (with country if any) | Title |
|---|---|---|
| 000057 (2012) | M. Siad [Algérie] ; M. Abdesslam [Algérie] ; A. C. Chami [Algérie] | Role of carbon in the formation of ohmic contact in Ni/4H-SiC and Ni/Ti/4H-SiC |
| 000074 (2011) | M. Siad [Algérie] ; M. Abdesselam [Algérie] ; N. Souami [Algérie] ; A. C. Chami [Algérie] | Structural characterization of Ni and Ni/Ti ohmic contact on n-type 4H-SiC |
| 000122 (2009) | M. Siad [Algérie] ; C. Pineda Vargas [Afrique du Sud] ; M. Nkosi [Afrique du Sud] ; D. Saidi [Algérie] ; N. Souami [Algérie] ; N. Daas [Algérie] ; A. C. Chami [Algérie] | Characterisation of Ni and Ni/Ti contact on n-type 4H-SiC |
| 000237 (2001) | K. Khalal-Kouache [Algérie, France] ; A. C. Chami [Algérie] ; M. Boudjema [Algérie, France] ; P. Benoit-Cattin [France] ; C. Benazeth [France] ; Y. Boudouma [Algérie] | Transport theory and Monte Carlo simulation of the scattering of low energy Li+ ions from a polycrystalline nickel surface |
List of associated KwdEn.i
| Nombre de documents | Descripteur |
|---|---|
| 3 | Inorganic compounds |
| 3 | Nickel |
| 3 | Ohmic contacts |
| 3 | Silicon carbide |
| 3 | Titanium |
| 3 | Transition elements |
| 2 | AES |
| 2 | RBS |
| 2 | XRD |
| 2 | n type semiconductor |
| 1 | Carbon |
| 1 | Scanning electron microscopy |
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